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Specimen Preparation Method for Size Distribution Measurements of Nano-materials by Scanning Electron Microscopy - Fixing of Nano-particles on a Substrate with Adhesive Coating

Published online by Cambridge University Press:  23 September 2015

Kazuhiro KUMAGAI  and
Akira KUROKAWA
Kazuhiro KUMAGAI
Affiliation:
Surface and Nano-Analysis Section, Nanomaterial Characterization Division, National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, JAPAN
Akira KUROKAWA
Affiliation:
Surface and Nano-Analysis Section, Nanomaterial Characterization Division, National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, JAPAN

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1709 - 1710
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[2] Lopez-Serrano, A, et al, Analytical Methods 6 (2014). p 38.CrossRefGoogle Scholar
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[6] The authors thank Dr. H. Kato in AIST for kind help in preparation of the silica NPs. This work was performed as one of the studies conducted by the consortium for measurement solutions for industrial use of nanomaterials (COMS-NANO) in Japan..Google Scholar