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STEM-based analysis of functional defects in ferroelectric ErMnO3

Published online by Cambridge University Press:  30 July 2021

Antonius T. J. van Helvoort ,
Aleksander Mosberg ,
Ursula Ludacka ,
Theodor S. Holstad ,
Donald M. Evans  and
Dennis Meier
Antonius T. J. van Helvoort
Affiliation:
NTNU, United States
Aleksander Mosberg
Affiliation:
SuperSTEM, Daresbury, England, United Kingdom
Ursula Ludacka
Affiliation:
NTNU, United States
Theodor S. Holstad
Affiliation:
3DTU, United States
Donald M. Evans
Affiliation:
University of Augsburg, United States
Dennis Meier
Affiliation:
NTNU, United States

Abstract

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Type
Defects in Materials: How We See and Understand Them
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1188 - 1189
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Acknowledgements: The Research Council of Norway is acknowledged for support to the Norwegian Micro- and Nano-Fabrication Facility, NorFab (245963/F50) and Norwegian Centre for Transmission Electron Microscopy, NORTEM (197405). A.B.M. was supported by NTNU's Enabling technologies: Nanotechnology. D.M. thanks NTNU for support through the Onsager Fellowship Programme and NTNU Stjerneprogrammet.Google Scholar