Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-26T20:03:14.204Z Has data issue: false hasContentIssue false
  • English
  • Français

Self-Assembled and Micro-Patterned Mesoscopic Thin Films

Published online by Cambridge University Press:  02 July 2020

N. Yao ,
M. Trau ,
N. Nakagawa  and
I. A. Aksay
N. Yao
Affiliation:
Princeton Materials Institute, Princeton, New Jersey, 08540
M. Trau
Affiliation:
Princeton Materials Institute, Princeton, New Jersey, 08540 Department of Chemical Engineering, Princeton University, Princeton, New Jersey, 08540
N. Nakagawa
Affiliation:
Princeton Materials Institute, Princeton, New Jersey, 08540 Department of Chemical Engineering, Princeton University, Princeton, New Jersey, 08540
I. A. Aksay
Affiliation:
Princeton Materials Institute, Princeton, New Jersey, 08540 Department of Chemical Engineering, Princeton University, Princeton, New Jersey, 08540
Get access

Extract

Recently we have reported that the silica mesoscopic thin films can be formed at water/solid interface at room temperature. These self-assembled thin films are comprised of hexagonally packed nanotubules ((∼ 5 nm in diameter), with a percolating one-dimensional channel network that extends from one side of the film to the other. The solid substrate can affect strongly the overall alignment of assembly of surfactant micelle array. These films hold much promise for applications such as their use as orientated nanowires, sensor/actuator arrays and optoelectronic devices. Here, we report further electron microscopy studies of free standing thin film formed at air/water interface and patterned silica mesoscopic thin film formed with the guidance of micro-molding and electric field.

We employ tetraethoxy silane (TEOS), dissolved in acidic solution, as a silicate source and cetyltrimethyl ammonium chloride (CTAC) as the templating surfactant. Typical molar ratios are 1 TEOS : 1.2 CTAC : 9.2 HC1 : 1000 H2O.

Type
Nanophase and Amorphous Materials
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 730 - 731
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Aksay, I. A., Trau, M., Manne, S., Honma, I., Yao, N., Zhou, L., Fenter, P., Eisenberger, P. M., and Gruner, S. M., Science 273 892 (1996).CrossRefGoogle Scholar
2.Yao, N., Trau, M., Manne, S., Nakagawa, N., Lee, T., Honma, I., and Aksay, I. A., Microscopy and Microanalysis, 3 395 (1997).CrossRefGoogle Scholar
3.Yao, N., Trau, M., Kim, E., Xia, Y., Whitesides, G. M., and Aksay, I. A., Nature 390 674 (1997).Google Scholar
4. This work has made use of MRSEC Shared Facilities supported by the NSF under Award Number DMR-9400632, and supported by a grant from the U. S. Army Research Office (grant DAAH04-951-0102).Google Scholar