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Screening of Individual Nanostructures with STEM-EELS and EFTEM Spectral Imaging

Published online by Cambridge University Press:  31 July 2006

I Anderson ,
J Scott ,
K Klein ,
A Melechko  and
M Simpson
I Anderson
Affiliation:
National Institute of Standards and Technology
J Scott
Affiliation:
National Institute of Standards and Technology
K Klein
Affiliation:
Oak Ridge National Laboratory
A Melechko
Affiliation:
Oak Ridge National Laboratory
M Simpson
Affiliation:
Oak Ridge National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1170 - 1171
Copyright
© 2006 Microscopy Society of America