Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-26T11:36:10.699Z Has data issue: false hasContentIssue false
  • English
  • Français

Serial Thick Section Gas Cluster Ion Beam Scanning Electron Microscopy

Published online by Cambridge University Press:  01 August 2018

Kenneth J. Hayworth ,
David Peale ,
Zhiyuan Lu ,
C. Shan Xu  and
Harald F. Hess
Kenneth J. Hayworth
Affiliation:
Janelia Research Campus, Howard Hughes Medical Institute, Ashburn, United States.
David Peale
Affiliation:
Janelia Research Campus, Howard Hughes Medical Institute, Ashburn, United States.
Zhiyuan Lu
Affiliation:
Department of Psychology and Neuroscience, Dalhousie University, Halifax, Canada.
C. Shan Xu
Affiliation:
Janelia Research Campus, Howard Hughes Medical Institute, Ashburn, United States.
Harald F. Hess
Affiliation:
Janelia Research Campus, Howard Hughes Medical Institute, Ashburn, United States.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1444 - 1445
Copyright
© Microscopy Society of America 2018 

References

[1] Xu, CS, et al, Elife 6 2017) p. e25916.Google Scholar
[2] Keman, T, Garbowski, T Zeidler, D Proc. of SPIE 9658 2015) p. 965807–9658071.Google Scholar
[3] Yamada, I, et al, Mater. Sci. Eng. R Rep 34 2001) p. 231.Google Scholar
[4] Calcagno, L, Compagnini, G Foti, G Nucl. Instr. Meth. Phys. Res. B 65 1992) p. 413.Google Scholar
[5] Hayworth, KJ, et al, Nat. Methods 12 2015) p. 319.Google Scholar