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STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures

Published online by Cambridge University Press:  27 August 2014

Peter D Nellist
Affiliation:
University of Oxford, Department of Materials, Oxford, UK EPSRC SuperSTEM Facility, Daresbury Laboratory, Warrington, WA4 4AD
Hao Yang
Affiliation:
University of Oxford, Department of Materials, Oxford, UK
Juan G Lozano
Affiliation:
University of Oxford, Department of Materials, Oxford, UK
Timothy J Pennycook
Affiliation:
University of Oxford, Department of Materials, Oxford, UK EPSRC SuperSTEM Facility, Daresbury Laboratory, Warrington, WA4 4AD
Peter B Hirsch
Affiliation:
University of Oxford, Department of Materials, Oxford, UK

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Hirsch, P.B., et al., The dissociation of the [a+c] dislocation in GaN, Philosophical Magazine, 93 (2013) 3925.Google Scholar
[2] Nellist, P.D., et al., Direct Sub-Angstrom Imaging of a Crystal Lattice, Science, 305 (2004) 1741.Google Scholar
[3] Nellist, P.D. and Wang, P. Optical Sectioning and Confocal Imaging and Analysis in the Transmission Electron Microscope Annual Review of Materials Research, 42 (2012)125.Google Scholar
[4] Yang, H., et al., manuscript in preparation.Google Scholar
[5] The authors would like to acknowledge financial support from the EPSRC (grant number EP/K032518/1) and the EU Seventh Framework Programme: ESTEEM2.Google Scholar