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Spectral Deconvolution and Quantification in EDS Using Low Energy X-ray Lines From Steel Spectra

Published online by Cambridge University Press:  25 July 2016

Ralf Terborg ,
Tobias Salge ,
Philippe T. Pinard  and
Silvia Richter
Ralf Terborg
Affiliation:
Bruker Nano GmbH, Am Studio 2D, 12489 Berlin, Germany
Tobias Salge
Affiliation:
Core Research Laboratories, Natural History Museum, London, UK
Philippe T. Pinard
Affiliation:
Central Facility for Electron Microscopy, RWTH Aachen University, Aachen, Germany
Silvia Richter
Affiliation:
Central Facility for Electron Microscopy, RWTH Aachen University, Aachen, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 404 - 405
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Llovet, , et al, IOP Conf. Series: Materials Science and Engineering 32 (2012) 012014.Google Scholar
[2] Pinard, PT, et al, Micosc. Microanal 21(Suppl 3 (2015) 1879.Google Scholar