Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-19T23:05:49.343Z Has data issue: false hasContentIssue false

Spatially Resolved Characterization of Interface Plasmons in Si/SiO2 Core/Shell Nanostructures

Published online by Cambridge University Press:  26 July 2009

J Wang
Affiliation:
The Chinese University of Hong Kong
X Wang
Affiliation:
The Chinese University of Hong Kong
Y Jiao
Affiliation:
The Chinese University of Hong Kong
Q Li
Affiliation:
The Chinese University of Hong Kong
M-W Chu
Affiliation:
National Taiwan University,Taiwan
M Malac
Affiliation:
National Institute for Nanotechnology,Canada

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2009