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SIMS Performed on Focused Ion Beam Instruments : In-situ Correlative Structural and Chemical Imaging

Published online by Cambridge University Press:  22 July 2022

Jean-Nicolas Audinot ,
Alexander D. Ost ,
Charlotte Stoffels ,
Patrick Philipp ,
Olivier De Castro ,
Antje Biesemeier ,
Quang Hung Hoang  and
Tom Wirtz
Jean-Nicolas Audinot*
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
Alexander D. Ost
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg University of Luxembourg, Esch-sur-Alzette, Luxembourg
Charlotte Stoffels
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg University of Luxembourg, Esch-sur-Alzette, Luxembourg
Patrick Philipp
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
Olivier De Castro
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
Antje Biesemeier
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
Quang Hung Hoang
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
Tom Wirtz
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
*
*Corresponding author: [email protected]

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 30 - 31
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Copyright
Copyright © Microscopy Society of America 2022

References

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The authors gratefully acknowledge support by the Luxembourg National Research Fund (FNR) under grant no. INTER/DFG/17/11779689, and grant no. INTER/ANR/18/12545362.Google Scholar