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Simulation of Energy Deposition in E-Beam Irradiated Polymers

Published online by Cambridge University Press:  02 July 2020

Paula Horny
Affiliation:
Département de Génie Mécanique, Université de Sherbrooke, Sherbrooke, Québec, Canada
Raynald Gauvin
Affiliation:
Département de Génie Mécanique, Université de Sherbrooke, Sherbrooke, Québec, Canada
Pierre Hovington
Affiliation:
IREQ, Institut de recherche d’Hydro Québec, Varennes, Québec, Canada
Simon Besner
Affiliation:
LTEE, Laboratoire des technologies électrochimiques et électrotechnologiques d’Hydro Québec, Shawinigan, Québec, Canada
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Extract

Introduction

Radiation curing of polymers, by UV light or E-beam, is of growing interest in the state-of-the-art industry. Radiation curing is solvent free and leads to important energy and money savings. Improved materials characteristics, better control of doses and more accurate application allow radiation curing to take a big part of the surface coating industry and, for the last ten years, the polymeric and microelectronics (lithography) industry. But behaviors of polymers under radiant source is often empirically characterized. In this abstract, it is proposed a way to obtain accurate energy distribution from Monte Carlo simulations. For bulk or thin polymeric films, it is therefore essential to simulate energy distribution, in order to foresee what happens in the sample.

Results

CASINO is a single scattering Monte Carlo Simulation of electroN trajectory in sO lid -particularly designed for low energy beam interaction in a bulk and thin foil.

Type
Mas Celebrates: Fifty Years of Electron Probe Microanalysis
Copyright
Copyright © Microscopy Society of America

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References

1.Newton, L. (1982). “Trends and developments in radiation curable coatings.” Polym. Paint Col. J. 172(4062): 2123.Google Scholar
2.Hovington, P., Drouin, D. and Gauvin, R. (1997). “A New Monte Carlo Code in C Language for Electron Beam Interaction - Part I: Description of the Program.” Scanning 19(1): 1–14.CrossRefGoogle Scholar
3.Hovington, P., Drouin, D. and Gauvin, R. (1997). “A New Monte Carlo Code in C Language for Electron Beam Interaction - Part II: Tabulated Values of the Mott Cross Section.” Scanning 19(1): 2028.Google Scholar
4.Hovington, P., Drouin, D. and Gauvin, R. (1997). “A New Monte Carlo Code in C Language for Electron Beam Interaction - Part III: Stopping Power at Low Energies.” Scanning 19(1): 2935.CrossRefGoogle Scholar
5.Newbury, D.E. and Myklebust, R.L. (1981). A Monte Carlo electron trajectory simulation for analytical electron microscopy. Analytical Electron Microscopy. H. G. R. San Francisco, San Francisco Press: 9198.Google Scholar
6.Gauvin, R. and G.L'Espérance, (1992). “A Monte Carlo code to simulate the effect of fast secondary electrons on kAB factors and spatial resolution in the TEM.” Journal of Microscopy 168(2): 153167.Google Scholar