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Single-Ion Deconvolution of Mass Peak Overlaps for Atom Probe Microscopy

Published online by Cambridge University Press:  16 March 2017

Andrew J. London ,
Daniel Haley  and
Michael P. Moody
Andrew J. London*
Affiliation:
Department of Materials Science, University of Oxford, 16 Parks Rd, Oxford OX1 3PH, UK
Daniel Haley
Affiliation:
Department of Materials Science, University of Oxford, 16 Parks Rd, Oxford OX1 3PH, UK
Michael P. Moody
Affiliation:
Department of Materials Science, University of Oxford, 16 Parks Rd, Oxford OX1 3PH, UK
*
*Corresponding author. [email protected]
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Abstract

Due to the intrinsic evaporation properties of the material studied, insufficient mass-resolving power and lack of knowledge of the kinetic energy of incident ions, peaks in the atom probe mass-to-charge spectrum can overlap and result in incorrect composition measurements. Contributions to these peak overlaps can be deconvoluted globally, by simply examining adjacent peaks combined with knowledge of natural isotopic abundances. However, this strategy does not account for the fact that the relative contributions to this convoluted signal can often vary significantly in different regions of the analysis volume; e.g., across interfaces and within clusters. Some progress has been made with spatially localized deconvolution in cases where the discrete microstructural regions can be easily identified within the reconstruction, but this means no further point cloud analyses are possible. Hence, we present an ion-by-ion methodology where the identity of each ion, normally obscured by peak overlap, is resolved by examining the isotopic abundance of their immediate surroundings. The resulting peak-deconvoluted data are a point cloud and can be analyzed with any existing tools. We present two detailed case studies and discussion of the limitations of this new technique.

Keywords

atom probe tomographymass spectrum analysispeak overlapspeak deconvolutionatomic-scale analysis
Type
New Approaches and Correlative Microscopy
Information
Microscopy and Microanalysis , Volume 23 , Special Issue 2: Atom Probe Tomography & Microscopy 2016 , April 2017 , pp. 300 - 306
Copyright
© Microscopy Society of America 2017 

