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SQUARREL: Scattering Quotient Analysis to Retrieve the Ratio of Elements in X-ray Ptychography

Published online by Cambridge University Press:  05 August 2019

Chen-Ting Liao ,
Yuan Hung Lo ,
Jihan Zhou ,
Arjun Rana ,
Charles S. Bevis ,
Guan Gui ,
Bjoern Enders ,
Kevin Cannon ,
David Shapiro  and
Chris Bennett
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Chen-Ting Liao*
Affiliation:
JILA and Department of Physics, University of Colorado and National Institute of Standards and Technology (NIST), Boulder, CO 80309, USA.
Yuan Hung Lo
Affiliation:
Department of Bioengineering, University of California Los Angeles, CA 90095, USA. Department of Physics and Astronomy and California NanoSystems Institute, University of California Los Angeles, CA 90095, USA.
Jihan Zhou
Affiliation:
Department of Physics and Astronomy and California NanoSystems Institute, University of California Los Angeles, CA 90095, USA.
Arjun Rana
Affiliation:
Department of Physics and Astronomy and California NanoSystems Institute, University of California Los Angeles, CA 90095, USA.
Charles S. Bevis
Affiliation:
JILA and Department of Physics, University of Colorado and National Institute of Standards and Technology (NIST), Boulder, CO 80309, USA.
Guan Gui
Affiliation:
JILA and Department of Physics, University of Colorado and National Institute of Standards and Technology (NIST), Boulder, CO 80309, USA.
Bjoern Enders
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
Kevin Cannon
Affiliation:
Department of Physics, University of Central Florida, Orlando, FL 32816, USA.
David Shapiro
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
Chris Bennett
Affiliation:
Department of Physics, University of Central Florida, Orlando, FL 32816, USA.
Henry Kapteyn
Affiliation:
JILA and Department of Physics, University of Colorado and National Institute of Standards and Technology (NIST), Boulder, CO 80309, USA.
Roger Falcone
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
Jianwei Miao
Affiliation:
Department of Physics and Astronomy and California NanoSystems Institute, University of California Los Angeles, CA 90095, USA.
Margaret Murnane
Affiliation:
JILA and Department of Physics, University of Colorado and National Institute of Standards and Technology (NIST), Boulder, CO 80309, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 112 - 113
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Miao, J., Ishikawa, T., Robinson, I. K. and Murnane, M. M. Science 348, 530–535 (2015).Google Scholar
[2]Pfeiffer, F. Nat. Photonics 12, 9–17 (2018).Google Scholar
[3]Celestre, R., et al. J. Phys. Conf. Ser. 849, 0–4 (2017).Google Scholar
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[8]This work was supported by STROBE: A National Science Foundation Science & Technology Center, under Grant No. DMR 1548924.Google Scholar