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Site-specific Sample Preparation by Concentrated Ar Ion Milling for Post-mortem Atomic Resolution Imaging of Rapidly Solidified Al-Cu Thin Films After Pulsed Laser Melting

Published online by Cambridge University Press:  22 July 2022

C.S. Bonifacio ,
B. Vishwanadh ,
J. Jo ,
M.L. Ray ,
J.M.K. Wiezorek  and
P. Fischione
C.S. Bonifacio*
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
B. Vishwanadh
Affiliation:
Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, PA, USA
J. Jo
Affiliation:
Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, PA, USA
M.L. Ray
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
J.M.K. Wiezorek
Affiliation:
Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, PA, USA
P. Fischione
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Beyond Visualization with In Situ and Operando TEM
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 124 - 125
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Copyright
Copyright © Microscopy Society of America 2022

References

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The authors acknowledge support from National Science Foundation (NSF 1607922).Google Scholar