Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-26T01:51:01.817Z Has data issue: false hasContentIssue false
  • English
  • Français

Segregation In Cocrptta/Cr Magnetic Recording Media Measured By Eftem

Published online by Cambridge University Press:  02 July 2020

J. Bentley ,
J.E. Wittig  and
T.P. Nolan
J. Bentley
Affiliation:
Metals & Ceramics Division, Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN37831-6376
J.E. Wittig
Affiliation:
Vanderbilt University, , Nashville, TN37235
T.P. Nolan
Affiliation:
Komag Inc., 1704 Automation Parkway, San Jose, CA95131
Get access

Extract

Development of high-density longitudinal magnetic recording media (used for computer hard disks) with good noise performance and high thermal stability requires optimization of both alloy composition and processing methods. In CoCr(PtTa) thin films, intergranular Cr segregation is responsible for decoupling the magnetic exchange between the small ferromagnetic grains. The corresponding Cr depletion within the grains affects the “bulk” magnetic anisotropy. However, the nanoscale structural and chemical details that are needed for modeling and for guiding material development are not well understood. Energy-filtered transmission electron microscopy (EFTEM) has been used to characterize a series of CoCrTa/Cr, CoCrPt/Cr, and CoCrPtTa/Cr media sputtered under various processing conditions, in order to understand their structure-property-processing relationships.

Processing typical for hard-disk media was used: 30 or 60-nm films of a Cr underlayer followed by a Co alloy were d.c. magnetron sputtered onto a NiP-plated Al substrate pre-heated to 250°C.

Type
Atomic Structure And Microchemistry Of Interfaces
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 136 - 137
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Bentley, J., Microscopy and Microanalysis 4 suppl.2 (1998) 158.Google Scholar

2. Bentley, J. et al., these proceedings.Google Scholar

3. Bentley, J. et al., Mater. Res. Soc. Symp. Proc. 517 (1998) 205.CrossRefGoogle Scholar

4. Research at the ORNL SHaRE User Facility sponsored by the Division of Materials Sciences, U.S. Department of Energy, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research Corp., and through the SHaRE Program under contract DE-AC05-76OR00033 with Oak Ridge Associated Universities. Support from the Vanderbilt University Research Council and Komag Inc. is gratefully acknowledged.Google Scholar