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Serial Electron Crystallography: New Developments for Data Collection and Analysis

Published online by Cambridge University Press:  30 July 2021

Robert Bücker ,
Pascal Hogan-Lamarre ,
Pedram Mehrabi ,
Eike Schulz ,
Günther Kassier  and
R. J. Dwayne Miller
Robert Bücker
Affiliation:
Centre for Structural System Biology, University of Hamburg, Hamburg, Germany, United States
Pascal Hogan-Lamarre
Affiliation:
Department of Physics, University of Toronto, Toronto, ON, Canada, United States
Pedram Mehrabi
Affiliation:
Hamburg Centre for Ultrafast Imaging, HARBOR, University of Hamburg, Hamburg, Germany, United States
Eike Schulz
Affiliation:
Hamburg Centre for Ultrafast Imaging, HARBOR, University of Hamburg, Hamburg, Germany, United States
Günther Kassier
Affiliation:
Max Planck Institute for the Structure and Dynamics of Matter, Hamburg, Germany, United States
R. J. Dwayne Miller
Affiliation:
Departments of Physics and Chemistry, University of Toronto, Toronto, ON, Canada, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1286 - 1289
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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