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A Statistical Dictionary Approach to Automated Orientation Determination from Precession Electron Diffraction Patterns

Published online by Cambridge University Press:  23 September 2015

A. Wang ,
A.C. Leff ,
M.L. Taheri  and
M. De Graef
A. Wang
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh PA 15213, USA
A.C. Leff
Affiliation:
Dept. of Materials Science and Engineering, Drexel University, Philadelphia PA 19104, USA
M.L. Taheri
Affiliation:
Dept. of Materials Science and Engineering, Drexel University, Philadelphia PA 19104, USA
M. De Graef
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh PA 15213, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1247 - 1248
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Vincent, R. & Midgley, P.A., Ultramicroscopy 53 (1994), p 271.CrossRefGoogle Scholar
[2] Rauch, E.F. & Veron, M., Materwiss. Werksttech. 36 (2005), p 552.CrossRefGoogle Scholar
[3] Chen, Y.H., Park, S.U., Wei, D., et. al., Microscopy and Microanalysis, under review.Google Scholar
[4] Wang, A. & De, M., . Graef are grateful for AFOSR support under MURI contract #FA9550-12-1-0458. A.C. Leff and M.L. Taheri are grateful for support from: US DOE Basic Energy Sciences Early Career program (DE-SC0008274); National Science Foundation Faculty Early Career Program (#1150807); and DOE Nuclear Energy University Program (NE0000315).Google Scholar