Microscopy and Analysis of Soft Matter: From the Molecules Up

Session Chairs: DJ Stokes, FEI Company, The Netherlands; RD Leapman, National Institutes of Health

Platform Session: Monday 9:00 AM, Room: Picuris

9:00 AM 1 (Invited) Off-Axis Electron Holography of Magnetic Fields in Biological Materials; RE Dunin-Borkowski; Danish Technical University, Denmark; T Kasama; University of Cambridge, United Kingdom; M Pósfai; University of Pannonia, Hungary; RKK Chong, ET Simpson; University of Cambridge, United Kingdom; J Dobson, JF Collingwood; Keele University, United Kingdom

9:30 AM\ 2Megapixel Quantitative EFTEM Imaging of Calcium in Biological Specimens; MA Aronova; National Institutes of Health, NIBIB; NB Pivovarova, SB Andrews; National Institutes of Health, NINDS; RD Leapman; National Institutes of Health, NIBIB

9:45 AM 3Laboratory Sources for Soft-X-Ray Imaging of Hydrated Biological Material; JA Hunt, PAC Takman, B Frazer, BC Gundrum, A Abbott, C Lee, CR Booth; Gatan Research & Development

10:00 AM Coffee Break

10:30 AM 4Quantitative 3-D Imaging of Eukaryotic Cells using Soft X-Ray Tomography; DY Parkinson; Lawrence Berkeley National Laboratory; G McDermott; University of California San Francisco; MA Le Gros, CA Larabell; Lawrence Berkeley National Laboratory

10:45 AM 5 (Invited) Imaging Carbon Nanoparticles in Cells; MH Gass; SuperSTEM Laboratory, United Kingdom; AE Porter; Imperial College London, United Kingdom

11:15 AM 6Electron Microscopy Characterization of Composite Organic-Inorganic Nanoparticles (COINs) as Raman Labels for Extra-cellular Analyses; AL Koh, CM Shachaf, S Elchuri, GP Nolan, R Sinclair; Stanford University

11:30 AM 7Negative Staining Produces Images of Proteins by Which Contrast Mechanisms?; WH Massover; Rutgers University

11:45 AM 8The Real Carbon K-Edge; DTL Alexander; Ecole Polytechnique Federale de Lausanne, France; JR Anderson; Arizona State University; L Forro; Ecole Polytechnique Federale de Lausanne, France; PA Crozier; Arizona State University

Scanning Probe Microscopy in the Physical and Biological Sciences

Session Chairs: IH Musselman, University of Texas at Dallas; VZ Poenitzsch, Southwest Research Institute

Platform Session: Monday 8:30 AM, Room: San Miguel

8:30 AM 9 (Invited) Applications of Scanned Probe Microscopy in Physical Sciences; PE Russell, DN Leonard; Appalachian State University; J Thorton; Veeco Instruments

9:00 AM 10 (Invited) Multimodal Atomic Force Microscopy for Nanomedicine: Biological Nanoimaging, Nanomechanics and Nanodevices; R Lal, S Ramachandran, F Teran Arce, M Allen; The University of Chicago; A Quist; RC Nano Corp

9:30 AM 11Single Cell Viability Measured by Scanning Electrochemical Microscopy and Live/Dead Staining; KM Jeerage, TL Oreskovic, N Goldstein, DS Lauria; National Institute of Standards and Technology

9:45 AM 12Contrast Mechanism for Visualization of Ferroelectric Domains with Scanning Force Microscopy; T Jungk, À Hoffmann, E Soergel; University of Bonn, Germany

10:00 AM Coffee Break

10:30 AM 13 (Invited) Probing Molecular Machines on Surfaces: The Nanocar and Beyond; K Kelly; Rice University

11:00 AM 14Lateral Resolution in Piezoresponse Force Microscopy; T Jungk, À Hoffmann, E Soergel; University of Bonn, Germany

11:15 AM 15Local Potential Imaging of a Multilayer Ceramic Capacitor Using Kelvin Probe Force Microscopy; T Komatsubara, S Higuchi, K Nishikata; HORIBA; N Satoh, K Kobayashi, H Yamada; Kyoto University

11:30 AM 16Dynamic Studies of Nanoscale Thermal and Mechanical Property Development of Automotive Refinish Clearcoats; L Germinario, D Bhattacharya; Eastman Chemical Company; A Forster; National Institute of Standards and Technology

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Session Chairs: LA Giannuzzi, FEI Company; B Gorman, University of North Texas; M Uchic, Wright-Patterson Air Force Base

Platform Session: Monday 8:30 AM, Room: Galisteo

8:30 AM 17 (Invited) FIB Milling of Frozen-hydrated Cells and Tissue for TEM Cryo-Tomography; M Marko, C Hsieh; Wadsworth Center; N Salmon; Hummingbird Scientific; M Rodriguez; University at Albany; J Frank; Howard Hughes Medical Institute; C Mannella; Wadsworth Center

9:00 AM 18DualBeam Electron Microscopy for Targeted Whole Cell Architecture; BM Humbel, DAM De Winter, CTWM Schneijdenberg; University Utrecht, The Netherlands; B Lich; FEI Company, The Netherlands; AJ Verkleij; University Utrecht, The Netherlands

9:15 AM 19Towards Multi-scale 3D Biological Imaging: The Role of Dual-beam Serial Sectioning; C Gilpin; University of Texas Southwestern Medical Center

9:30 AM 20 (Invited) 3D Imaging of Diatoms with Ion Abrasion Scanning Electron Microscopy; M Hildebrand; Scripps Institute of Oceanography; S Kim, D Shi, S Subramaniam; National Cancer Institute

10:00 AM Coffee Break

10:30 AM 21Direct Three-Dimensional Microstructural Characterization and Reconstruction Across Varying Length Scales in a/b Titanium Alloys by Serial Sectioning Using a FEI DualBeam™ (FIB/SEM) and Robo-Met.3D; REA Williams, V Dixit, P Collins, HL Fraser; The Ohio State University

10:45 AM 22 (Invited) Low Energy Ga+ and Ar+ Ion Milling for Improved EBSD Sample Preparation; JR Michael, PG Kotula; Sandia National Laboratories

11:15 AM 23 (Invited) Measuring the Five Parameter Grain Boundary Character Distribution From Three-Dimensional Orientation Maps; S Dillon, S Lee, R Anthony, R Gregory; Carnegie Mellon University

11:45 AM 24A 3D Analysis of the Nugget Zone of AA5052 Processed via Friction Stir Processing; M Adams-Hughes, PN Kalu; Florida A&M University-Florida State University; EL Principe; Carl Zeiss SMT Inc; S Wright; EDAX-TSL

Problem Solving Using Microanalytical Techniques

Session Chairs: PK Carpenter, Washington University; DT Kremser, Battelle Memorial Institute

Platform Session: Monday 8:00 AM, Room: Cimarron

8:00 AM 25 (Invited) Using the Microscopy Lab As A Clearinghouse For Problem Solving In An Industrial Service Laboratory; V Woodward; Lubrizol Advanced Materials

8:30 AM 26 (Invited) Multi-Technique Approach to Understanding Phase Transformations in a Precious Metal Alloy; DF Susan, JR Michael, JT Bond, RG Stone; Sandia National Laboratories; JM Rodelas; Missouri University of Science and Technology

9:00 AM 27 (Invited) What Do We Know About Fundamental Parameters for Microanalysis?; DC Joy; University of Tennessee

9:30 AM 28 (Invited) Problem Solving in Electron-probe Microanalysis: Application of Software Tools; PK Carpenter; Washington University

10:00 AM Coffee Break

10:30 AM 29 (Invited) Specimen Heterogeneity Analysis Revisited; F Meisenkothen; UES Inc; JJ Donovan; University of Oregon

11:00 AM 30Milli-X-ray Fluorescence X-Ray Spectrum Imaging: Problem Solving Through Mapping on the Centimeter Scale; JM Davis, DE Newbury; National Institute of Standards and Technology

11:15 AM 31Meeting Microanalysis Challenges Using a Flexible X-ray Fluorescence Microscope; Y Yokota, S Ohzawa, D Matsunaga, Y Sato, S Komatani; Horiba Japan; A Whitley; Horiba Jobin Yvon

11:30 AM 32Confocal Micro X-ray Fluorescence A New Paradigm in 3D Elemental Imaging for Materials Characterization; BM Patterson, GJ Havrilla; Los Alamos National Laboratory

11:45 AM 33Characterization of the Interfacial Regions of Copper-Carbon Steel Explosive Welds Using a Combination of Analytical Techniques; JP Chandler, A Manerbino, S Liu, M Kaufman; Colorado School of Mines

Atom-Probe Analysis of Non-traditional Materials

Session Chairs: O Nishikawa, Kanazawa Institute of Technology, Japan; JA Panitz, High-Field Consultants

Platform Session: Monday 8:30 AM, Room: Dona Ana

8:30 AM 34 (Invited) Microfabricated Field Emitter Arrays for Electron and Ion Emission; CC Spindt; SRI International

9:00 AM 35Towards Quantitative Analysis of Nitrogen in Microelectronics Applications for Atom Probe Tomography; RM Ulfig, T Prosa, D Reinhard, E Oltman, R Alvis; Imago Scientific Instruments Corporation

9:15 AM 363D Atom Probe and SIMS as Complementary Techniques for the Observation and Quantitative Measurement of Mmicrostructures; L Renaud, I Martin, F Hillion, F Horreard; CAMECA, France; YS Yang, JS Tang, CG Park; Pohang University of Science and Technology, Korea

9:30 AM 37 (Invited) Imaging Atom-Probe Studies of a Field Evaporation Based Deuterium Ion Source for Neutron Generators; PR Schwoebel, B Reichenbach, I Solano; University of New Mexico

10:00 AM Coffee Break

10:30 AM 38 (Invited) Observations of Cluster Ions Originating from Non-Traditional Atom Probe Materials; T Prosa, R Alvis, TF Kelly; Imago Scientific Instruments

11:00 AM 39Investigation of Performance-Influencing Factors in Pulsed Laser Atom Probe; J Bunton, J Olson, D Lenz, TF Kelly; Imago Scientific Instruments

11:15 AM 40Characterization of Precipitation Behavior in a Spray-Formed Al-Zn-Mg Alloy Using a Combination of Transmission Electron Microscopy and Three Dimensional Atom Probe Tomography; J Hwang, R Banerjee; University of North Texas; M Kaufman; Colorado School of Mines

11:30 AM 41LA-WATAP and SIMS as Complementary Techniques for Quantitative Measurement of Nnanometer Structures; L Renaud, I Martin, A Merkulov, P Peres, R Benbalagh, M Schuhmacher; CAMECA, France

Analytical Electron Microscopy: Advanced Techniques and Applications for Nanoscience

Session Chairs: PA Crozier, Arizona State University; M Watanabe, Lawrence Berkeley National Laboratory

Platform Session: Monday 8:30 AM, Room: Brazos

8:30 AM 42 (Invited) Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy; DA Muller, LF Kourkoutis; Cornell University; M Murfitt; Nion Company; JH Song; Chungnam National University, Korea; HY Hwang; University of Tokyo, Japan; J Silcox; Cornell University; N Dellby, OL Krivanek; Nion Company

9:00 AM 43 (Invited) Analytical High-Resolution Studies of Transparent Conductive Oxides and their Interfaces with Active Si Regions for Photovoltaic Applications; Q Ramasse; Lawrence Berkeley National Laboratory; A Anapolsky, C Lazik, M Jin; Applied Materials Inc; AP Kuprin; University of California Davis; TC Kaspar, SA Chambers; Pacific Northwest National Laboratory; ND Browning; University of California Davis

9:30 AM 44Investigation of the Hexagonal Perovskite Ba ₃Ti ₂RuO ₉using High Resolution STEM and High Resolution EELS; C Maunders; McMaster University, Canada; G Radtke; Laboratoire TECSEN CNRS, France; M Robertson; Acadia University, Canada; S Lazar; McMaster University, Canada; HJ Whitfield, J Etheridge; Monash University, Australia; GA Botton; McMaster University, Canada

9:45 AM 45Spatial Resolution and Delocalization of the EELS Core-Loss Fine Structure; R Egerton; University of Alberta, Canada; F Wang, M Malac; National Institute for Nanotechnology, Canada

10:00 AM Coffee Break

10:30 AM 46 (Invited) Oxide Interfaces Under the Electron Microscope; M Varela, HM Christen, HN Lee, L Petit, T Schulthess, SJ Pennycook, W Luo, ST Pantelides; Oak Ridge National Laboratory; J Garcia-Barriocanal, C Leon, J Santamaria; Universidad Complutense de Madrid, Spain

11:00 AM 47Atomic Structure of Core-Shell Precipitates in Al-Li-Sc-Zr Alloys Studied by Analytical and Aberration-Corrected TEM/STEM; MD Rossell, R Erni; Lawrence Berkeley National Laboratory; A Tolley; CNEA CONICET, Argentina; EA Marquis; Oxford University, United Kingdom; V Radmilovic, U Dahmen; Lawrence Berkeley National Laboratory

11:15 AM 48Structural Characterization of WO ₃/ZrO ₂Catalysts using HAADF Imaging; W Zhou, E Ross-Medgaarden, IE Wachs, CJ Kiely; Lehigh University

11:30 AM 49 (MAS Distinguished Scholar) Quantitative HAADF-STEM and EELS; JM LeBeau; University of California Santa Barbara; SD Findlay; The University of Tokyo, Japan; LJ Allen; University of Melbourne, Australia; S Stemmer; University of California Santa Barbara

11:45 AM 50EELS Imaging of Oxygen Vacancy Ordering; J Gazquez, M Varela, MP Oxley; Oak Ridge National Laboratory; MA Torija, M Sharma, C Leighton; University of Minnesota; SJ Pennycook; Oak Ridge National Laboratory

Imaging in Stem Cell Biology

Session Chair: H Schatten, University of Missouri

Platform Session: Monday 8:30 AM, Room: Taos

8:30 AM 51An Overview of Stem Cell Research in the Mouse and Other Mammalian Species; H Schatten; University of Missouri-Columbia

8:45 AM 52The Histo-morphometric Relationship between Bone, Blood Vessels and Hemopoietic Stem Cells; S Ellis; Peter MacCallum Cancer Centre; J Grassinger, B Williams; Australian Stem Cell Centre; S Asquith; Peter MacCallum Cancer Centre; G Haines, D Haylock, I Bertoncello, S Nilsson; Australian Stem Cell Centre

9:00 AM 53 (Invited) Beauty is Skin Deep: Imaging and Characterization of Skin Stem Cells; HA Pasolli, V Horsley, T Tumbar, C Blanpain, W Lowry, V Greco, E Fuchs; The Rockefeller University

