Hostname: page-component-7bb8b95d7b-fmk2r Total loading time: 0 Render date: 2024-09-12T13:27:48.728Z Has data issue: false hasContentIssue false
  • English
  • Français

SIMS of Interfacial Segregation in Ceramics and Composites

Published online by Cambridge University Press:  02 July 2020

J.M. Chabala ,
K.L. Gavrilov ,
K.R. Mikeska ,
S.J. Bennison  and
R. Levi-Setti
J.M. Chabala
Affiliation:
Enrico Fermi Institute and Department of Physics, The University of Chicago, Chicago, IL60637
K.L. Gavrilov
Affiliation:
Enrico Fermi Institute and Department of Physics, The University of Chicago, Chicago, IL60637
K.R. Mikeska
Affiliation:
E.I. DuPont Co., Central Research and Development, Wilmington, DE19880
S.J. Bennison
Affiliation:
E.I. DuPont Co., Central Research and Development, Wilmington, DE19880
R. Levi-Setti
Affiliation:
Enrico Fermi Institute and Department of Physics, The University of Chicago, Chicago, IL60637
Get access

Extract

Trace impurities and dopants in sintered ceramics, often at levels below 100 parts per million, can significantly affect the performance of the materials. In alumina (A12O3), it is believed that calcium and silicon, which are the main background impurities, cause abnormal grain growth. The addition of magnesium to alumina produces several beneficial results, including enhanced densification and improved corrosion resistance of the ceramic. For example, LUCALUX®, which is a dense, transparent ceramic, is made by adding a small amount of MgO (<0.25%) to the alumina. Primarily because they are difficult to detect and image, it has not been easy to determine experimentally the mechanisms by which trace constituents influence the sintering of ceramics. Imaging secondary ion mass spectrometry (SIMS) is a valuable analytical technique for the submicrometer characterization of ceramics. Relevant to this study, magnesium and isotopes of silicon, which have largely eluded detection by traditional techniques, can be measured with SIMS.

Type
Segregation and Diffusion Analysis in Materials
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 525 - 526
Copyright
Copyright © Microscopy Society of America 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Bae, S.I. and Baik, S., J. Am. Cer. Soc. 76 [4] (1993) 1065.10.1111/j.1151-2916.1993.tb05338.xCrossRefGoogle Scholar
2.Thompson, A.M., et al., J. Am. Cer. Soc. 80 [2] (1997) 373, and references therein.10.1111/j.1151-2916.1997.tb02840.xCrossRefGoogle Scholar
3.Levi-Setti, R., et al., Proc. Microsc. and Microanal. Meeting, Minneapolis, MN, Bailey, G.W., et al., eds (1996) 1048.Google Scholar
4.Mogilevsky, R., et al., Mat. Sci. Eng. A 119 (1995) 209.10.1016/0921-5093(94)09635-ACrossRefGoogle Scholar
5.Soni, K.K., et al., JOM 45 (1993) 29.10.1007/BF03222346CrossRefGoogle Scholar
6.Chabala, J.M.,et al., Int. J. Mass Spect. Ion Processes 143 (1995) 191.10.1016/0168-1176(94)04119-RCrossRefGoogle Scholar
7.This work is supported by NSF award DMR-9625354.Google Scholar