Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Larson, D.J.
Prosa, T.J.
Geiser, B.P.
and
Egelhoff, W.F.
2011.
Effect of analysis direction on the measurement of interfacial mixing in thin metal layers with atom probe tomography.
Ultramicroscopy,
Vol. 111,
Issue. 6,
p.
506.
Jin, S.
Jones, K. S.
Ronsheim, P. A.
and
Hatzistergos, M.
2011.
Pulsed-laser atom probe tomography of p-type field effect transistors on Si-on-insulator substrates.
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,
Vol. 29,
Issue. 6,
Prosa, T. J.
Clifton, P. H.
Zhong, H.
Tyagi, A.
Shivaraman, R.
DenBaars, S. P.
Nakamura, S.
and
Speck, J. S.
2011.
Atom probe analysis of interfacial abruptness and clustering within a single InxGa1−xN quantum well device on semipolar (101¯1¯) GaN substrate.
Applied Physics Letters,
Vol. 98,
Issue. 19,
Schreiber, Daniel K.
Adusumilli, Praneet
Hemesath, Eric R.
Seidman, David N.
Petford-Long, Amanda K.
and
Lauhon, Lincoln J.
2012.
A Method for Directly Correlating Site-Specific Cross-Sectional and Plan-View Transmission Electron Microscopy of Individual Nanostructures.
Microscopy and Microanalysis,
Vol. 18,
Issue. 6,
p.
1410.
Kelly, Thomas F.
and
Larson, David J.
2012.
Atom Probe Tomography 2012.
Annual Review of Materials Research,
Vol. 42,
Issue. 1,
p.
1.
Baik, Sung-Il
Olszta, M.J.
Bruemmer, S.M.
and
Seidman, David N.
2012.
Grain-boundary structure and segregation behavior in a nickel-base stainless alloy.
Scripta Materialia,
Vol. 66,
Issue. 10,
p.
809.
Narayan, Kedar
Prosa, Ty J.
Fu, Jing
Kelly, Thomas F.
and
Subramaniam, Sriram
2012.
Chemical mapping of mammalian cells by atom probe tomography.
Journal of Structural Biology,
Vol. 178,
Issue. 2,
p.
98.
Larson, David J.
Prosa, Ty J.
Ulfig, Robert M.
Geiser, Brian P.
and
Kelly, Thomas F.
2013.
Local Electrode Atom Probe Tomography.
p.
25.
Larson, David J.
Prosa, Ty J.
Ulfig, Robert M.
Geiser, Brian P.
and
Kelly, Thomas F.
2013.
Local Electrode Atom Probe Tomography.
p.
79.
Heck, Philipp R.
Stadermann, Frank J.
Isheim, Dieter
Auciello, Orlando
Daulton, Tyrone L.
Davis, Andrew M.
Elam, Jeffrey W.
Floss, Christine
Hiller, Jon
Larson, David J.
Lewis, Josiah B.
Mane, Anil
Pellin, Michael J.
Savina, Michael R.
Seidman, David N.
and
Stephan, Thomas
2014.
Atom‐probe analyses of nanodiamonds from Allende.
Meteoritics & Planetary Science,
Vol. 49,
Issue. 3,
p.
453.
Miller, Michael K.
and
Forbes, Richard G.
2014.
Atom-Probe Tomography.
p.
189.
Brons, J.G.
Herzing, A.A.
Henry, K.T.
Anderson, I.M.
and
Thompson, G.B.
2014.
Comparison of atom probe compositional fidelity across thin film interfaces.
Thin Solid Films,
Vol. 551,
Issue. ,
p.
61.
Baik, Sung‐Il
Ma, Lulu
Kim, Yoon‐Jun
Li, Bo
Liu, Mingjie
Isheim, Dieter
Yakobson, Boris I.
Ajayan, Pulickel M.
and
Seidman, David N.
2015.
An Atomistic Tomographic Study of Oxygen and Hydrogen Atoms and their Molecules in CVD Grown Graphene.
Small,
Vol. 11,
Issue. 44,
p.
5968.
Müller, Claudia M.
Sologubenko, Alla S.
Gerstl, Stephan S.A.
Süess, Martin J.
Courty, Diana
and
Spolenak, Ralph
2016.
Nanoscale Cu/Ta multilayer deposition by co-sputtering on a rotating substrate. Empirical model and experiment.
Surface and Coatings Technology,
Vol. 302,
Issue. ,
p.
284.
Martin, Andrew J.
Weng, Weihao
Zhu, Zhengmao
Loesing, Rainer
Shaffer, James
and
Katnani, Ahmad
2016.
Cross-sectional atom probe tomography sample preparation for improved analysis of fins on SOI.
Ultramicroscopy,
Vol. 161,
Issue. ,
p.
105.
Parikh, Pritesh
Senowitz, Corey
Lyons, Don
Martin, Isabelle
Prosa, Ty J.
DiBattista, Michael
Devaraj, Arun
and
Meng, Y. Shirley
2017.
Three-Dimensional Nanoscale Mapping of State-of-the-Art Field-Effect Transistors (FinFETs).
Microscopy and Microanalysis,
Vol. 23,
Issue. 5,
p.
916.
Prosa, Ty J.
and
Larson, David J.
2017.
Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography.
Microscopy and Microanalysis,
Vol. 23,
Issue. 2,
p.
194.
Frierdich, Andrew J.
Saxey, David W.
Adineh, Vahid R.
Fougerouse, Denis
Reddy, Steven M.
Rickard, William D. A.
Sadek, Abu Z.
and
Southall, Scarlett C.
2019.
Direct Observation of Nanoparticulate Goethite Recrystallization by Atom Probe Analysis of Isotopic Tracers.
Environmental Science & Technology,
Vol. 53,
Issue. 22,
p.
13126.
Hofmann, Felix
Phillips, Nicholas W.
Das, Suchandrima
Karamched, Phani
Hughes, Gareth M.
Douglas, James O.
Cha, Wonsuk
and
Liu, Wenjun
2020.
Nanoscale imaging of the full strain tensor of specific dislocations extracted from a bulk sample.
Physical Review Materials,
Vol. 4,
Issue. 1,
Smith, Jesse D
Huh, Jeong
Shelton, Adam
Reidy, Richard F
and
Young, Marcus L
2021.
Laser-Assisted Field Evaporation of (R = Gd, Sm) High-Temperature Superconducting Coated Conductors.
Microscopy and Microanalysis,
Vol. 27,
Issue. 6,
p.
1338.