9:30 AM 54 (Invited) A Tubular Scaffold that Modulates Differentiation of Rat Bone Marrow Stem Cells; J Potts, M Yost, G Kaur, Q Wang, T Valarmathi; University of South Carolina

10:00 AM Coffee Break

10:30 AM 55 (Invited) Towards the Understanding of Epigenetic Mechanisms Regulating Neural Stem Cells; X Zhao; University of New Mexico School of Medicine

11:00 AM 56 (Invited) Application of Multiphoton and Fluorescence Lifetime Microscopy of Endogenous Fluorescence to the Study of Differentiation in Mouse Embryonic Stem Cells; J Squirrell, K Eliceiri, T Kamp, G Lyons; University of Wisconsin-Madison

11:30 AM 57 (Invited) Ovarian Stem Cells and Mammalian Neo-Oogenesis; A Bukovsky; University of Tennessee College of Medicine

Improving “Green” Products through Imaging: Biomass, Biofuels and Bioproducts

Session Chairs: DF Wood, US Department of Agriculture; TG Williams, US Department of Agriculture

Platform Session: Monday 8:30 AM, Room: Mesilla

8:30 AM 58 (Invited) Grassoline in Your Tank: Myths and Realities about Biofuels; BE Dale; Michigan State University

9:00 AM 59 (Invited) Visible Histological and Infrared Microscopic Assessment of Grass Biomass; DS Himmelsbach; US Department of Agriculture; DE Akin; Light Light Solutions; LL Rigsby; US Department of Agriculture

9:30 AM 60 (Invited) The Plant Extracellular Matrix; MC McCann, B Penning, A Olek, NC Carpita; Purdue University

10:00 AM Coffee Break

10:30 AM 61 (Invited) Switchgrass for Biofuels: Insights through Microscopy; G Sarath; US Department of Agriculture; L Baird; University of San Diego; G Hou; Appalachian State University; R Mitchell, K Vogel; US Department of Agriculture

11:00 AM 62 (Invited) Electron Tomography and SEM Analysis of Lignin Coalescence in Biomass Cell Walls Following Thermochemical Pretreatment; B Donohoe, T Vinzant, S Decker, D Johnson, M Himmel; National Renewable Energy Laboratory

11:30 AM 63 (Invited) Utilization of Atomic Force Microscopy, Confocal Microscopy, and Electron Microscopy to Evaluate Biomass Pretreatment; B Simmons, D Dibble, S Singh; Sandia National Laboratories; M Auer, D Jorgens; Lawrence Berkeley National Laboratory; J-L Faulon; Sandia National Laboratories

Understanding the Synthesis and Properties of Nanostructures and Nanomaterials: Catalysis

Session Chairs: PM Voyles, University of Wisconsin; A Borisevich, Oak Ridge National Laboratory

Platform Session: Monday 8:30 AM, Room: Ruidoso

8:30 AM 64 (Invited) 3D Scanning Transmission Electron Microscopy for Catalysts: Imaging and Data Analysis; AY Borisevich, AR Lupini; Oak Ridge National Laboratory; AF Koschan, M Mercimek, MA Abidi; University of Tennessee, Knoxville; SJ Pennycook; Oak Ridge National Laboratory

9:00 AM 65Cs-corrected STEM Studies of Ge Nanodots Grown on Slightly Oxidized Si(001) Surfaces; N Tanaka, S-P Cho, AA Shklyaev; Japan Science and Technology Agency; J Yamasaki; Nagoya University, Japan; E Okunishi; JEOL Ltd; M Ichikawa; Japan Science and Technology Agency

9:15 AM 66 (MAS Distinguished Scholar) Using Aberration-corrected STEM Imaging to Explore Chemical and Structural Variations in the M1 Phase of the MoVNbTeO Oxidation Catalyst; WD Pyrz; University of Delaware; DA Blom; University of South Carolina; VV Guliants; University of Cincinnati; T Vogt; University of South Carolina; DJ Buttrey; University of Delaware

9:30 AM 67Direct Observation of Au Nanoislands on TiO ₂(110) Surface by HAADF STEM; N Shibata, A Goto; University of Tokyo, Japan; K Matsunaga; Kyoto University, Japan; T Mizoguchi, SD Findlay, T Yamamoto, Y Ikuhara; University of Tokyo, Japan

9:45 AM 68Precise Measurement of the Metal Nanocluster Size in a Supported Catalyst: Ta/SiO ₂; S Mehraeen, J Sun; University of California, Davis; B Reed; Lawrence Livermore National Laboratory; N Okamoto, A Kulkarni, B Gates; University of California, Davis; ND Browning; Lawrence Livermore National Laboratory

10:00 AM Coffee Break

10:30 AM 69Oxide Support Modification during Pd Particle Aging at Elevated Temperatures; RS Goeke, AK Datye; University of New Mexico

10:45 AM 70Imaging of Gold Nanoparticles within Mesoporous Silica Supports; JP Gabaldon, M Bore, A Datye; University of New Mexico

11:00 AM 71Methods for Location of Palladium Catalyst Nanoparticles in Mesoporous Silicates; H Qian, P Li, M Malac; National Institute for Nanotechnology, Canada; H Yang, S Mutyala; National Centre for Upgrading Technology, Canada; H Furukawa; JEOL Systems Technology Co Ltd, Japan; M Kawasaki; JEOL USA, Inc

11:15 AM 72Support Effects on Adatom Emission from Nanoparticles; L Houk, A DeLaRiva; University of New Mexico; R Goeke; Sandia National Labs; P Fanson; Toyota Motor Engineering & Manufacturing; A Datye; University of New Mexico

11:30 AM 73Size-dependent Crystallinity and Relative Orientations of Nano-Pt/r-Al ₂O ₃; L Li; University of Pittsburgh; J Kang, S Sanchez; University of Illinois, Urbana-Champaign; Q Wang; Yeshiva University; L-L Wang; University of Illinois, Urbana-Champaign; Z Zhang; University of Pittsburgh; D Johnson; University of Illinois, Urbana-Champaign; AI Frenkel; Yeshiva University; R Nuzzo; University of Illinois, Urbana-Champaign; J Yang; University of Pittsburgh

11:45 AM 74Microstructural Characterization of Colloid-Derived Bimetallic Pd-Cu Nanocatalysts Supported on γ-Al ₂O ₃for Nitrate Reduction; Z Liu; University of Pittsburgh; KA Guy, JR Shapley, CJ Werth; University of Illinois, Urbana-Champaign; Q Wang, AI Frenkel; Yeshiva University; JC Yang; University of Pittsburgh

Surface Microscopy and Microanalysis in Materials and Biological Systems

Session Chairs: JA Ohlhausen, Sandia National Laboratories; J Fulghum, University of New Mexico; VS Smentkowski, General Electric Global Research

Platform Session: Monday 8:00 AM, Room: Aztec

8:00 AM 75 (Invited) Characterizing Nanomaterials by Combining Electron Microscopy and Surface Analysis; D Gaspar, D Baer, Z Zhu, B Arey, C Wang, M Warner, A Miracle; Pacific Northwest National Laboratory

8:30 AM 76Single Flat Gold Nanoparticle Microscopy and Spectroscopy; WD Tennyson, CE Allen, DR Freno, DH Dahanayaka, LA Bumm; The University of Oklahoma

8:45 AM 77 (Invited) Molecular Depth Profiling to 3D Molecular Imaging with XPS and TOF-SIMS; JS Hammond, GL Fisher, S Raman, JF Moulder; Physical Electronics

9:15 AM 78Analysis of Multi-Component Polymer Blends with the Confocal Raman AFM; U Schmidt, J Mueller, K Weishaupt, O Hollricher; WITec GmbH, Germany

9:30 AM 79 (Invited) Surface Microscopy and Microanalysis in the Medical Device Industry; A Belu; Medtronic, Inc

10:00 AM Coffee Break

10:30 AM 80 (Invited) New Approaches in Accelerating Material Development Through Structure-to-Property Relationships built from XPS and Microscopic Data; K Artyushkova, A Plamen, F Julia; University of New Mexico

11:00 AM 81 (MAS Distinguished Scholar) Correlative Microscopic and Spectroscopic Characterization of Carboxylated Single-Walled Carbon Nanotubes; P Bajaj; University of Texas Dallas; K Artyushkova; University of New Mexico; I Musselman; University of Texas Dallas

11:15 AM 82 (Invited) Probing Polymeric Interfaces with Synchrotron Techniques; J Lenhart; Sandia National Laboratories; D Fischer; National Institute of Standards and Technology

Metallographic Techniques and Material Characterization

Session Chairs: R Noecker, ExxonMobil; N Saenz, Pacific Northwest National Laboratory

Platform Session: Monday 8:15 AM, Room: Pecos

8:15 AM 83 (Invited) Examination of Sectioning Damage by EBSD; G Lucas, G Vander Voort, G Choczaj; Buehler Ltd

8:45 AM 84 (Invited) Delineation and Measurement of Grain Size by EBSD; G Vander Voort; Buehler Ltd; M Nowell; EDAX-TSL; E Manilova; Pulzunov Central Boiler and Turbine Institute

9:15 AM 85SEM and EBSD Investigations of High-Chromium Cast Irons; B Hinckley, K Dolman; Weir Minerals Australia Ltd, Australia; R Wuhrer, A Ray, W Yeung; University of Technology Sydney, Australia

9:30 AM 86 (Invited) Orientation Imaging Microscopy of Stray Grain Formation in Single Crystal Weld Structures; T Anderson, J DuPont; Lehigh University; T DebRoy; Pennsylvania State University

10:00 AM Coffee Break

10:30 AM 87 (Invited) In Situ EBSD of Microstructure Evolution During Deformation; R Mishra, R Kubic; General Motors

Physical Tutorial: Lorentz Microscopy: A Versatile Technique for Studying Magnetic Multilayers, Elements and Nanowires

Session Chair: G Thompson, University of Alabama

Platform Session: Monday 10:30 AM, Room: La Cienega

10:30 AM 342 (Invited) Lorentz Microscopy: A Versatile Technique for Studying Magnetic Multilayers, Elements and Nanowires; JN Chapman; University of Glasgow

Microscopy and Analysis of Soft Matter: From the Molecules Up

Session Chairs: DJ Stokes, FEI Company, The Netherlands; RD Leapman, National Institutes of Health

Platform Session: Monday 1:00 PM, Room: Picuris

1:00 PM 89 (Invited) WetSEM: Cell Surface Characteristics as Reporters for Cellular Energy State; H Pluk, H Croes; Radboud University Nijmegen Medical Centre, The Netherlands; B Lich; FEI Company, The Netherlands; B Wieringa, J Fransen; Radboud University Nijmegen Medical Centre, The Netherlands

1:30 PM 90 (Invited) Electron Microscopy through Thin Film Windows of Cell Cultures and Liquid Processes in Microfluidic Chips; K Mølhave; Technical University of Denmark, Denmark

2:00 PM 91Evaluation of STEM-in-SEM vs. TEM for Polymer Applications in an Industrial Setting; O Guise, C Strom; SABIC Innovative Plastics; N Preschilla; Reliance Industries Limited

2:15 PM 92Life-Like Physical Fixation of Large Samples for Correlative Microscopy; K Rensing; Bal-Tec AG, Balzers, Liechtenstein; M Wölfel, MS Droste; Electron Microscopy ETH Zurich, Zurich, Switzerland; F Lucas; Bal-Tec AG, Balzers, Liechtenstein; R Wepf; Electron Microscopy ETH Zurich, Zurich, Switzerland

2:30 PM 93 (Invited) ESEM, STEM-in-ESEM and 200 kV STEM Imaging of Soft Matter and Liquid-State Specimens; N De Jonge; Oak Ridge National Lab; DJ Stokes; FEI Company, The Netherlands

Imaging, Fluorescence and Flow Cytometry

Session Chairs: JP Robinson, Purdue University; RW Smith, Portland State University

Platform Session: Monday 1:30 PM, Room: Taos

1:30 PM 94 (Invited) Confocal Microscopy and Flow Cytometry System Performance: Assessment of QA Parameters that Effect Data Quantification; RM Zucker, J Rogers, R Ellis-Hutchings; USEPA

2:00 PM 95 (Invited) Development of a Versatile Apertureless Near-field Microscope for Biological and Material Applications; E Sánchez, D Nowak, J Hiester, A Lawrence, D Vedhachalam; Portland State University; Z Dzegede; Cornell University; J Abramson; Portland State University

2:30 PM 96Microscopy Study of Interactions of Carbon Nanotubes with Astrocytoma Cells; L Dong, MM Greenwade, MJ Timson, CM Witkowski, MM Craig; Missouri State University

2:45 PM 97Pico-second Fluorescence Lifetime Microscope System in the Deep UV-Visible (240nm–850nm) using both Time- and Frequency-Domain Time-Resolved Techniques; L Chandler; Horiba Jobin Yvon

3:00 PM 98Perspectives on Cellular Analysis: Linking Quantitation to Structure and Function by Instrumental Methods and Analysis; RW Smith; Portland State University; JP Robinson; Purdue University; RM Zucker; U S Environmental Protection Agency; C Geddes; University of Maryland; A Kachelmeier; University of Portland; G McConnell; University of Strathclyde, United Kingdom; C Merrifield; MRC Laboratory of Molecular Biology, United Kingdom; R Murphy; Carnegie Mellon University; J Nolan; La Jolla Bioengineering Institute; J Price; Burnham Institute for Medical Research; R Price; University of South Carolina; P Peter Rabinovitch; University of Washington; E Sánchez; Portland State University; L Sklar; University of New Mexico; PTC So; Massachusetts Institute of Technology; D Sudar; Lawrence Berkeley National Laboratory

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Session Chairs: NWM Ritchie, National Institute of Standards and Technology; LN Brewer, Sandia National Laboratories

Platform Session: Monday 1:30 PM, Room: Aztec

1:30 PM 99 (Invited) Quantitative Analyses of Early Stages of Phase Transformation by Atom Probe Tomography; EA Marquis; University of Oxford, United Kingdom

2:00 PM 100 (Invited) Atomistic Studies of Line Defects at Grain Boundaries; DL Medlin, D Cohen; Sandia National Laboratories; RC Pond; University of Liverpool, United Kingdom; JC Hamilton, O Uche; Sandia National Laboratories

2:30 PM 101HAADF Imaging and Ab Initio Analysis of GPBII Zones in Al-Cu-Mg Alloys; L Kovarik, M Mills; The Ohio State University

2:45 PM 102 (Invited) Microstructure-Property Relationships Based on 3D Images of Polycrystals; A Rollett, S Lee, G Rohrer; Carnegie Mellon University

3:15 PM 103On the Evolution of Friction-Induced Microstructures in Single Crystal Nickel; SV Prasad, JR Michael, CC Battaile; Sandia National Laboratories, Albuquerque; BS Majumdar; New Mexico Institute of Mining and Technology

