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SEM-EDS of Artifacts from the HMAV Bounty Discovered at Pitcairn Island

Published online by Cambridge University Press:  05 August 2019

Abigail P Lindstrom*
Affiliation:
Materials Measurement Science Division, NIST, Gaithersburg, MD, USA.
Nicholas WM Ritchie
Affiliation:
Materials Measurement Science Division, NIST, Gaithersburg, MD, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
Microscopy and Microanalysis for Real-World Problem Solving
Copyright
Copyright © Microscopy Society of America 2019 

References

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[8]Certain products, either public domain or commercial, are identified in this paper. Identification of such products does not imply recommendation or endorsement by NIST, nor does it imply that the identified product is the best available.Google Scholar