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Statistical Characterization of High Angle Graphene Grain Boundaries at Atomic Resolution

Published online by Cambridge University Press:  27 August 2014

Colin Ophus ,
Haider Rasool ,
Alex Zettl ,
Michael F Crommie  and
Ulrich Dahmen
Colin Ophus
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, USA
Haider Rasool
Affiliation:
Department of Physics, University of California Berkeley, Berkeley, USA Materials Science Department, Lawrence Berkeley National Laboratory, Berkeley, USA
Alex Zettl
Affiliation:
Department of Physics, University of California Berkeley, Berkeley, USA Materials Science Department, Lawrence Berkeley National Laboratory, Berkeley, USA
Michael F Crommie
Affiliation:
Department of Physics, University of California Berkeley, Berkeley, USA Materials Science Department, Lawrence Berkeley National Laboratory, Berkeley, USA
Ulrich Dahmen
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1056 - 1057
Copyright
Copyright © Microscopy Society of America 2014 

References

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[3] Cockayne, E Physical Review B 85 (2012)125409.Google Scholar
[4] Ophus, Cand Wealds, T Ultramicroscopy 113 (2012) p. 88.Google Scholar
[5] Rasool, H, Ophus, C, Klug, WS & Zettl, Aand Gimzewski, JK Nature Comm. 4 (2013) p. 2811.Google Scholar
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[7] The authors acknowledge the financial support of the Office of Science, Office of Basic Energy Sciences of the US Department of Energy under contract number De-AC02-05CH11231.Google Scholar