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Session Chairs: LA Giannuzzi, FEI Company; B Gorman, University of North Texas; M Uchic, Wright-Patterson Air Force Base

Platform Session: Monday 1:30 PM, Room: Galisteo

1:30 PM 104 (Invited) Detecting Nanoparticles in Cells Using FIB-EDS; K Scott, RD Holbrook; National Institute of Standards and Technology

2:00 PM 1053D Energy-Dispersive X-ray Spectrometry (3D EDXS) in a DualBeam FIB: Aspects of Sample Preparation and Quantitative Analysis; M Schaffer, H Schröttner, J Wagner; Graz University of Technology, Austria

2:15 PM 106Reconstruction of d-phase in Superalloy by 3D EDXS in a DualBeam FIB; J Wagner, M Schaffer, H Schröttner, S Mitsche, I Letofsky-Papst; Graz University of Technology, Austria; C Stotter, C Sommitsch; University of Leoben, Austria

2:30 PM 107 (Invited) Large Area Patterning Using Ion-beam Lithography; LE Ocola, A Imre; Argonne National Laboratory

3:00 PM 108FIB Fabrication of Metallic Nanostructures on End-faces of Cleaved Optical Fibers for Chemical Sensing Applications; PE Russell; Appalachian State University; A Dhawan; U S Army Research Office; J Gleeson; Appalachian State University

3:15 PM 109Development of Novel Thin Film Deposition Methods in a CrossBeam® FIB-SEM Platform Using an OmniGISTM; EL Principe; Carl Zeiss SMT Inc; C Hartfield; OmniProbe; R Kruger; Carl Zeiss SMT Inc; A Smith; OmniProbe

Problem Solving Using Microanalytical Techniques

Session Chairs: DT Kremser, Battelle Memorial Institute; PK Carpenter, Washington University

Platform Session: Monday 1:30 PM, Room: Cimarron

1:30 PM 110 (Invited) SIMS Analysis of Xe and Kr in a High Burn-up UO ₂Nuclear Fuel; CT Walker, S Bremier, S Portier, R Hasnaoui; Institute for Transuranium Elements, Germany

2:00 PM 111Analysis of Pu by Virtual-standard WDS-EPMA. Results of an Interlaboratory Round-robin Test; C Merlet; Université de Montpellier II, France; X Llovet; Universitat de Barcelona, Spain; L Aufore; CEA Cadarache, France; S Bremier; Institute for Transuranium Elements, Germany; X Deschanels, O Dugne; CEA Marcoule, France; J Lamontagne; CEA Cadarache, France; R Restani; Paul Scherrer Institut, Switzerland; C Roche, M Tribet; CEA Marcoule, France; W Van Renterghem; SCK CEN, Belgium

2:15 PM 112Evaluation of the Significance of Secondary Fluorescence of Aluminum in a Coated Nickel Superalloy; GW Kagel, J Foroughi; The M&P Lab

2:30 PM 113X-ray Nano-analysis of Sub-100nm Particles Using EDS in Conjunction with SEM; S Burgess, J Holland, C Collins, S Sharp; Oxford Instruments NanoAnalysis, United Kingdom

2:45 PM 114On the Precision of EDS Analysis with Sample Tilted at 70°; P T.-Pinard; McGill University; P Hovington; Hydro-Quebec Research Institute; H Demers; McGill University; M Lagace; Hydro-Quebec Research Institute; R Gauvin; McGill University

3:00 PM 115X-Ray Mapping of Rough Surfaces with Multiple Silicon Drift Detectors; R Anderhalt, D Redfern, A Sandborg; EDAX

3:15 PM 116Practical Analysis of Micron-scale Boride and Carbide Inclusions Using an Analytical SDD Detector; C Collins, S Burgess; Oxford Instruments Nanoanalysis, United Kingdom; F Bauer; Oxford Instruments GmbH, Germany; J Holland; Oxford Instruments Nanoanalysis, United Kingdom

Atom-Probe Analysis of Non-traditional Materials

Session Chairs: TF Kelly, Imago Scientific Instruments; P Schwoebel, University of New Mexico

Platform Session: Monday 1:30 PM, Room: Dona Ana

1:30 PM 117 (Invited) Cryopreparation for Interfacial Atom-Probe Analysis; JA Panitz; High-Field Consultants, Inc

2:00 PM 118 (Invited) A New Approach for the Mass Analysis of Biomolecules at Atomic Level Utilizing the Scanning Atom Probe; O Nishikawa, M Taniguchi; Kanazawa Institute of Technology, Japan

2:30 PM 119 (MSA PTSA Award) Site Specific Atom Probe Analysis from Ceramic, Geologic and Bio-Materials; R Martens, G Thompson, M Bersch; University of Alabama; M Forseth; MDForseth Consulting; R Knutson; Complete Family Dentistry

2:45 PM 120Advantages of Using a Digital Detector for Field Ion Microscopy; RM Ulfig, DJ Larson, S Gerstl; Imago Scientific Instruments

3:00 PM 121 (Invited) Discovery of 250 Ma Cellulose Fibers in a Deep Permian Halite Layer Poses Unique Challenges in TEM Imaging and Analysis; J Griffith, S Willcox; University of North Carolina; DW Powers; University of Mississippi; R Nelson; U S Department of Energy Carlsbad; BK Baxter; Westminster College

Analytical Electron Microscopy: Advanced Techniques and Applications for Nanoscience

Session Chairs: Y Ito, Northern Illinois University; W Sigle, Max-Planck-Institut für Metallforschung, Germany

Platform Session: Monday 1:30 PM, Room: Brazos

1:30 PM 122 (Invited) Application of Monochromated Electrons in EELS; W Sigle, L Gu, C Koch, V Srot, J Nelayah, PA Van Aken; Max Planck Institute for Metals Research, Germany

2:00 PM 123High Energy-Resolution EELS Studies on Electronic Excitations of LaB ₆and Cs _0.33WO ₃Particles by using a Monochromator Transmission Microscope; Y Sato, M Terauchi, M Tanaka; Tohoku University, Japan; M Mukai, T Kaneyama; JEOL Ltd; K Adachi; Sumitomo Metal Mining Co, Ltd; T Asahi; Osaka University

2:15 PM 124Exciting Far-Ultraviolet Whispering Gallery Modes with High Energy Electrons; JK Hyun, M Couillard, PP Rajendran, C Liddell, DA Muller; Cornell University

2:30 PM 125Characterisation of the Optical Response of some Anisotropic Ternary MAX Compounds; N Haddad, G Hug; ONERA-CNRS, France; E Garcia-Caurel; Ecole Polytechnique, France; L Hultman; IFM Linköping University, Sweden; MW Barsoum; Drexel University

2:45 PM 126Plasmon Resonance Chemical Phase Mapping of Reactive Multilayers; MA Mat Yajid; University of Sheffield, United Kingdom; T Wagner; Max-Planck-Institut fur Metallforschung, Germany; G Moebus; University of Sheffield, United Kingdom

3:00 PM 127 (MAS Distinguished Scholar) Investigation of the Atomic Structures of Si ₃N ₄/CeO _2−dInterfaces using Atomic Resolution Z-contrast Imaging and EELS Combined with First-Principles Methods; W Walkosz, RF Klie, S Ogut; University of Illinois Chicago; AY Borisevich, P Becher, SJ Pennycook, JC Idrobo; Oak Ridge National Laboratory

3:15 PM 128Magnetic Linear Dichroism Probed by High Momentum Resolution EELS; Y Ito; Northern Illinois University; NJ Zaluzec, AN Chiaramonti, RE Cook; Argonne National Laboratory; M Van Veenendaal; Northern Illinois University; DJ Miller; Argonne National Laboratory

Improving “Green” Products through Imaging: Biomass, Biofuels and Bioproducts

Session Chairs: TG Williams, US Department of Agriculture; DF Wood, US Department of Agriculture

Platform Session: Monday 1:30 PM, Room: Mesilla

1:30 PM 129 (Invited) Identify Molecular Structural Features of Biomass Recalcitrance Using Nondestructive Microscopy and Spectroscopy; S-Y Ding, M Himmel; National Renewable Energy Laboratory; SX Xie; Harvard University

2:00 PM 130 (MSA Presidential Student) In Vitro Assembly of the Arabidopsis thaliana Plastid Division Proteins FtsZ1 and FtsZ2; AG Smith, CB Johnson, S Vitha, A Holzenburg; Texas A&M University

2:15 PM 131 (Invited) Electron Microscopy as a Valuable Tool in Designing Biobased Products; SH Imam, GM Glenn, WJ Orts, DF Wood, T Williams; U S Department of Agriculture; F Azam; NIFA Tarnab, Pakistan

2:45 PM 132 (Invited) Structure of Porous Starch Microcellular Foam Particles; GM Glenn, SH Imam, AP Klamczynski, B-S Chiou, DF Wood, WJ Orts; U S Department of Agriculture

3:15 PM 133Fine Structure of Starch-Clay Composites as Biopolymers; DF Wood, B-S Chiou, GM Glenn, DF Hoffmann, TG Williams, E Yee, SH Imam, WJ Orts; U S Department of Agriculture

Visualizing Biological Nanomachines

Session Chairs: A Steven, National Institutes of Health; M Morais, University of Texas Medical Branch

Platform Session: Monday 1:30 PM, Room: San Miguel

1:30 PM 134 (Invited) Flexibility, Heterogeneity and Resolution in Single Particle Reconstruction; S Ludtke; Baylor College of Medicine

2:00 PM 135 (Invited) Multiple Approaches for Mapping EM Structures of Protein Complexes; H Li, C Tang, H Li; Brookhaven National Laboratory

2:30 PM 136Proteomic Survey of Large Macromolecular Complexes in D. vulgaris; B-G Han, D Typke, RM Glaeser; Lawrence Berkeley National Laboratory

2:45 PM 137 (Invited) Structural Analysis of Dynamin Family Members Provide Insight into Membrane Fission; J Hinshaw, JA Mears, P Ray, S Fang; National Institutes of Health

3:15 PM 138Functional Architecture of the Retromer Cargo-Recognition Complex; G Effantin, A Hierro, AL Rojas, R Rojas, N Murthy; National Institutes of Health; AV Kajava; University of Montpellier, France; JS Bonifacino, JH Hurley, AC Steven; National Institutes of Health

Understanding the Synthesis and Properties of Nanostructures and Nanomaterials: Structure-Property Relationships

Session Chairs: R. Sharma, Arizona State University; JM Zuo, University of Illinois

Platform Session: Monday 1:30 PM, Room: Ruidoso

1:30 PM 139 (Invited) Electron Microscopy of Nanodevices: In Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes; JM Zuo, T Kim; University of Illinois, Urbana-Champaign; Q Chen, LM Peng; Peking University, P R China; EA Olson; University of Illinois, Urbana-Champaign

2:00 PM 140Scanning Transmission X-ray Microscopy of Individual Multi-Walled Carbon Nanotubes: Linear Dichroism and Functionalization Chemistry; AP Hitchcock, E Najafi, M Obst; McMaster University, Canada; J-J Pireaux; University of Namur, Canada; B Douhard, A Felten; University of Namur, Belgium

2:15 PM 141Imaging of Magnetite Nanoparticle Ferrofluid Under the Influence of Magnetic Field by Cryo-TEM; JS Wu, M Aslam, VP Dravid; Northwestern University

2:30 PM 142 (Invited) Measuring and Quantitatively Analyzing the Electrical Characteristics of Individual Semiconducting Nanowires in an Nanowire Array; L-M Peng, Y Liu, S Wang, ZY Zhang; Peking University, China; Q Li; Chinese University of Hong Kong, Hong Kong

3:00 PM 143Diameter-Dependent Microstructure, Electronic Structure and Transport Properties of Bi Nanowires; Q Zhang, M Tian, J Wang, M Chan, T Mallouk; The Pennsylvania State University

Metallographic Techniques and Material Characterization

Session Chairs: N Saenz, Pacific Northwest National Laboratory; R Noecker, ExxonMobil

Platform Session: Monday 1:30 PM, Room: Pecos

1:30 PM 144 (Invited) The Role of Microscopy in the NIST World Trade Center Investigation; S Banovic; National Institute of Standards and Technology

2:00 PM 145Metallographic Analysis of Aluminum Alloy AA 6061 for Quality Control and Process Verification; Z Wang, B Fabbi; Dynetek Industries Ltd, Canada

2:15 PM 146 (Invited) Challenges in Preparing Aluminum Alloys for Grain Boundary Characterization; KA Unocic, MJ Mills, GS Daehn; The Ohio State University

2:45 PM 147Characterization of Metallurgical Effects in Laser-Drilling of Superalloys; JKM Garofano, HL Marcus, M Aindow; University of Connecticut

3:00 PM 148Dynamic Tensile Extrusion Response of Tantalum; F Cao, E Cerreta, C Trujillo, G Gray; Los Alamos National Laboratory

Biological Tutorial: Live Cell Imaging Limitations

Session Chair: A Dohnalkova, Pacific Northwest National Laboratory

Platform Session: Monday 2:00 PM, Room: La Cienega

2:00 PM 149 (Invited) Live Cell Imaging: Building the Perfect System for the Core Imaging Facility; SC Watkins; University of Pittsburgh

Microscopy and Analysis of Soft Matter: From the Molecules Up

Poster Session: Monday 3:30 PM, Room: Exhibit Hall

3:30 PM 150Characterization of Closed-Cell Foam Skin Thickness by Backscatter Electron Imaging in an SEM; CS Todd; The Dow Chemical Company—Poster # 1

3:30 PM 151Use of X-ray Micro Computed Tomography in the Evaluation of Bread Crumb Structure; AD Lape, S Jensen, VL St. Jeor, CA Lendon; Cargill Incorporated—Poster # 2

3:30 PM 152Quantum Dots—Utilization in TEM; J King, S Agarwal, E Syklawer, N Prasain, H Chen, J Resmondo, F McDonald, N Bauer, D Alvarez, S Wu, T Stevens, L Shevde, T Moore, M Townsley; University of South Alabama—Poster # 3

3:30 PM 153Two Methods of Conductive Coating for Scanning Electron Microscopy of Maize Weevils Sitophilus zeamais Compared by Energy Dispersive Spectroscopy; MW Pendleton, EA Ellis; Texas A&M University; BB Pendleton; West Texas A&M University; A Holzenburg; Texas A&M University—Poster # 4

3:30 PM 154Lab-Tek Chamber Slide for EM Prep: New Protocols for in situ Ultrastructural Study of Monolayer Cultures; M Hazen, G Ning; The Pennsylvania State University—Poster # 5

3:30 PM 155 (MSA PTSA Award) A Simple Method to Enumerate T4 Phages by Scanning Electron Microscopy; S Modla, DH Powell, DA Scheiblin, KJ Czymmek; University of Delaware—Poster # 6

3:30 PM 156Imaging Quantum Dots (Qdots) Oligomer Networks with Confocal Fluorescence, Laser Scanning and Transmission Electron Microscopy (CFLSM and TEM); N Vundyala, C Sun, F Sidime, W Shi, WJ L'Amoreaux, K Raja, R Peetz; CUNY College of Staten Island—Poster # 7

3:30 PM 157Detection of As, Cd and Pb in Walnuts by using EXAFS Spectrometry.; E Gallegos Loya, J Parra BerumenN; Centro de Investigación en Materiales Avanzados, Mexico; ME Alvarez Ramos; Universidad de Sonora, Mexico; JA Duarte Moller; Centro de Investigación en Materiales Avanzados, Mexico—Poster # 8.

