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Some Charge Control Criteria for Focused Ion Beam Milling of Insulators and Biological Specimens using a Quanta 3D DualBeam ESEM

Published online by Cambridge University Press:  01 August 2005

D J Stokes ,
F Morrissey ,
W R Knowles  and
A M Donald
D J Stokes
Affiliation:
University of Cambridge
F Morrissey
Affiliation:
FEI Company
W R Knowles
Affiliation:
FEI Company
A M Donald
Affiliation:
University of Cambridge

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 804 - 805
Copyright
© 2005 Microscopy Society of America