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Solving Characterization Challenges for CdTe-Based Thin Film Photovoltaics: Comparison of Analytical Techniques

Published online by Cambridge University Press:  26 July 2009

K Dovidenko ,
VS Smentkowski ,
O Riccobono ,
LA Le Tarte ,
H Piao ,
W Heward ,
D Ellis ,
R Neander ,
JN Johnson  and
BA Korevaar
...Show all authors
K Dovidenko
Affiliation:
GE Global Research Center
VS Smentkowski
Affiliation:
GE Global Research Center
O Riccobono
Affiliation:
GE Global Research Center
LA Le Tarte
Affiliation:
GE Global Research Center
H Piao
Affiliation:
GE Global Research Center
W Heward
Affiliation:
GE Global Research Center
D Ellis
Affiliation:
GE Global Research Center
R Neander
Affiliation:
GE Global Research Center
JN Johnson
Affiliation:
GE Global Research Center
BA Korevaar
Affiliation:
GE Global Research Center
JA DeLuca
Affiliation:
GE Global Research Center

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1386 - 1387
Copyright
Copyright © Microscopy Society of America 2009