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Sparse and Adaptive Sampling in Scanning Electron Microscopy

Published online by Cambridge University Press:  07 February 2019

Tim Dahmen  and
Patrick Trampert
Tim Dahmen
Affiliation:
Deutsches Forschungszentrum für Künstliche Intelligenz GmbH, Saarbrücken, Germany.
Patrick Trampert
Affiliation:
Deutsches Forschungszentrum für Künstliche Intelligenz GmbH, Saarbrücken, Germany. Saarland University, Saarbrücken, Germany.

Abstract

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Type
Towards High-Speed Low-Dose In-Situ
Information
Microscopy and Microanalysis , Volume 25 , Issue S1: Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy , February 2019 , pp. 29 - 30
Copyright
Copyright © Microscopy Society of America 2019 

References

References:

[1]Trampert, P et al. , Ultramicroscopy 191 (2018), p. 11.Google Scholar
[2]Boughorbel, F et al. , Microsc Microanal 23 (S1) (2017), p. 150.Google Scholar
[3]Dahmen, T et al. , Scientific Reports 6 (2016), p. 25350.Google Scholar
[4]The authors thank Thermo Fischer Scientific, DFKI GmbH, Saarland University, and INM GmbH for funding the research.Google Scholar