Imaging, Fluorescence and Flow Cytometry

Poster Session: Monday 3:30 PM, Room: Exhibit Hall

3:30 PM 158Detection of FISH-stained Microorganisms in Soil Microstructure by Fluorescence Microscopy; T Eickhorst, R Tippkötter; University of Bremen—Poster # 9

3:30 PM 159Light Emitting Diodes as Illumination Sources for Microscopy: A Bright New Future; R Cole; New York State Department of Health—Poster # 10

Scanning Probe Microscopy in the Physical and Biological Sciences

Poster Session: Monday 3:30 PM, Room: Exhibit Hall

3:30 PM 160Aggregation Phenomena Studied by AFM and MDSC in Nanocarbon Composite Membranes; LP Terrazas-Bandala, G González-Sánchez, EA Zaragoza, R Ibarra; Advanced Materials Research Center; A Torres, V Nevárez, L Ballinas; Autonomous University of Chihuahua—Poster # 11

3:30 PM 161Study of the Surface Porosity of Cellulose Triacetate Membranes by AFM; LP Terrazas-Bandala, G González-Sánchez; Advanced Materials Research Center; L Ballinas; Autonomous University of Chihuahua—Poster # 12

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Poster Session: Monday 3:30 PM, Room: Exhibit Hall

3:30 PM 162FIB and HRTEM Characterization of Surface Oxides on Polysilicon MEMS after Cyclic Loading; A Avishai, H Kahn; Case Western Reserve University; R Ballarini; University of Minnesota; A Heuer; Case Western Reserve University—Poster # 13

3:30 PM 163Charge-contrast in SEM Imaging with Simultaneous Ion Bombardment; B Myers, J Wilson, VP Dravid, S Barnett; Northwestern University—Poster # 14

3:30 PM 164Assessing the Internal Structure and Composition of Climatically-Relevant Atmospheric Particles Using Focused Ion Beam Milling and X-ray Microanalysis; J Conny, D Klinedinst, S Eustis; National Institute of Standards and Technology—Poster # 15

3:30 PM 165A Quantitative Study on Focused Ion Beam Milling in a Cryogenic Environment; J Fu, S Joshi, J Catchmark, G Ning; The Pennsylvania State University—Poster # 16

3:30 PM 166Repetitive Grain Boundary Chemical Analysis by Atom Probe Microscopy; DJ Larson, P Clifton, R Alvis, D Olson, J Weng, S Gerstl; Imago Scientific Instruments; F Chen; Wuhan Iron and Steel Corporation, China—Poster # 17

3:30 PM 167In-situ Scanning Transmission Electron Microscopy Study on the Microstructural Characterization of a TFT-LCD Panel by a FIB/SEM; YJ Park, SH Han, HN Kim; LG Philips LCD, Republic of Korea—Poster # 18

3:30 PM 168Fabricating Atom Probe Tomography Specimens from TEM Foils; M Miller, K Russell, D Hoelzer; Oak Ridge National Laboratory—Poster # 19

3:30 PM 169Recent Advances in 3D Materials Characterization using DualBeams; W Neijssen; FEI Company, China; L Roussel; FEI Company, The Netherlands—Poster # 20

3:30 PM 170Critical Dimension Monitoring with STEM in Thin Film Magnetic Head Wafer Production; H Wang, J Fang, M Lederman; Western Digital Corporation—Poster # 21

3:30 PM 171OmniGIS Gas Injection System for Ion Beam Induced Deposition and Etching; DN Leonard; Appalachian State University; A Dhawan; U S Army Research Office; PE Russell; Appalachian State University—Poster # 22

3:30 PM 172Preparation of AlGaN-based High Electron Mobility Transistor Devices using Focused Ion Beam Milling; DA Cullen, DJ Smith; Arizona State University—Poster # 23.

Atom-Probe Analysis of Non-traditional Materials

Poster Session: Monday 3:30 PM, Room: Exhibit Hall

3:30 PM 173Identification and Analysis of Fluorine Clustering in Boron Implants; D Reinhard, D Lawrence, R Alvis; Imago Scientific Instruments; P Ronsheim; IBM—Poster # 24

3:30 PM 174Diffusion of TaN and HfO into TiN in a Metal Gate Stack; D Reinhard, D Lawrence, D Olson, R Alvis; Imago Scientific Instruments—Poster # 25

3:30 PM 175Analysis of Bulk Dielectrics with Atom Probe Tomography; DJ Larson, R Alvis, D Lawrence, T Prosa, RM Ulfig, D Reinahard, P Clifton, S Gerstl, J Bunton, D Lenz, TF Kelly; Imago Scientific Instruments; K Stiller; Chalmers University of Technology, Sweden—Poster # 26

In-situ TEM

Poster Session: Monday 3:30 PM, Room: Exhibit Hall

3:30 PM 176Dislocation/APB Interaction during TEM In-Situ Straining of Fe ₂MnAl; Y Liao, I Baker; Dartmouth College—Poster # 27

3:30 PM 177In-situ Atomic-scale Observation of Melting of Cu (110) Crystal; SH Oh, C Scheu, M Saito, M Ruehle; Max-Planck-Institut fuer Metallforschung, Germany—Poster # 28

3:30 PM 178A MEMS-based Technology Platform for In-situ TEM Heating Studies; J Damiano, D Nackashi, S Mick; Protochips Inc—Poster # 29

3:30 PM 179In-situ Observation of Behaviors of Nanometer-sized Dislocation Loops Upon Heating; K Arakawa, H Mori; Osaka University, Japan—Poster # 30

3:30 PM 180In-situ TEM Observations on the Sintering Process of Colloidal Gold Using an Ultra-fast Heating Stage; M Briceno de Gutierrez, K Hattar; University of Illinois; J Damiano, D Nackashi; Protochips Inc; I Robertson; University of Illinois—Poster # 31

3:30 PM 181In-situ XTEM Analysis of the Liquid Phase Epitaxial Growth of a-Si/Au Alloy Layer; DK Venkatachalam; RMIT University, Australia; D Llewellyn, K Belay, R Elliman; Australian National University; DK Sood, SK Bhargava; RMIT University, Australia—Poster # 32

Improving “Green” Products through Imaging: Biomass, Biofuels and Bioproducts

Poster Session: Monday 3:30 PM, Room: Exhibit Hall

3:30 PM 182Electron Microscopy Analysis of Maize Basal Endosperm Transfer Cells Processed by High-pressure Freezing and Freeze-substitution; B-H Kang, D Williams, K Kelley, K Backer-Kelley, P Chourey; University of Florida Gainsville—Poster # 33

3:30 PM 183Transcriptional Regulation of Secondary Wall Biosynthesis in Plants; R Zhong, EA Richardson, C Lee, J Zhou, R McCarthy, Z-H Ye; University of Georgia—Poster # 34

Visualizing Biological Nanomachines

Poster Session: Monday 3:30 PM, Room: Exhibit Hall

3:30 PM 184Three-Dimensional Structure of ATP-Dependent Molecular Machine hCHRAC for Chromatin Remodeling; M Hu, E Lymar, Y-B Zhang, L Qian, B Raymond, L Kuznetsova, J Hainfeld; Brookhaven National Laboratory—Poster # 35

3:30 PM 185Cryoelectron Microscopic Study of Campylobacter jejuni Bacteria Flagella Filament; X Yu, V Galkin, E Egelman; University of Virginia; P Guerry; Naval Medical Research Center—Poster # 36

3:30 PM 186Cryo-Electron Microscopy of the Lambda Bacteriophage Holin S105; C Savva, J Dewey, D Struck, R Young, A Holzenburg; Texas A&M University—Poster # 37

3:30 PM 187EM Tomography Visualization of Urothelial Intermediate Filaments and their Linkage to the Apical Plasma Membrane; H Wang, X-P Kong; New York University—Poster # 38.

3:30 PM 188Improved Multi-Stranded Nucleic Acid Immobilization Technique: Enhanced Double-Stranded, Triple-Stranded and Four-Stranded DNA Microarray Platform; A Law, C Gagna, T Law, C Spergel, J Rotunno, J Cherian, P Mody, K Schlatmann; New York Institute of Technology; WC Lambert; New Jersey Medical School—Poster # 39

3:30 PM 189Microfluidic Mixing System for Time Resolved Cryo-Electron Microscopy; Z Lu, J McMahon; Rensselaer Polytechnic Institute; H Mohamed, D Barnard, TR Shaikh, T Wagenknecht; Wadsworth Center; T-M Lu; Rensselaer Polytechnic Institute—Poster # 40

Understanding the Synthesis and Properties of Nanostructures and Nanomaterials

Poster Session: Monday 3:30 PM, Room: Exhibit Hall

3:30 PM 190Electron Microscopy Characterization of High Yield Growth of Thin TiO ₂Nanowires; H Li, J Jiao; Portland State University—Poster # 41

3:30 PM 191Electron Microscopy Characterization of Pd-Ce Interaction on alpha-Al ₂O ₃Support; MS Moreno; Centro Atómico Bariloche, Argentina; F Wang, M Malac; National Institute for Nanotechnology, Canada; T Kasama; University of Cambridge, United Kingdom; MD Sanchez; Universidad Nacional del Sur, Argentina; I Costilla, CE Gigola; Planta Piloto de Ingeniería Química, Argentina—Poster # 42

3:30 PM 192Structural and Electron Field Emission Propereties of Fe-doped GaN Nanowires; Y Chen, J Jiao; Portland State University—Poster # 43

3:30 PM 193Growth and Characterization of InP Nanowires on Si(111); M Pozuelo, SV Prikhodko, R Woo; University of California, Los Angeles; SD Sitzman; Oxford Instruments; RF Hicks, S Kodambaka; University of California, Los Angeles—Poster # 44

3:30 PM 194Novel Fabrication of Carbon Nanotube Vias for VLSI Interconnects; J Wu, J Walenza-Slabe; Portland State University; M Mann, KBK Teo, WI Milne; University of Cambridge, United Kingdom; J Jiao; Portland State University—Poster # 45

3:30 PM 195Characterization of Nanocomposite Materials using Electron Microscopy; V Rangari, S Mohammad, S Jeelani; Tuskegee University—Poster # 46

3:30 PM 196Synthesis and Interfacial Characterization of Au Nanoparticles on Si Nanowires; SY Sayed, F Wang, M Malac, R Egerton, J Buriak; National Institute for Nanotechnology, Canada—Poster # 47

3:30 PM 197Electron Microscopy and Raman Characterization of Multi-Walled Carbon Nanotubes Grown by Chemical Vapor Deposition; M Ellis; University of Arizona; T Jutarosaga; King Mongkut's University of Technology, Thailand; S Smith, Y Wei; Motorola Labs; S Seraphin; University of Arizona—Poster # 48

3:30 PM 198STEM Studies of Novel Gold Catalysts; AR Lupini, GM Veith, NJ Dudney, SJ Pennycook; Oak Ridge National Laboratory—Poster # 49

3:30 PM 199Sol-gel Prepared Cu-Ce-Ni Nanoparticle Alumina Catalysts for WGS Hydrogen Production; NV Seetala, J Bass; Grambling State University; AMR Jayasingha, RK Garudadri, U Siriwardane; Louisiana Tech University—Poster # 50

3:30 PM 200Characterization of Y ₂O ₃-MgO Nanostructures Prepared by Argon Shrouded-Plasma Spraying; JF Al-Sharab, Sadangi, V Shukla, BH Kear; Rutgers University; J Bentley; Oak Ridge National Laboratory—Poster # 51

3:30 PM 201SHG Detection on Glycine-Lithium Nitrate crystals; RA Gonzalez Valenzuela, J Hernández Paredes, HE Esparza Ponce; Centro de Investigación en Materiales Avanzados, Mexico; ME Alvarez Ramos, LE Regalado; Universidad de Sonora, Mexico; JA Duarte Moller; Centro de Investigación en Materiales Avanzados, Mexico—Poster # 52

3:30 PM 202Hollow ZnO Structures Formed by Evaporating Zn and InI ₃Mixture; C Li, Q Meng; Portland State University—Poster # 53

Surface Microscopy and Microanalysis in Materials and Biological Systems

Poster Session: Monday 3:30 PM, Room: Exhibit Hall

3:30 PM 203Characterization of the Organic-Inorganic Interface of Abalone Shell Nacre; WW Liu, N Yao; Princeton University—Poster # 54

3:30 PM 204Quantitative Evaluation of Auger Depth Profiles by LOGIT; T Ogiwara, S Tanuma; National Institute for Material Science, Japan—Poster # 55.

