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Short-Range Atomic Ordering in Amorphous Ion-Tracks in Pyrochlores

Published online by Cambridge University Press:  23 September 2015

R. Sachan ,
B. Liu ,
D. Aidhy ,
Y. Zhang ,
M. F. Chisholm  and
W. J. Weber
R. Sachan
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
B. Liu
Affiliation:
Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996
D. Aidhy
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
Y. Zhang
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996
M. F. Chisholm
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
W. J. Weber
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1333 - 1334
Copyright
Copyright © Microscopy Society of America 2015 

References

1. Sickafus, K. E., et al., Science 289 (2000) 748.CrossRefGoogle Scholar
2. Zhang, J., et al., J. Mater. Res. 25 (2010) 1344.CrossRefGoogle Scholar
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4. Lang, M., et al., Nat. mater 8 (2009) 793.Google Scholar
5. This work was sponsored by US Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division.Google Scholar