Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-17T09:18:00.023Z Has data issue: false hasContentIssue false
  • English
  • Français

Simulating STEM Imaging of Nanoparticles in Micrometers-Thick Substrates

Published online by Cambridge University Press:  08 April 2017

N Poirier-Demers ,
H Demers ,
D Drouin  and
N de Jonge
N Poirier-Demers
Affiliation:
Université de Sherbrooke, Canada
H Demers
Affiliation:
Université de Sherbrooke, Canada
D Drouin
Affiliation:
Université de Sherbrooke, Canada
N de Jonge
Affiliation:
Vanderbilt University School of Medicine

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 980 - 981
Copyright
Copyright © Microscopy Society of America 2011