Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-27T13:01:49.802Z Has data issue: false hasContentIssue false
  • English
  • Français

Standardless Quantification at Trace Elemental (PPM) Levels Using a Novel Attachment within an Electron Microscope and Microprobe

Published online by Cambridge University Press:  25 July 2016

Wenbing Yun ,
SH Lau ,
Benjamin Stripe ,
Alan Lyon ,
David Reynolds ,
Sharon Chen ,
Richard Ian Spink  and
Sylvia JY Lewis
Wenbing Yun
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA
SH Lau
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA
Benjamin Stripe
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA
Alan Lyon
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA
David Reynolds
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA
Sharon Chen
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA
Richard Ian Spink
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA
Sylvia JY Lewis
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 436 - 437
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Bell, DC Energy Dispersive X-ray Analysis in the Electron Microscope (2003).Google Scholar
[2] Newbury, DE Scanning (2013).Google ScholarPubMed
[3] Acknowledgments go to the NSF, Division of Industrial Innovation & Partnerships for funding the development of x-ray mirror lens (IIP-1448727) and to the NIH, National Institute of General Medicine Science for funding the development of the microstructured source target (GRANT11545218).Google Scholar