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A Soft X-ray Emission Specrometer with High-energy Resolution for Electron Probe Microanalysis

Published online by Cambridge University Press:  01 August 2010

H Takahashi ,
N Handa ,
T Murano ,
M Terauchi ,
M Koike ,
T Kawachi ,
T Imazono ,
M Koeda ,
T Nagano  and
H Sasai
...Show all authors
H Takahashi
Affiliation:
JEOL Ltd, Japan
N Handa
Affiliation:
JEOL Engineering Co Ltd, Japan
T Murano
Affiliation:
JEOL Engineering Co Ltd, Japan
M Terauchi
Affiliation:
Tohoku University, Japan
M Koike
Affiliation:
Japan Atomic Energy Agency, Japan
T Kawachi
Affiliation:
Japan Atomic Energy Agency, Japan
T Imazono
Affiliation:
Japan Atomic Energy Agency, Japan
M Koeda
Affiliation:
Shimadzu Co Ltd, Japan
T Nagano
Affiliation:
Shimadzu Co Ltd, Japan
H Sasai
Affiliation:
Shimadzu Co Ltd, Japan
Y Oue
Affiliation:
Shimadzu Co Ltd, Japan
Z Yonezawa
Affiliation:
Shimadzu Co Ltd, Japan
S Kuramoto
Affiliation:
Shimadzu Co Ltd, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 34 - 35
Copyright
Copyright © Microscopy Society of America 2010