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Secondary Electron Imaging in the Helium Ion Microscope

Published online by Cambridge University Press:  27 August 2014

Brad Matola  and
David C Joy
Brad Matola
Affiliation:
Denison University, Granville, OH 43023
David C Joy
Affiliation:
University of Tennessee, Knoxville, TN 37933

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1100 - 1101
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] The authors thank Dr. John Notte of Zeiss, and Dr. Adam Rondinone of the Center for NanoPhase Materials Science at Oak Ridge National Laboratory, for helpful discussions.Google Scholar