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Serial Sectioning of Deformed Microcrystals using a Dual-Beam FIB-SEM Microscope

Published online by Cambridge University Press:  26 July 2009

MD Uchic  and
PA Shade
MD Uchic
Affiliation:
Air Force Research Laboratory
PA Shade
Affiliation:
Universal Technology Corporation

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 610 - 611
Copyright
Copyright © Microscopy Society of America 2009