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STEM Imaging, Monochromated EELS, and Theory of Natural and Artificial Superlattices

Published online by Cambridge University Press:  22 July 2022

Eric R. Hoglund ,
Jordan A. Hachtel ,
De-Liang Bao ,
Andrew O'Hara ,
Md. Shafkat Bin Hoque ,
Sokrates T. Pantelides ,
Patrick E. Hopkins  and
James M. Howe
Eric R. Hoglund
Affiliation:
Dept. of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22904
Jordan A. Hachtel
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37830
De-Liang Bao
Affiliation:
Department of Physics andAstronomy, Vanderbilt University, Nashville, TN 37235
Andrew O'Hara
Affiliation:
Department of Physics andAstronomy, Vanderbilt University, Nashville, TN 37235
Md. Shafkat Bin Hoque
Affiliation:
Dept. of Mechanical Engineering, University of Virginia, Charlottesville, VA 22904
Sokrates T. Pantelides
Affiliation:
Department of Physics andAstronomy, Vanderbilt University, Nashville, TN 37235 Dept. of Electrical and Computer Engineering, Vanderbilt University, Nashville TN 37235
Patrick E. Hopkins
Affiliation:
Dept. of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22904 Dept. of Mechanical Engineering, University of Virginia, Charlottesville, VA 22904
James M. Howe
Affiliation:
Dept. of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22904

Abstract

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Type
Quantum Materials Under Electron Beam: From Atomic Structures to Working Devices
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1682 - 1683
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Copyright
Copyright © Microscopy Society of America 2022

References

Hoglund, E.R., et al. , Nature. 601 7894 (2022) pp. 1–9.10.1038/s41586-021-04238-zCrossRefGoogle Scholar
Dawley, N.M., et al. , Appl. Phys. Lett. 118 9 (2021) 091904-6.10.1063/5.0037765CrossRefGoogle Scholar
Vibrational EELS was performed as part of a user proposal at the Oak Ridge National Laboratory (ORNL), the Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy, Office of Science User Facility (J.A.H.). Work at Vanderbilt was supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Science and Engineering Division grant No. DE-FG02-09ER46554. The authors thank Prof. Ramesh Ramamoorthy, Prof. Jayakanth Ravichandran for providing the thin filmsGoogle Scholar