3:30 PM 205Surface Versus Bulk Defects on Devices using Complementary Techniques; VS Smentkowski, SG Ostrowski, L Denault, CG Woychik; General Electric Global Research—Poster # 56

3:30 PM 206Comparison of Sample Preparation Methods for Analysis of Biological Samples by High Vacuum Techniques; L Denault, SG Ostrowski, VS Smentkowski, TL Paxon; General Electric Global Research—Poster # 57

3:30 PM 207Evaluation of Chemical State Analysis and Imaging by Micro XPS; H Iwai, H Yoshikawa, S Fukushima, S Tanuma; National Institute for Materials Science, Japan—Poster # 58

Metallographic Techniques and Material Characterization

Poster Session: Monday 3:30 PM, Room: Exhibit Hall

3:30 PM 208Influence of Reinforcement Particles Addition and Processing Intensity on the Mechanical Properties in an Al 7075 Composite Produced by Mechanical Milling; I Estrada, C Carreño-Gallardo, E Rocha-Rangel; Universidad Autónoma Metropolitana, Mexico; M Miki-Yoshida, P Amezaga-Madrid, R Martínez-Sánchez; Centro de Investigación en Materiales Avanzados, Mexico—Poster # 59

3:30 PM 209Microstructural and Hot Extrusion Evaluation of Aluminum Alloy Al2024 During Mechanical Milling; C Carreño-Gallardo, I Estrada-Guel, M Neri; Centro de Investigación en Materiales Avanzados, Mexico; E Rocha-Rangel, M Romero-Romo; Universidad Autónoma Metropolitana, Mexico; C López-Meléndez, R Martínez-Sánchez; Centro de Investigación en Materiales Avanzados, Mexico—Poster # 60

3:30 PM 210Effect of Metallized Graphite Addition and Milling Intensity on Final Powder Morphology in an Aluminum 7075 Composite; I Estrada-Guel, C Carreño-Gallardo, E Rocha-Rangel; Universidad Autónoma Metropolitana, Mexico; M Miki-Yoshida, P Amezaga-Madrid, R Martínez-Sánchez; Centro de Investigación en Materiales Avanzados, Mexico—Poster # 61

3:30 PM 211Fractographs of Bending Fatigued Electrodeposited Nano-Crystalline Ni; L-C Lai; University of California, Irvine; W-A Chiou; University of Maryland; J Earthman; University of California, Irvine—Poster # 62

3:30 PM 212A New Method for Fracturing Mineral Particles for Cross-Sectional FESEM Analysis; C Huntington, B Clark, J Ptasienski, KL Bunker, BR Strohmeier, RJ Lee; RJ Lee Group, Inc—Poster # 63

3:30 PM 213Searching for the Limits of RIMAPS Technique Application; NO Fuentes; Comision Nacional de Energia Atomica Argentina; EA Favret, AM Canzian; Universidad de Gral San Martin Argentina—Poster # 64

3:30 PM 214Microstructure and Fractography of Eutectoid Fe ₃₀Ni ₂₀Mn ₃₅Al ₁₅; Y Liao, I Baker; Dartmouth College—Poster # 65

3:30 PM 215Al-MWCNT Composites Obtained by Mechanical Milling; R Pérez-Bustamante, I Estrada-Guel, W Antúnez-Flores, E Torres-Moye, A Hernández-Gutierrez, M Miki-Yoshida, R Martínez-Sánchez; Centro de Investigacion en Materiales Avanzados Mexico—Poster # 66

3:30 PM 216A Study of the Ni-Ru-Y system at 1200°C using SEM and EDX; S Coetzee; University of Botswana, Botswana; L Cornish, M Witcomb; University of the Witwatersrand, South Africa—Poster # 67

3:30 PM 217TEM and FESEM: The Right Combination for Enhanced Particle Characterization; KL Bunker, D McAllister, KA Allison, K Wagner, K Rickabaugh, AM Levine, BR Strohmeier, RJ Lee; RJ Lee Group, Inc—Poster # 68.

Microscopy and Analysis of Soft Matter: From the Molecules Up

Session Chairs: DJ Stokes, FEI Company, The Netherlands; RD Leapman, National Institutes of Health

Platform Session: Tuesday 8:30 AM, Room: Picuris

8:30 AM 218 (Invited) Electron Irradiation Effects in Carbon Nanostructures: Surface Reconstruction, Extreme Compression and Nanotube Growth; M Terrones; IPICyT, San Luis Potosi, Mexico

9:00 AM 219Multimodal Imaging of Nanostructures with FEG SEM; A Muto; Hitachi High Technologies Corporation; DB Buchholz, RPH Chang, VP Dravid; Northwestern University

9:15 AM 220 (Invited) X-ray Microscopy of Soft Matter; H Ade; North Carolina State University

9:45 AM 221Focused Ion Beam Processing of Polymeric Materials for Analytical Sample Preparation; SE Kooi; Massachusetts Institute of Technology

10:00 AM Coffee Break

10:30 AM 222 (Invited) Spectroscopic Imaging of Soft Materials; S Yakovlev; Stevens Institute of Technology; S Shi, M Misra; Unilever Research; M Libera; Stevens Institute of Technology

11:00 AM 223 (Invited) Advanced Transmission Electron Microscopy for Functional Polymer Systems; J Loos, E Sourty, S van Bavel, K Lu; Eindhoven University of Technology, The Netherlands

11:30 AM 224Quantitative STEM and EFTEM Characterization of Dendrimer-Based Nanoparticles Used in Magnetic Resonance Imaging and Drug Delivery; A Sousa, MA Aronova, H Wu, H Sarin, GL Griffiths, RD Leapman; National Institutes of Health

11:45 AM 225Surface Characterization of Amphiphilic Polymer Networks; NM Taylor, WJ L'Amoreaux, RM Peetz; CUNY College of Staten Island

Visualizing Unstained Specimens: Phase, Polarized Light and Other Intrinsic Contrast Methods

Session Chair: R Oldenbourg, Marine Biological Laboratory

Platform Session: Tuesday 8:30 AM, Room: Dona Ana

8:30 AM 226 (Invited) Second Harmonic Generation Imaging Studies of Diseased States; O Nadiarnykh; University of Connecticut Health Center; R Lacomb; University of Connecticut; M Brewer, P Campagnola; University of Connecticut Health Center

9:00 AM 227 (Invited) Quantitative Phase Microscopy; K Nugent; The University of Melbourne

9:30 AM 228 (Invited) Deep Ultraviolet Microscopy and Its Application to Cancer Immunology; BJ Zeskind; Immuneering Corporation

10:00 AM Coffee Break

10:30 AM 229 (Invited) Soft X-ray Tomography Generates Quantitative Images of Whole Cells Using Intrinsic Contrast; M Le Gros, D Parkinson; Lawrence Berkeley National Laboratory; W Gu, G McDermott, CA Larabell; University of California

11:00 AM 230 (Invited) A Polarized Light Field Microscope with Fast Polarization Switcher and Microlens Array Reveals the 3-D Birefringence Distribution of Complex Anisotropic Structures; R Oldenbourg; Marine Biological Laboratory

11:30 AM Discussion: Visualizing Unstained Specimens; R Oldenbourg; Marine Biological Laboratory

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Session Chairs: NWM Ritchie, National Institute of Standards and Technology; LN Brewer, Sandia National Laboratories

Platform Session: Tuesday 8:30 AM, Room: Aztec

8:30 AM 231 (Invited) Secondary, Backscattered and Low Energy Loss electrons in the SEM: Quantification for Nano Analysis; M El-Gomati, C Walker, C Bonet, S Tear, J Matthew; University of York, United Kingdom

9:00 AM 232Artificial SEM Images for Testing Resolution-Measurement Methods; P Cizmar, AE Vladar, B Ming, MT Postek; National Institute of Standards and Technology

9:15 AM 233Counting Electrons in Transmission Electron Microscopes; G Moldovan, X Li, P Wilshaw, AI Kirkland; University of Oxford, United Kingdom

9:30 AM 234Model of Fluctuation Electron Microscopy for a Nanocrystal/Amorphous Composite; F Yi, W Stratton, PM Voyles; Univeristy of Wisconsin Madison

9:45 AM 235The Use of Statistical Approach for Quantitative Strain Analyses with the Intensity Response of EBSD Systems; J Cocle, R Gauvin, S Yue; McGill University, Canada

10:00 AM Coffee Break

10:30 AM 236 (Invited) Ionization of Inner Shells of Atoms by Electron Iimpact; F Salvat, D Bote; Universitat de Barcelona, Spain; C Merlet; Université de Montpellier II, France; X Llovet; Universitat de Barcelona, Spain

11:00 AM 237Predicting Visibility in Elemental Maps Derived from X-ray Spectrum Images; DE Newbury, D Bright, JM Davis, N Ritchie; National Institute of Standards and Technology

11:15 AM 238 (Invited) Modeling Electron Diffraction and Imaging in Microscopes with Aberration Correctors for Quantitative Materials Structural Analysis; JM Zuo, WJ Huang, A Shah, R Kroeger; University of Illinois

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Session Chairs: LA Giannuzzi, FEI Company; B Gorman, University of North Texas; M Uchic, Wright-Patterson Air Force Base

Platform Session: Tuesday 8:30 AM, Room: Galisteo

8:30 AM 239 (Invited) In-situ Mechanical Testing of Micro-Sized Specimens Fabricated by FIB; R Wheeler; UES Incorporated; P Shade; The Ohio State University; M Uchic, D Dimiduk; Wright-Patterson AFB; A Shiveley; UES Incorporated; D Sergison; Sergison Machine; HL Fraser; The Ohio State University

9:00 AM 240Site-Specific Studies of Electrical Heterogeneities in Ni-BaTiO ₃Multilayer Ceramic Capacitors Using FIB and AEM; GY Yang, PJ Moses, EC Dickey, CA Randall; The Pennsylvania State University

9:15 AM 241Sub-stage with Remote Control of Specimen Rotation for Use in FIB/SEM Tools; D MacMahon; Micron Technology

9:30 AM 242 (Invited) FIB Preparation of Cross-sectional Polymer Thin Film TEM Samples; S Kim, A Minor; Lawrence Berkeley National Laboratory

10:00 AM Coffee Break

10:30 AM 243Sample Preparation for Aberration Corrected Microscopy; A Genç, D Huber; The Ohio State University; D Basile; E A Fischione Instruments Inc; HL Fraser; The Ohio State University; P Fischione; E A Fischione Instruments Inc

10:45 AM 244In-Situ Sample Preparation and Modeling of SEM-STEM Imaging; R Young, A Buxbaum, B Peterson, R Schampers; FEI Company

11:00 AM 245Advanced FIB-based Sample Preparation for 3D Characterization of 45nm ICs; F Lorut; ST Microelectronics, France; D Delille; FEI Company, The Netherlands

11:15 AM 246Specimen Preparation for Cross-Section Atom Probe Analysis; D Lawrence, R Alvis, D Olson; Imago Scientific Instruments

11:30 AM 247 (MAS Distinguished Scholar) New FIB Fold-Out Method for TEM Cross-Section Sample Preparation; HC Floresca, J Jeon, MJ Kim; University of Texas Dallas

11:45 AM 248Study of FIB Damage in Carbonaceous Materials using XANES; N Bassim, B DeGregorio, RM Stroud; U S Naval Research Laboratory; P Fischione; E A Fischione Instruments, Inc

Problem Solving Using Microanalytical Techniques

Session Chairs: PK Carpenter, Washington University; DT Kremser, Battelle Memorial Institute

Platform Session: Tuesday 8:00 AM, Room: Cimarron

8:00 AM 249 (Invited) Wavelength Dispersive X-ray Spectrometry Element Mapping and Mineralogy Based Manipulation Assessment as a Method for Distinguishing Forensic Soil Samples; CS Schwandt; McCrone Associates, Inc

8:30 AM 250 (Invited) Multi-Detector X-Ray Mapping and Generation of Correction Factor Images; R Wuhrer, K Moran, MR Phillips; University of Technology, Sydney

9:00 AM 251 (Invited) Determining Bulk Chemical Compositions of Chondrules by Electron Microprobe: Modal Recombination versus Defocused Beam Analyses; J Berlin, RH Jones, AJ Brearley, MN Spilde; University of New Mexico

9:30 AM 252 (Invited) Trace-element Analyses in Lunar Meteorite Sayh al Uhaymir 169; RA Zeigler, PK Carpenter, BL Jolliff, RL Korotev; Washington University

10:00 AM Coffee Break

10:30 AM 253Compositional Variations and Modeling in Low Alloy Steel Welds; JJ McGee, DB Knorr; Lockheed Martin, KAPL, Inc

10:45 AM 254Comparison of the Defect Microstructure of Silicon Dioxide Thin Films and Buried Oxide Layers Determined Using Cathodoluminescence Microanalysis; MA Stevens-Kalceff; University of New South Wales, Australia

11:00 AM 255Surface Enhanced Raman (SERS) Nanoparticle Delivery Device for In-situ Sample Analysis; TJ Tague Jr; Bruker Optics; M Leona; Metropolitan Museum of Art

11:15 AM 256Advances in High Resolution CT and Dimensional Measuring; D Moller-Gunderson, K Brockdorf; phoenix|x-ray Systems + Services Inc; O Brunke; phoenix|x-ray Systems + Services GmbH, Germany

11:30 AM 257Enhancing Contrast of Al Traces on Si Substrates using Low-voltage SEM-hosted XRM; BC Gundrum, JA Hunt; Gatan Research & Development; MA Zurbuchen; The Aerospace Corporation

11:45 AM 258Identifying Foreign Material Contamination in Food and Food Ingredients; VL St. Jeor, AD Lape, AR Muroski, C McGuire, DL Elmore; Cargill Incorporated

Analytical Electron Microscopy: Advanced Techniques and Applications for Nanoscience

Session Chairs: M Watanabe, Lawrence Berkeley National Laboratory; PA Crozier, Arizona State University

Platform Session: Tuesday 8:30 AM, Room: Brazos

8:30 AM 259 (Invited) Elemental Mapping of Nanoscale Structures in the Aberration-Corrected Analytical Electron Microscope; AA Herzing, IM Anderson; National Institute of Standards and Technology; JK Edwards, AF Carley, GJ Hutchings; Cardiff University, United Kingdom; X-Q Li, W-X Zhang, CJ Kiely; Lehigh University

9:00 AM 260First Performance Measurements and Application Results of a New High Brightness Schottky Field Emitter for HR-S/TEM at 80–300kV Acceleration Voltage; B Freitag, G Knippels, S Kujawa, M van der Stam, D Hubert, PC Tiemeijer; FEI Company, The Netherlands; C Kisielowski, P Denes, A Minor, U Dahmen; Lawrence Berkeley National Laboratory

9:15 AM 261Atomic Resolution Elemental Maps by Core Level EELS Using Cs Corrected STEM; E Okunishi, H Sawada, Y Kondo; JEOL Ltd, Japan; M Kersker; JEOL USA

9:30 AM 262The Newly Installed Aberration Corrected and Dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory; H Inada; Hitachi High Technologies America; Y Zhu, J Wall, VV Volkov; Brookhaven National Laboratory; K Nakamura, M Konno; Hitachi High Technologies; K Jarausch; Hitachi High Technologies America; RD Twesten; Gatan

9:45 AM 263Performance of a Nion Co. UltraSTEM; P Wang, MH Gass; SuperSTEM Laboratory, United Kingdom; M Falke; Chemnitz University of Technology, Germany; A Bleloch; SuperSTEM Laboratory, United Kingdom

10:00 AM Coffee Break

10:30 AM 264 (Invited) Nanoscale Elemental Analysis by EELS in the Life Sciences; RD Leapman; National Institutes of Health

11:00 AM 265Atomic-Resolution STEM at 60kV Primary Voltage; N Dellby, M Murfitt, OL Krivanek; Nion Co; M Kociak, K March, M Tence, C Colliex; CNRS, France

11:15 AM 266High Resolution Polymer Imaging Using Scanning Transmission Electron Microscopy; EI Garcia-Meitin, G Bar, J Blackson, D Reuschle; The Dow Chemical Company

11:30 AM 267In Situ Measurements of Ni Oxidation Using Electron Energy-Loss Spectroscopy; P Rez, ES Moore, R Sharma; Arizona State University

11:45 AM 268Elemental Mapping in Three Dimensions using 4D STEM-EELS Tomography; P Thomas, C Booth, R Harmon, S Markovic, RD Twesten; Gatan Inc; K Jarausch; Hitachi High Technologies America

