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The Stability of High Tension Measured by Convergent Beam Electron Diffraction as Base for High Accuracy of Lattice Parameter Determination

Published online by Cambridge University Press:  07 September 2007

O Klein ,
A Chuvilin ,
J Biskupek  and
U Kaiser
O Klein
Affiliation:
University of Ulm, Germany
A Chuvilin
Affiliation:
University of Ulm, Germany
J Biskupek
Affiliation:
University of Ulm, Germany
U Kaiser
Affiliation:
University of Ulm, Germany
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 132 - 133
Copyright
Copyright © Microscopy Society of America 2007

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