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References

Cairney, J.M., Rajan, K., Haley, D., Gault, B., Bagot, P.A., Choi, P.-P., Felfer, P.J., Ringer, S.P., Marceau, R.K. & Moody, M.P. (2015). Mining information from atom probe data. Ultramicroscopy 159(Pt 2), 324–337.Google Scholar
Chen, Y., Chou, P.H. & Marquis, E.A. (2014). Quantitative atom probe tomography characterization of microstructures in a proton irradiated 304 stainless steel. J Nucl Mater 451(1–3), 130–136.Google Scholar
Gault, B., Moody, M.P., Cairney, J. & Ringer, S. (2012). Atom Probe Microscopy (vol. 160. New York: Springer-Verlag.Google Scholar
Haley, D., Choi, P. & Raabe, D. (2015). Guided mass spectrum labelling in atom probe tomography. Ultramicroscopy 159(Pt 2), 338–345.Google Scholar
Haydock, R. & Kingham, D.R. (1980). Post-ionization of field-evaporated ions. Phys Rev Lett 44(23), 1520–1523.Google Scholar
Hellman, O.C., du Rivage, J.B. & Seidman, D.N. (2003). Efficient sampling for three-dimensional atom probe microscopy data. Ultramicroscopy 95(0), 199–205.CrossRefGoogle ScholarPubMed
Johnson, L., Thuvander, M., Stiller, K., Oden, M. & Hultman, L. (2013). Blind deconvolution of time-of-flight mass spectra from atom probe tomography. Ultramicroscopy 132, 60–64.Google Scholar
Kelly, T.F. & Larson, D.J. (2012). The second revolution in atom probe tomography. MRS Bulletin 37, 150–158.Google Scholar
Kirchhofer, R., Teague, M.C. & Gorman, B.P. (2013). Thermal effects on mass and spatial resolution during laser pulse atom probe tomography of cerium oxide. J Nucl Mater 436(1–3), 23–28.Google Scholar
Kuduz, M., Schmitz, G. & Kirchheim, R. (2004). Investigation of oxide tunnel barriers by atom probe tomography (tap). Ultramicroscopy 101(2–4), 197–205.CrossRefGoogle ScholarPubMed
Larson, D.J., Prosa, T.J., Ulfig, R.M., Geiser, B.P. & Kelly, T.F. (2013). Local Electrode Atom Probe Tomography: A User’s Guide . New York: Springer-Verlag.Google Scholar
Lawson, C. & Hanson, R. (1995). Solving Least Squares Problems. Philadelphia, PA: Society for Industrial and Applied Mathematics.Google Scholar
London, A.J., Lozano-Perez, S., Moody, M.P., Amirthapandian, S., Panigrahi, B.K., Sundar, C.S. & Grovenor, C.R.M. (2015 a). Quantification of oxide particle composition in model oxide dispersion strengthened steel alloys. Ultramicroscopy, 159, 360–367.Google Scholar
London, A.J., Santra, S., Amirthapandian, S., Panigrahi, B.K., Sarguna, R.M., Balaji, S., Vijay, R., Sundar, C.S., Lozano-Perez, S. & Grovenor, C.R.M. (2015 b). Effect of Ti and Cr on dispersion, structure and composition of oxide nano-particles in model ODS alloys. Acta Mater 97, 223–233.Google Scholar
Mancini, L., Amirifar, N., Shinde, D., Blum, I., Gilbert, M., Vella, A., Vurpillot, F., Lefebvre, W., Larde, R., Talbot, E., Pareige, P., Portier, X., Ziani, A., Davesnne, C., Durand, C., Eymery, J., Butte, R., Carlin, J.-F., Grandjean, N. & Rigutti, L. (2014). Composition of wide bandgap semiconductor materials and nanostructures measured by atom probe tomography and its dependence on the surface electric field. J Phys Chem C 118(41), 24136–24151.Google Scholar
Martin, T., Radecka, A., Sun, L., Simm, T., Dye, D., Perkins, K., Gault, B., Moody, M. & Bagot, P. (2016). Insights into microstructural interfaces in aerospace alloys characterised by atom probe tomography. Mater Sci Technol 32(3), 232–241.Google Scholar
Maus, M., Cotlet, M., Hofkens, J., Gensch, T., De Schryver, F.C., Schaffer, J. & Seidel, C. (2001). An experimental comparison of the maximum likelihood estimation and nonlinear least-squares fluorescence lifetime analysis of single molecules. Anal Chem 73(9), 2078–2086.Google Scholar
Miller, M. (1992). Implementation of the optical atom probe. Surf Sci 266(1), 494–500.CrossRefGoogle Scholar
Miller, M.K. (2000). Atom Probe Tomography. New York: Plenum Publishing Corp.CrossRefGoogle Scholar
Miller, M.K., Cerezo, A., Hetherington, M.G. & Smith, G.D.W. (1996). Atom Probe Field Ion Microscopy. Oxford: Oxford Science Publications.Google Scholar
Müller, E.W. & Krishnaswamy, S. (1974). Energy deficits in pulsed field evaporation and deficit compensated atom-probe designs. Rev Sci Instrum 45(9), 1053–1059.Google Scholar
Müller, E.W., Panitz, J.A. & McLane, S.B. (1968). The atom-probe field ion microscope. Rev Sci Instrum 39(1), 83–86.Google Scholar
Narayan, K., Prosa, T.J., Fu, J., Kelly, T.F. & Subramaniam, S. (2012). Chemical mapping of mammalian cells by atom probe tomography. J Struct Biol 178(2), 98–107.Google Scholar
Parish, C.M. & Miller, M.K. (2010). Multivariate statistical analysis of atom probe tomography data. Ultramicroscopy 110(11), 1362–1373.Google Scholar
Seidman, D.N. (2007). Three-dimensional atom-probe tomography: Advances and applications. Annu Rev Mater Res 37(1), 127–158.CrossRefGoogle Scholar
Stephenson, L.T., Ceguerra, A.V., Li, T., Rojhirunsakool, T., Nag, S., Banerjee, R., Cairney, J.M. & Ringer, S.P. (2014). Point-by-point compositional analysis for atom probe tomography. MethodsX 1, 12–18.Google Scholar
Takahashi, J., Kawakami, K. & Kobayashi, Y. (2011). Quantitative analysis of carbon content in cementite in steel by atom probe tomography. Ultramicroscopy 111(8), 1233–1238.Google Scholar
Tsong, T.T. (1984). Pulsed-laser-stimulated field ion emission from metal and semiconductor surfaces: A time-of-flight study of the formation of atomic, molecular, and cluster ions. Phys Rev B 30(9), 4946–4961.Google Scholar
Valley, J.W., Cavosie, A.J., Ushikubo, T., Reinhard, D.A., Lawrence, D.F., Larson, D.J., Clifton, P.H., Kelly, T.F., Wilde, S.A., Moser, D.E. & Spicuzza, M.J. (2014). Hadean age for a post-magma-ocean zircon confirmed by atom-probe tomography. Nat Geosci 7(3), 219–223.Google Scholar
Vella, A., Mazumder, B., Costa, G.D. & Deconihout, B. (2011). Field evaporation mechanism of bulk oxides under ultra fast laser illumination. J Appl Phys 110(4), 044321.CrossRefGoogle Scholar
Vurpillot, F., Bostel, A., Cadel, E. & Blavette, D. (2000). The spatial resolution of 3D atom probe in the investigation of single-phase materials. Ultramicroscopy 84(3), 213–224.CrossRefGoogle ScholarPubMed
Wojdyr, M. (2010). Fityk: A general-purpose peak fitting program. J Appl Crystallogr 43(5), 1126–1128.Google Scholar