Microscopy and Infectious Diseases

Session Chairs: CS Goldsmith, Centers for Disease Control; DR Beniac, Public Health Agency of Canada

Platform Session: Tuesday 8:30 AM, Room: Taos

8:30 AM 269 (Invited) Electron Microscopy of the SARS Coronavirus; D Beniac, SL deVarennes, A Andonov, TF Booth; Public Health Agency of Canada, Canada

9:00 AM 270 (Invited) Diagnostic Electron Microscopy in the UK from the Earliest Days to the Present; A Curry; Health Protection Agency, United Kingdom

9:30 AM 271 (Invited) Lemons to Lemonade (EM Techniques for Salvaging Suboptimal Specimens); SE Miller; Duke University Medical Center

10:00 AM Coffee Break

10:30 AM 272 (Invited) Electron Microscopy in Identification of Novel Environmental Microorganisms Potentially Dangerous for Humans and Animals; VL Popov, VC Han, JW Wen, DH Walker; University of Texas Medical Branch

11:00 AM 273 (Invited) The Role of Microscopy in the Global Climate Change Scheme; FJ Torres-Velez; University of Georgia

11:30 AM 274Defining the Viral Ecology of Epizootic Shell Disease of the American Lobster (Homarus Americanus); KD Moulton, JL Jamison, SM Duboise; University of Southern Maine

11:45 AM 275Microchemical Anatomy and Pathogenesis of the Protozoan Parasite Leishmania; A LeFurgey, P Ingram; Veterans Affairs Medical Center; Duke University Medical Center

Impact of Biofilms in the Real World

Session Chairs: RB Simmons, Georgia State University; JH Woodward, Buckman Laboratories

Platform Session: Tuesday 8:30 AM, Room: Mesilla

8:30 AM 276 (Invited) Using Fluorescence Microscopy to Assess Microbial Activity and Antimicrobial Performance in Biofilms; B Pitts; Montana State University

9:00 AM 277 (Invited) Nannobacteria, Organic Matter, and Precipitation in Hot Springs, Viterbo, Italy: Distinctions and Relevance; BL Kirkland, FL Lynch; Mississippi State University; RL Folk; The University of Texas, Austin; AM Lawrence; Mississippi State University

9:30 AM 278 (Invited) Diseased Minerals: Microbial Degradation of Copper Mineral Specimens; MN Spilde; University of New Mexico; PJ Boston; New Mexico Institute of Mining and Technology; A Dichosa, DE Northup; University of New Mexico; CA Francis; Harvard Mineralogical Museum

10:00 AM Coffee Break

10:30 AM 279 (Invited) Community Development in Bacterial Biofilms of the Oral Cavity; RJ Palmer Jr; National Institutes of Health; NI Chalmers; National Institutes of Health, University of Maryland Dental School; AH Rickard; Binghamton University; PE Kolenbrander; National Institutes of Health

11:00 AM 280Ethylene and Biofilms and Other Extracellular Materials in Pierce's Disease of Grapes; EA Ellis, BG Cobb, GR McEachern; Texas A&M University

11:30 AM 281S. epidermidis Biofilm Development on Patterned Surfaces; Y Wang, M Libera; Stevens Institute of Technology

Visualizing Biological Nanomachines

Session Chairs: A Steven, National Institutes of Health; M Morais, University of Texas Medical Branch

Platform Session: Tuesday 8:30 AM, Room: San Miguel

8:30 AM 282 (Invited) Packaging of Proteins into Viral Capsids and Their Activation; JB Heymann, A Sen, N Cheng; National Institutes of Health; J Qiao, L Mindich; New Jersey Medical School; AC Steven; National Institutes of Health

9:00 AM 283 (Invited) Dissecting the Bacteriophage Phi29 DNA Packaging Motor; MC Morais; University of Texas Medical Branch; JS Koti; University of Minnesota; VD Bowman; Purdue University; E Reyes-Aldrete; University of Texas Medical Branch; DL Anderson; University of Minnesota; MG Rossmann; Purdue University

9:30 AM 284 (Invited) Single Particle Electron Cryomicroscopy of Bacteriophage P22 Portal Protein Complexes; H Zheng, G Wisedchaisri, T Gonen; University of Washington

10:00 AM Coffee Break

10:30 AM 285 (Invited) Insight into DNA and Protein Transport in dsDNA viruses: The Structure of Bacteriophage N4; K Choi; University of Texas Medical Branch Galveston; J McPartland, I Kaganman; University of Chicago; VD Bowman; Purdue University; L Rothman-Denes; University of Chicago; MG Rossmann; Purdue University

11:00 AM 286Electron Cryo-Tomography of Viral Infection Within Caulobacter crescentus; E Wright; California Institute of Technology; J Poindexter; Barnard College; P Viollier; Case Western Reserve University; G Jensen; California Institute of Technology

11:15 AM 287Correlated Fluorescent Light Microscopy and Electron Cryotomography of the Caulobacter crescentus Chemotaxis Arrays; A Briegel, HJ Ding, Z Li; California Institute of Technology; J Werner, Z Gitai; Princeton University; DP Dias; California Institute of Technology; RB Jensen; Roskilde University, Denmark; G Jensen; California Institute of Technology

11:30 AM 288 (Invited) Insights into the Mechanism of Formation of Arp2/3 Induced Actin Branches from Electron Microscopy and Electron Tomography Studies; I Rouiller, X-P Xu; Burnham Institute for Medical Research; K Amann; University of Wisconsin Madison; C Egile; Experimental Therapeutic and Translational Research Oncology, France; D Nicastro; University of Colorado; S Nickell; Max-Planck Institute für Biochemie, Germany; R Li; Harvard Medical School; T Pollard; Yale University; N Volkmann, D Hanein; Burnham Institute for Medical Research

Understanding the Synthesis and Properties of Nanostructures and Nanomaterials

Session Chairs: EC Dickey, Pennsylvania State University; S Kodambaka, University of California, Los Angeles

Platform Session: Tuesday 8:30 AM, Room: Ruidoso

8:30 AM 289 (Invited) Size Effects in the Vapor-Liquid Solid (VLS) Growth of Semiconductor Nanowires; EC Dickey, TE Clark, X Zhang, JM Redwing; Pennsylvania State University

9:00 AM 290 (Invited) New Insights into the Nanowire Nucleation and Growth Kinetics; S Kodambaka; University of California, Los Angeles; J Tersoff; IBM T J Watson Research Center; BJ Kim; Purdue University; M Reuter; IBM T J Watson Research Center; EA Stach; Purdue University; FM Ross; IBM T J Watson Research Center

9:30 AM 291Structure of Coated Ge-nanowires; M Klementova; Academy of Science, Czech Republic; M Rieder; Czech Geological Survey, Czech Republic; V Drinek, R Fajgar, J Subrt; Academy of Science, Czech Republic

9:45 AM 292 (Invited) Study of Au Nanoparticle Catalyzed Growth Processes of ZnO Nanowires; J Wang; University of Missouri, St Louis; LF Allard; Oak Ridge National Laboratory; P Fraundorf; University of Missouri, St Louis; J Howe; Oak Ridge National Laboratory; J Liu; University of Missouri, St Louis

10:00 AM Coffee Break

10:30 AM 293Well Aligned ZnO/ZnSe Coaxial Nanocable Array on Transparent Conducting Oxide Substrate for Solar Cells; K Wang, J Chen, W Zhou; University of New Orleans; Y Zhang, J Pern, Y Yan, A Mascarenhas; National Energy Renewable Laboratory

10:45 AM 294TEM Study of the Formation of GaSb Core-Shell Nanofibers; A Perez-Bergquist, K Sun, L Wang; University of Michigan

11:00 AM 295Direct Imaging of Point Defect Configurations for Au inside Si Nanowires; K van Benthem, S-H Oh, AY Borisevich; Oak Ridge National Laboratory; W Luo; Vanderbilt University; P Werner, ND Zakharov; Max Planck Institut of Microstructure Physics, Germany; ST Pantelides, SJ Pennycook; Oak Ridge National Laboratory

11:15 AM 296 (Invited) Catalyst Dynamics during Carbon Nanotube and Si Nanowire CVD; S Hofmann; University of Cambridge, United Kingdom; R Sharma; Arizona State University; R Blume; Fritz Haber Institute, Germany; CT Wirth, C Ducati, T Kasama; University of Cambridge, United Kingdom; RE Dunin-Borkowski; Technical University of Denmark, Denmark; D Teschner; Fritz Haber Institute, Germany; J Drucker, P Bennett; Arizona State University; A Knop-Gericke, R Schloegl; Fritz Haber Institute, Germany; J Robertson; University of Cambridge, United Kingdom

11:45 AM 297 (MSA Presidential Student) In Situ Synthesis of Fe Catalyst and Carbon Nanotubes by Chemical Vapor Deposition; ES Moore, R Sharma, P Rez, MMJ Treacy, A Gamalski; Arizona State University

Failure Analysis: Real World Applications and Case Studies

Session Chairs: DP Dennies, The Boeing Company; F Schmidt, Engineering Systems Inc

Platform Session: Tuesday 8:00 AM, Room: Pecos

8:00 AM 298Catastrophic Failure of a Wheel Assembly in a Heavy Duty Off-Road 6X6 Vehicle; C Johnson; Oshkosh Corporation

8:30 AM 299 (Invited) Metallurgical and Metallographic Aspects of Engineering Failure Analysis; M Stevenson, J McDougall, M Hayes; Engineering Systems Inc

9:00 AM 300Microstructural Evaluation of Electron Beam Melted Ti-6Al-4V; J Wooten; CalRAM, Inc; DP Dennies; The Boeing Company

9:15 AM 301Cosmetic Defects Due to Contamination in an Electroplated Deposit; K Wasag; Scientific Control Laboratories, Inc; F Schmidt; Engineering Systems Inc

9:30 AM 302Imaging Grain Boundary Corrosion at Low Beam Currents in a Modern FIB/SEM System Equipped with a New Secondary Ion Detector; M Phaneuf, A Laquerre; Fibics Incorporated, Canada

9:45 AM 303Failure Analysis of a Fractured Ductile Cast Iron Bracket; S Raebel; Stork Technimet

10:00 AM Coffee Break

10:30 AM 304 (Invited) Evaluation of Trimetallic Joint; DP Dennies; The Boeing Company

11:00 AM 305Electron Microscopy Study of Localized Gate Forward Breakdown in AlGaN/AlN/GaN High Electron Mobility Transistors; L Li, N Nuhfer, M Skowronski; Carnegie Mellon University

11:30 AM 306Identification of Surface Deposits found in Failures of Water Purification Filters and Membranes; J Williard, JR Dominguez; GE Water & Process Technologies

Physical Tutorial: Electron Backscatter Diffraction: Operation and Applications

Session Chair: G Thompson, University of Alabama

Platform Session: Tuesday 9:00 AM, Room: La Cienega

9:00 AM 308 (Invited) Electron Backscatter Diffraction: Operation and Applications; DP Field; Washington State University

Biological Tutorial: Cryo-Fluorescence: A Tool for Correlative Cryo-Light and Cryo-Electron Microscopy

Session Chair: A Dohnalkova, Pacific Northwest National Laboratory

Platform Session: Tuesday 10:30 AM, Room: La Cienega

10:30 AM 307 (Invited) Cryo-Fluorescence: A Tool for Correlative Cryo-Light and Cryo-Electron Microscopy; CL Schwartz; University of Colorado, Boulder

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Session Chairs: NWM Ritchie, National Institute of Standards and Technology; LN Brewer, Sandia National Laboratories

Platform Session: Tuesday 1:30 PM, Room: Aztec

1:30 PM 309 (Invited) Simulation of Atomic Resolution Images in STEM; LJ Allen, AJ D'Alfonso; University of Melbourne, Australia; M Bosman; The University of Sydney, Australia; SD Findlay; The University of Tokyo, Japan; MP Oxley; Oak Ridge National Laboratory; VJ Keast; The University of Newcastle, Australia; JM LeBeau, S Stemmer; University of California, Santa Barbara

2:00 PM 310Bloch Wave Analysis of Depth Dependent Strain Effects in High Resolution Electron Microscopy; PD Nellist, EC Cosgriff, PB Hirsch, DJH Cockayne; University of Oxford, United Kingdom

2:15 PM 311Critical Role of Inelastic Interactions in Quantitative Electron Microscopy; A Mkhoyan, S Maccagnano-Zacher, M Thomas, J Silcox; Cornell University

2:45 PM 312 (MAS Distinguished Scholar) Controlling Channeling Effects in Aberration-Corrected STEM Tomography; HL Xin, V Intaraprasonk, DA Muller; Cornell University

3:00 PM 313Simulating Atomic Resolution STEM Images of Non-Periodic Samples; SD Findlay; University of Tokyo, Japan; AJ D'Alfonso, LJ Allen; University of Melbourne, Australia; MP Oxley; Oak Ridge National Laboratory; PD Nellist, EC Cosgriff, G Behan, AI Kirkland; University of Oxford, United Kingdom; N Shibata, T Mizoguchi, Y Ikuhara; University of Tokyo, Japan

3:15 PM 314Quantitative Image Simulation for Scanning Transmission Electron Microscopy; MP Oxley, K van Benthem, SJ Pennycook; Oak Ridge National Laboratory

Transmission Electron Microscopy Techniques and Applications

Session Chairs: MA O'Keefe, Lawrence Berkeley National Laboratory; PE Batson, IBM TJ Watson Research Center

Platform Session: Tuesday 1:30 PM, Room: Brazos

1:30 PM 315 (MAS Distinguished Scholar) Very Low Energy TEM Diffraction of Nanostructures; B McMorran, A Cronin; University of Arizona

1:45 PM 316Development of New Diffraction Microscope Based on Conventional Scanning Electron Microscope; O Kamimura, T Dobashi; Hitachi Ltd; K Kawahara, T Abe, K Gohara; Hokkaido University, Japan

2:00 PM 317Measurement of Electron Beam Coherence Using a Lau Interferometer; B McMorran, A Cronin; University of Arizona

2:15 PM 318Control of Parasitic Aberrations in Multipole Corrector Optics; P Batson; IBM T J Watson Research Center

2:30 PM 319Aberration Corrected Lorentz Microscopy for Perpendicular Magnetic Recording Media; C Phatak, J Bain, J Zhu, M DeGraef; Carnegie Mellon University

2:45 PM 321Object-defined Resolution Below 0.5Å in Transmission Electron Microscopy—Recent Advances on the TEAM 0.5 Instrument; C Kisielowski, R Erni; Lawrence Berkeley National Laboratory; B Freitag; FEI Company, The Netherlands

3:00 PM 320Young's Fringes Are Not Evidence of HRTEM Resolution; MA O'Keefe; Lawrence Berkeley National Laboratory; LF Allard; Oak Ridge National Laboratory; DA Blom; University of South Carolina

