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Site Specific Preparation of Powders for High-Resolution Analytical Electron Microscopy Using a Ga+ Focused Ion Beam

Published online by Cambridge University Press:  25 July 2016

Suzy Vitale ,
Joshua D. Sugar ,
Patrick J. Cappillino ,
Lucille A. Giannuzzi  and
David B. Robinson
Suzy Vitale
Affiliation:
Sandia National Laboratories, Livermore CA, USA
Joshua D. Sugar
Affiliation:
Sandia National Laboratories, Livermore CA, USA
Patrick J. Cappillino
Affiliation:
University of Massachusetts Dartmouth, Chemistry and Biochemistry Department, North Dartmouth, MA, USA
Lucille A. Giannuzzi
Affiliation:
EXpressLO LLC, 5483 Lee St., Unit 12, Lehigh Acres, FL 33971, USA
David B. Robinson
Affiliation:
Sandia National Laboratories, Livermore CA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 180 - 181
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Homer, M., et al., Microscopy and Microanalysis 21 ( Suppl 3) (2015). p. 1815.Google Scholar
[2] Wen, H.M., et al., Microscopy and Microanalysis 21 (2015). p. 1184.Google Scholar
[3] Ong, M.D., et al., Chemistry of Materials 24 (2012). p. 996.Google Scholar
[4] Prenitzer, B.I., et al., Metallurgical and Materials Transactions A. 29A (1998). p. 2399.Google Scholar
[5] Giannuzzi, L.A. & Stevie, F.A. “Introduction to Focused Ion Beams”. Springer (2005). p. 222–223.CrossRefGoogle Scholar
[6] Giannuzzi, L.A., et al., Microscopy and Microanalysis 21 (2015). p. 1032.Google Scholar
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[8] Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-AC04-94AL85000.Google Scholar