Visualizing Biological Nanomachines

Session Chairs: A Steven, National Institutes of Health; M Morais, University of Texas Medical Branch

Platform Session: Tuesday 1:30 PM, Room: San Miguel

1:30 PM 322 (Invited) Single Particle Reconstruction of Yeast RNA Degradation Machine, Exosome, Using Electron Microscopy; H Wang; Lawrence Berkeley National Laboratory; J Wang, F Ding; Cornell University; K Callahan; University of Rochester; M Bratkowski; Cornell University; S Butler; University of Rochester School; E Nogales; Lawrence Berkeley National Laboratory; A Ke; Cornell University

2:00 PM 323 (Invited) Symmetry Determination and Cryo-EM Reconstruction of Vps4 and Its Vta1 Complex; Z Yu; California Institute of Technology; M Gonciarz, W Sundquist, C Hill; University of Utah; G Jensen; California Institute of Technology

2:30 PM 324 (Invited) The Structure of Western Equine Encephalitis Virus; M Sherman, S Weaver; University of Texas

3:00 PM 325 (Invited) AFM and cryoEM Studies of the Giant Mimivirus; C Xiao; Purdue University; YG Kuznetsov; University of California Irvine; S Sun, B Hu, MJ Criswell, CM Bator-Kelly, S Hafenstein, PR Chipman; Purdue University; M Suzan-Monti, D Raoult; CNRS, France; A McPherson; University of California Irvine; MG Rossmann; Purdue University

Understanding the Synthesis and Properties of Nanostructures and Nanomaterials: Electronic and Magnetic Nanomaterials

Session Chairs: R Sharma, Arizona State University; R Hull, Rensselaer Polytechnic Institute

Platform Session: Tuesday 1:30 PM, Room: Ruidoso

1:30 PM 326 (Invited) Assembly, Analysis and Functionalization of Complex Epitaxial Nanostructures; R Hull; Rensselaer Polytechnic Institute; JJ Gray; University of Pittsburgh; JA Floro, JF Graham; University of Virginia

2:00 PM 327Solid State Synthesis and Crystal Structure of Ca10(VxP1-xO4)6F2 Apatite; Z Dong, TJ White; Nanyang Technological University, Singapore

2:15 PM 328Nanoscale Disorder in MgB ₂Thin Films Grown by Hybrid Physical-Chemical Vapor Deposition; Y Zhu; University of Wisconsin, Madison; D Larbalestier, A Gurevich; Florida State University; XX Xi; Pennsylvania State University; PM Voyles; University of Wisconsin, Madison

2:30 PM 329Mechanistic Control of the Nucleation and Growth Conditions for Narrow Composition Distributions in FePt Nanoparticles; C Srivastava, DE Nikles, GB Thompson; University of Alabama

2:45 PM 330In-situ Z-STEM Imaging of Chemical Ordering in FePt Magnetic Nanoparticles; JE Wittig; Vanderbilt University; J Bentley, LF Allard; Oak Ridge National Laboratory; MS Wellons, CM Lukehart; Vanderbilt University

3:00 PM 331Surface Segregation and Ordering in Pt ₃Co Nanoparticles Observed by Aberration-Corrected STEM; PJ Ferreira; University of Texas, Austin; LF Allard; Oak Ridge National Laboratory; S Chuo, N Yabuuchi, Y Shao-Horn; Massachusetts Institute of Technology

3:15 PM 332FePt (core)/FeRh (shell) Nanoparticles: Structure and Magnetism; M Shamsuzzoha, S Shi, P Padhan, DE Nikles, J Harrell; University of Alabama

Microbeam Analysis of Terrestrial and Planetary Materials—A Symposium in Memory of Gene Jarosewich

Session Chairs: EP Vicenzi, Smithsonian Institution; GP Meeker, U.S. Geological Survey

Platform Session: Tuesday 1:30 PM, Room: Cimarron

1:30 PM 333 (Invited) Applications of Integrated Electron and Ion Beam Micro and Nanoanalysis to Understanding Earth and Planetary Materials; AJ Brearley; University of New Mexico

2:00 PM 334Making the Most of Small Extraterrestrial Samples: Chemical and Isotopic Information for Chondrules Obtained Using Multiple Microbeam Techniques; R Jones; University of New Mexico

2:15 PM 335 (Invited) Keilite (Fe>0.5,Mg<0.5)S as an Indicator of Extensive Impact Melting on Enstatite Chondrite Parent Asteroids; K Keil; University of Hawaii

2:45 PM 336 (Invited) Digesting Meteorites to Decipher Asteroid: The Work of Eugene Jarosewich; TJ McCoy; Smithsonian Institution

3:15 PM Memorial Tribute to Gene Jarosewich; EP Vicenzi; Smithsonian Institution

Failure Analysis: Real World Applications and Case Studies

Session Chairs: DP Dennies, The Boeing Company; F Schmidt, Engineering Systems Inc

Platform Session: Tuesday 1:30 PM, Room: Pecos

1:30 PM 337 (Invited) Improper Weld Repair of a CF8M Cast Stainless Steel Impeller; F Schmidt, D Norfleet, K Johnson; Engineering Systems Inc

2:00 PM 338Failure Analysis of a Tree Pruner Saw Blade Anchor Screw; ME Stevenson, M Hayes, JL McDougall; Engineering System Inc; ER Weishaupt; Metals & Materials Engineers, LLC, University of Alabama; DA Turnquist; Engineering System Inc

2:30 PM 339Failure Analysis of Peelable Seals Utilizing Light and Transmission Electron Microscopies; EI Garcia-Meitin, J Wooster, R Cotton, J McKenna; The Dow Chemical Company

3:00 PM 340Investigation of Microcracks in a Multilayered Coating of a Camera Lens; Y-S Yu, Y-J Yoon, J-H Kim, H-S Kwon, B-K Kim; Samsung Electro-Mechanics Co, Ltd

3:15 PM 341Nanostructure Origin of Leakage Current in GaN/InGaN Lighting Emitting Diode Using Patterned Sapphire Substrate; Y-J Yoon, B-K Kim, M Kim; Samsung Electro-Mechanics Co, Republic of Korea

It's a Family Affair!

Session Chairs: F Hogue, Hogue Metallography; J Frafjord, Y-12 National Security Complex

Platform Session: Tuesday 1:30 PM, Room: Santa Ana

1:30 PM It's a Family Affair

Technologists' Forum Roundtable: Immunogold Labeling

Session Chair: F Macaluso, Albert Einstein College of Medicine

Platform Session: Tuesday 1:30 PM, Room: Mesilla

1:30 PM Tech Forum Roundtable Discussion; R Powell; Nanoprobes Inc; P Webster; House Ear Institute; H Yi; Emory University

Joint Tutorial: Job Hunting for Scientific Professionals

Session Chairs: A Dohnalkova, Pacific Northwest National Laboratory; G Thompson, University of Alabama

Platform Session: Tuesday 1:30 PM, Room: La Cienega

1:30 PM 343 (Invited) Job Hunting for Scientific Professionals; BE Maleeff; GlaxoSmithKline

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Poster Session: Tuesday 3:30 PM, Room: Exhibit Hall

3:30 PM 344Geometrical Interpretation and Simulation of HOLZ Patterns; XZ Li; University of Nebraska Lincoln—Poster # 69

3:30 PM 345EBSD Characterization of the Deformation Behavior of Alloy 182 Weld Metal; M Othon, M Morra; General Electric Global Research Center Niskayuna—Poster # 70

3:30 PM 346Computation of Current Density in Particle Beams; M Oral, AE Vladar; National Institute of Standards and Technology—Poster # 71

3:30 PM 347HAADF Imaging and MD Simulations of Microtwining Partial Dislocations in Nickel Based Superalloy Rene 104; L Kovarik, R Unocic; The Ohio State University; J Li; University of Pennsylvania; M Mills; The Ohio State University—Poster # 72

3:30 PM 348High-resolution Electron Imaging of Amorphous Layers with Aberration-Corrected Probes; S Maccagnano-Zacher, A Mkhoyan, J Silcox; Cornell University—Poster # 73

3:30 PM 349Quantitative Image Contrast Variations in STEM; K van Benthem, MP Oxley; Oak Ridge National Laboratory; C Kreyenschulte; WWU Muenster, Germany; SJ Pennycook; Oak Ridge National Laboratory—Poster # 74

3:30 PM 350An Experimental and Monte Carlo Study of Secondary Electron Emission from Elemental Solids; C Walker, M El-Gomati; University of York, United Kingdom; A Ass'ad; Bishah College of Technology, Saudi Arabia; M Zadrazil; Tescan Ltd, Czech Republic—Poster # 75

3:30 PM 351Monte Carlo Modeling of the Low-loss Electron Signal in Scanning Electron Microscopy and Comparison with the BSE Signal; C Bonet, A Pratt, M El-Gomati, JAD Matthew, SP Tear; University of York, United Kingdom—Poster # 76

3:30 PM 352Cross Sections for the Ionization of Atoms by Electron Impact: A Numerical Database and an Analytical Formula; D Bote, F Salvat-Pujol, JA Escuder; Universitat de Barcelona, Spain; CJ Powell; National Institute of Standards and Technology; F Salvat; Universitat de Barcelona, Spain—Poster # 77

Problem Solving Using Microanalytical Techniques

Poster Session: Tuesday 3:30 PM, Room: Exhibit Hall

3:30 PM 353An Ex-Situ TEM Investigation into the Effect of Successive Reduction-Oxidation-Reduction Treatments on Closely Spaced Copper Metal Particles; CE Kliewer; ExxonMobil Research and Engineering—Poster # 78

3:30 PM 354A DigitalMicrograph™ Script to Characterize Elliptical Distortion of Electron Diffraction Patterns in TEM; VDH Hou; Micron Technology—Poster # 79

3:30 PM 355A Method to Correct Elliptical Distortion of Diffraction Patterns in TEM; VDH Hou, D Li; Micron Technology—Poster # 80

3:30 PM 356Distortion Minimization of CBED Patterns in TEM; VDH Hou; Micron Technology—Poster # 81

3:30 PM 357Combined Raman Spectroscopy and SEM Analysis of CVD Grown Carbon Nanotubes; B Duong, Y Peng, M Ellis, S Seraphin, H Xin; University of Arizona—Poster # 82

3:30 PM 358Effect of Zr/Ti Ratio on the Microstructure of PZT Film; YH Oh, BW Koo, JY Jo, TW Noh; Seoul National University, Korea; S-H Kim; INOSTEK Inc, Korea; Y-W Kim; Seoul National University, Korea—Poster # 83

3:30 PM 359Comparison of Elemental Distribution Profiles Across Cu(In,Ga)Se ₂Solar-cell Absorbers Acquired by Various Techniques; D Abou-Ras, CA Kaufmann; Hahn-Meitner-Institut Berlin, Germany; A Eicke; Zentrum für Sonnenenergie- und Wasserstoff-Forschung, Germany; M Döbeli; Paul Scherrer Institute, Switzerland; B Gade; Thermo Fisher Scientific, Germany; T Nunney; Thermo Fisher Scientific, United Kingdom—Poster # 84.

3:30 PM 360The Quantitative Analysis of Super-Low Phosphorus Content of SUS316L Type Stainless Steel With EPMA Calibration Curve Method; T Kimura, S Iwasaki, K Sakuraya, S Tanuma; National Institute for Materials Science, Japan—Poster # 85

3:30 PM 361Electron Microscopy Study of Germanium Glass Vitrified by High Pressure Melt-Quench; VC Solomon; University of Connecticut; MH Bhat; Arizona State University; V Molinero; University of Utah; E Soignard; Arizona State University; S Sastry; J Nehru Centre for Advanced Scientific Research, India; JL Yarger, AC Angell; Arizona State University—Poster # 86

3:30 PM 362Advanced Large Active Area SDD for X-Ray Spectroscopy; VD Saveliev, CR Tull, L Feng, S Barkan, M Takahashi, EV Damron; SII NanoTechnology USA Inc—Poster # 87

3:30 PM 363TEM and SEM Investigation on Oxidised Ge-based Clathrates; C Hébert, B Bartova, M Cantoni; Ecole Polytecnique Fédérale, Switzerland; U Aydemir, M Baitinger; Max Planck Institute for Chemical Physics of Solids, Germany—Poster # 88

3:30 PM 364Computer-Controlled Polishing Preparation and Subsequent Mounting of Samples for Low-voltage X-Ray Tomography; P Prasad; Gatan Research & Development; D Erwin; Gatan FA Products Division; JA Hunt; Gatan Research & Development—Poster # 89

3:30 PM 365Analytical TEM of Nb ₃Sn Multifilament Superconductor Wires; M Cantoni; Ecole Polytecnique Fédérale, Switzerland; V Abäecherli, D Uglietti, B Seeber, R Flüekiger; University of Geneva, Switzerland—Poster # 90

3:30 PM 366EMCD In The TEM—Optimization of Signal Acquisition And Data Evaluation; H Lidbaum; Uppsala University, Sweden; J Rusz; Uppsala University, Sweden; Academy of Sciences of the Czech Republic, Czech Republic; A Liebig, B Hjörvarsson, PM Oppeneer, E Coronel, O Eriksson, K Leifer; Uppsala University, Sweden—Poster # 91

Analytical Electron Microscopy: Advanced Techniques and Applications for Nanoscience

Poster Session: Tuesday 3:30 PM, Room: Exhibit Hall

3:30 PM 367Uranium Single Atom Imaging And EELS Mapping using Aberration Corrected Scanning Transmission Electron Microscope and LN2 Cold Stage; H Inada; Hitachi High Technologies America; J Wall, Y Zhu, VV Volkov; Brookhaven National Laboratory; K Nakamura, M Konno; Hitachi High Technologies; K Jarausch; Hitachi High Technologies America; RD Twesten; Gatan—Poster # 92

3:30 PM 368Ultrastructure of a Metal/Superconductor Interface Revealed by Atomic-Resolution STEM Techniques; Y Xin; Florida State University; LF Allard; Oak Ridge National Laboratory; Z Mao; Tulane University—Poster # 93

3:30 PM 369Analysis of Catalysts using Aberration-Corrected TEM; S Rozeveld; The Dow Chemical Company; DA Blom; University of South Carolina; LF Allard; Oak Ridge National Laboratory; T Richardson, CS Todd, J Blackson; The Dow Chemical Company—Poster # 94

3:30 PM 370Influence of Au Electrodes on the Properties of SrTiO ₃/La _0.67Sr _0.33MnO ₃/Au Magnetic Tunnel Junctions Studied by Aberration-Corrected STEM-EELS; C Magen, M Varela, SJ Pennycook; Oak Ridge National Laboratory; S Brivio, D Petti, M Cantoni, R Bertacco; LNESS-CNISM, Italy—Poster # 95

3:30 PM 371Nanoscale EELS and EDX Analyses of GaN Nanowires and GaN/AlGaN Radial Heterostructure Nanowires; L Lari, RT Murray; University of Liverpool, United Kingdom; MH Gass; SuperSTEM Laboratory, United Kingdom; T Bullough, PR Chalker; University of Liverpool, United Kingdom; C Chéze; Paul-Drude-Institut für Festkörperelektronik, Germany; L Geelhaar; NaMLab GmbH, Germany; H Riechert; Paul-Drude-Institut für Festkörperelektronik, Germany—Poster # 96

3:30 PM 372Probing the Composition Variations in Nanoscale Multilayers; A Genç; Ohio State University; R Banerjee; University of North Texas; AWS Johnson; University of Western Australia, Australia; HL Fraser; Ohio State University—Poster # 97

3:30 PM 373Z-Contrast Imaging and EELS Study of Supported CoPd Nano-Catalyst; Y Zhao, L D'Souza, JR Regalbuto, RF Klie; University of Illinois Chicago—Poster # 98

3:30 PM 374Optimization of Acquisition Parameters for Atomic-Column Electron Energy-Loss Spectrum Imaging in a JEM-2200FS Aberration-Corrected Scanning Transmission Electron Microscope; M Watanabe; Lawrence Berkeley National Laboratory; M Kanno; JEOL Ltd, Japan; D Ackland, CJ Kiely, DB Williams; Lehigh University—Poster # 99

3:30 PM 375Atomic Investigation of Al ₂O ₃/GaN Heterostructures Interfaces using Aberration-Corrected STEM Combined with First-Principles Methods; JC Idrobo; Vanderbilt University; P Pant, J Narayan; North Caroline State University; SJ Pennycook; Oak Ridge National Laboratory; ST Pantelides; Vanderbilt University—Poster # 100

3:30 PM 3763D Elemental Mapping Using a Real-Time EELS Imaging System Equipped with a Dedicated STEM; T Yaguchi, K Kaji, H Kikuchi, M Miyakawa, H Okushima, M Konno, T Kamino; Hitachi High-Technologies Corp, Japan—Poster # 101

3:30 PM 377Effects of Pretreatments on the Growth Mechanisms of Ultra-Nanocrystalline Diamond Films: A Chemical Bonding Mapping Approaching; X Zhong, Y-C Chen; Argonne National Laboratory; N-H Tai; National Tsing-hua University, Taiwan; I-N Lin; Tamkang University, Taiwan; J Hiller, O Auciello, B Kabius; Argonne National Laboratory—Poster # 102

3:30 PM 378Is There Still a Place for Aberration Corrected User Facilities?; MH Gass, P Wang, K Sader, B Mendis, I Godfrey, A Bleloch; SuperSTEM, United Kingdom—Poster # 103

3:30 PM 379A Comparison of Theoretical and Experimental Cross-Sections for EELS Quantification at 200 kV Incident Electron Energy; Q Jin, S Wang; Micron Technology Inc—Poster # 104

3:30 PM 380Use of Fourier-ratio Deconvolution for Processing Low-loss EELS Spectra; F Wang, R Egerton, M Malac; National Institute for Nanotechnology, Canada—Poster # 105

3:30 PM 381HRTEM Characterization of Precipitates in Structural Microalloyed Steels; L Béjar-Gómez, A Medina-Flores, A Bedolla-Jacuinde; Ciudad Universitaria Morelia, México; JA Ascencio; Universidad Nacional Autónoma de México Cuernavaca, México—Poster # 106

3:30 PM 382TEM Characterization of Tensile-Tested 14YWT Nanostructured Ferritic Alloys; J Bentley, DT Hoelzer; Oak Ridge National Laboratory—Poster # 107

Transmission Electron Microscopy Techniques and Applications

Poster Session: Tuesday 3:30 PM, Room: Exhibit Hall

3:30 PM 383Development of Sample Preparation Method for Observation of Dopant Profile by Electron Holography; T Sato, H Matsumoto, M Konno, M Fukui, S Mamishin, Y Taniguchi; Hitachi High-Technologies Corporation; H Kasai; Hitachi Ltd—Poster # 108

3:30 PM 384In-line Point Projection Holography of Titanium Oxide Nanoparticles; L Livadaru, M Malac, R Wolkow; University of Alberta—Poster # 109

3:30 PM 385Routine Phase Resolution of 2pi/100 and Better in Off-axis (Electron) Holography; E Voelkl; HoloWerk LLC—Poster # 110

3:30 PM 386On-line Dynamic Digital Electron Holography; T Hirayama, K Yamamoto; Japan Fine Ceramics Center; K Urata; Image Sence Ltd—Poster # 111

3:30 PM 387Improving Image Quality and Reducing Drift Problems via Automated Data Acquisition and Averaging in Cs-corrected TEM; E Voelkl, B Jiang; FEI Company; Z Dai, J Bradley; Lawrence Livermore National Laboratory—Poster # 112

3:30 PM 388Absolute Strain at the Nanoscale from HREM Images; CL Johnson, E Snoeck, MJ Hytch; CEMES-CNRS, France—Poster # 113

3:30 PM 389Atomic Resolution Imaging of Solid State Phase Separation in a Beta-Stabilized Titanium Alloy; S Nag, A Genç; The Ohio State University; R Banerjee; University of North Texas; HL Fraser; The Ohio State University—Poster # 114

3:30 PM 390Simple Method for Estimating Relaxation in Silicon from Higher Order Laue Zone Line Splitting; D Diercks; University of North Texas; M Kaufman; Colorado School of Mines; A Needleman; University of North Texas—Poster # 115

3:30 PM 391Comparison of Zone Axes for Convergent Beam Electron Diffraction Strain Measurements of a Strained Silicon Transistor; D Diercks; University of North Texas; M Kaufman; Colorado School of Mines—Poster # 116.

3:30 PM 392Evaluating Visibility and Spatial Resolution in Electron Holography; R McLeod, M Malac; University of Alberta—Poster # 117

Microscopy and Infectious Diseases

Poster Session: Tuesday 3:30 PM, Room: Exhibit Hall

3:30 PM 393Ultrastructural Analysis of the Reactivation of the Murid Herpesvirus 4, Strain 68 (MHV-68) in a Latently-Infected B Cell Line; N Lobo, JL Jamison, KD Moulton, SM Duboise; University of Southern Maine—Poster # 118

3:30 PM 394Diagnosis of Ovine Paramyxovirus (Parainfluenza-type 3) Infection in Sheep Using Negative Contrast Electron Microscopy and Ultramicrotomy of Infected Cell Cultures; CE Hearne, JL Cavender, DL Arellano, DL Montgomery; University of Wyoming—Poster # 119

3:30 PM 395Capsid Polymorphism of Rous Sarcoma Virus Correlates with Assembly Efficiency and Envelope Glycoprotein Content; C Butan, DC Winkler, JB Heymann; National Institutes of Health; R Craven; Pennsylvania State University College of Medicine; AC Steven; National Institutes of Health—Poster # 120

3:30 PM 396Same-Day Diagnostic Electron Microscopy of Infected Cell Cultures by a Modified Protocol for Conventional and Microwave Processing; MG Metcalfe, D Rollin, CD Humphrey; Center for Disease Control—Poster # 121

Impact of Biofilms in the Real World

Poster Session: Tuesday 3:30 PM, Room: Exhibit Hall

3:30 PM 397Imaging and Analyses of Iron-oxidizing Bacteria on Basalt Glass by methods of FIB-SEM and HRTEM; B Arey; Pacific Northwest National Laboratory, Battelle; A Templeton; University of Colorado Boulder; B Tebo; Oregon Health and Science University; H Staudigel; Scripps Institution of Oceanography; T Trainor; University of Alaska, Fairbanks—Poster # 122

Biological Sciences Applications

Poster Session: Tuesday 3:30 PM, Room: Exhibit Hall

3:30 PM 398TEM Survey of the Cytoplasmic Wound Reaction of Caulerpa prolifera; E Lavoie-Hodges, E Dressaire, DC Bell; Harvard University—Poster # 123

3:30 PM 399An Ultrastructural Study of Salt Glands in Zoysia matrella; S Rao, MW Pendleton, H Kim, ML Binzel, EA Ellis; Texas A&M University—Poster # 124

3:30 PM 400Light and Electron Microscopy of the Spermogonial Stage of Gymnoconia peckiana, One of the Causes of Orange Rust of Rubus; CW Mims, EA Richardson; University of Georgia—Poster # 125

3:30 PM 401Spicule Morphology and Formation in Helicoradomenia acredema (Mollusca Aplacophora); RJ Kingsley, CB Marks; University of Richmond—Poster # 126

3:30 PM 402Scanning Electron Microscopic Study of the Aphanius dispar (Ruppell 1828) (Pisces: Cyprinodontidae) Gills; TA Ba-Omar, I Al-Amri; Sultan Qaboos University, Sultanate of Oman—Poster # 127

3:30 PM 403Singing Spiders a Scanning Electron Microscopy Examination of the Sound Producing Structures Males Jumping Spiders Use to Woo Females (Araneae Salticidae); CB Marks; University of Richmond; DO Elias; University of British Columbia, Canada—Poster # 128

3:30 PM 404Microscopic Picture of Dentine Canaliculi of Atypical Teeth; B Jodlowska—Jedrych; Medical University of Lublin; B Kawka; Ortovision; W Matysiak; Medical University of Lublin—Poster # 129

3:30 PM 405High Resolution Imaging of Titanium Implants Detached from Bone; J Kenealy, R Stach; BIOMET 3i; I Nishimura; University of California Los Angeles—Poster # 130

3:30 PM 406Development of Monovalent Fluorescent Probes for Single Particle Tracking of ErbB Receptors; ST Low-Nam, BS Wilson, DS Lidke; University of New Mexico—Poster # 131

3:30 PM 407Forensic Analysis of Silk Fibers; I Cakir, HB Uner; Istanbul University, Turkey—Poster # 132.

Understanding the Synthesis and Properties of Nanostructures and Nanomaterials

Poster Session: Tuesday 3:30 PM, Room: Exhibit Hall

3:30 PM 408TEM/SEM Studies of Microstructural Transformations in Ultrathin TiDy/Dd Films Evaporated on Si(100) after TDMS Induced Decomposition of the TiDy Phase; EG Keim; University of Twente, The Netherlands; W Lisowski; Polish Academy of Sciences, Poland; MA Smithers; University of Twente, The Netherlands—Poster # 133

3:30 PM 409High Resolution HAADF-STEM Imaging Analysis of N Related Defects in GaNAs Quantum Wells; M Herrera; University of California, Davis; Q Ramasse; Lawrence Berkeley National Laboratory; ND Browning; Lawrence Livermore National Laboratory; J Pizarro, PL Galindo, D Gonzalez, R Garcia; University of Cadiz, Spain; MW Du; Oak Ridge National Laboratory; SB Zhang; Rensselaer Polytechnic Institute; M Hopkinson; University of Sheffield, United Kingdom—Poster # 134

3:30 PM 410Crystalline Behavior and Microstructure Analysis in Fe _73.28Si _13.43B _8.72Cu _0.94Nb _3.63Alloy with Annealing Temperature; YH Oh, BW Koo; Seoul National University, South Korea; KY Kim, HK Seok, YB Kim; Korea Institute of Science and Technology, South Korea; Y-W Kim; Seoul National University, South Korea—Poster # 135

3:30 PM 411In-situ Observation of Nano-particulate Gold Catalysts under Reaction Gas and Non-reaction Gas Conditions; T Kawasaki, H Hasegawa, K Ueda, T Tanji; Nagoya University, Japan—Poster # 136

3:30 PM 412Arsenic Segregation to Dislocation Loops in Silicon; DJ Larson, K Thompson, R Alvis, D Lawrence, RM Ulfig, DA Reinahard, P Clifton, JH Bunton, DR Lenz, TF Kelly; Imago Scientific Instruments—Poster # 137

3:30 PM 413Ni-Cu-Zn Ferrite Prepared by Aloe Vera Plant Extract or Egg White; B Duong, S Seraphin; University of Arizona; P Laokul; Khon Kaen University, Thailand; C Masingboon; Kasetsart University, Thailand; S Maensiri; Khon Kaen University, Thailand—Poster # 138

3:30 PM 414Anodic Tantalum Pentoxide: Chemical and Structural Characterization of a Bi-Layer Oxide; J Ray Sloppy, J Li, EC Dickey; Pennsylvania State University—Poster # 139

3:30 PM 415Characterization of TaN Thin Films Synthesized by ICP Assisted Sputtering; S-I Baik, J-W Park, T-Y Ahn, G-R Lee, J-J Lee, Y-W Kim; Seoul National University, Korea—Poster # 140

3:30 PM 416Effect of Charge and Discharge on the Capacitance of Supercapacitor of Hydrous Ruthenium Oxides and Carbon Nanotube Coatings; H-S Hwang, Y Lin; Chung Hua University, Taiwan ROC—Poster # 141

3:30 PM 417Crystallite Morphology of Rutile TiO ₂Nanocrystals: A TEM Study; AY Kuznetsov; Inmetro, Brazil; V Swamy; Monash University, Australia; L Gomes; Inmetro, Brazil; H Calderon; ESFM-IPN, Mexico; V Prakapenka; University of Chicago; CA Achete; Inmetro, Brazil—Poster # 142

3:30 PM 418Thin Film Properties Measurement using SEM-based Energy Dispersive Spectroscopy for Nanoscience Studies; S Sharp, S Burgess; Oxford Instruments Nanoanalysis, United Kingdom; C Hodson, Q Fang; Oxford Instruments Plasma Technology, United Kingdom—Poster # 143

3:30 PM 419Morphology Effects on Photocatalytic Activity of Niobate Materials; MC Sarahan, FE Osterloh, ND Browning; University of California, Davis—Poster # 144

3:30 PM 420Dual-Axis STEM Tomography of Dy-doped YBa ₂Cu ₃O_7−xCoated Superconductors; V Ortalan, M Herrera, DG Morgan; University of California, Davis; MW Rupich; American Superconductor Corporation; ND Browning; University of California, Davis—Poster # 145

3:30 PM 421Microstructural Investigation of the Most Efficient Vortex Pinning in a Superconducting YBa ₂Cu ₃O ₇Thin Film; F Kametani, Z Chen, SI Kim, A Gurevich, D Larbalestier; Florida State University—Poster # 146

3:30 PM 422Experimental and Simulated Strain Field Maps in Stacked Quantum Wires; T Ben, DL Sales, J Pizarro, PL Galindo; Universidad de Cadiz, Spain; D Fuster, Y Gonzalez, L Gonzalez; Instituto de Microelectronica de Madrid, Spain; M Varela, SJ Pennycook; Oak Ridge National Laboratory; SI Molina; Universidad de Cadiz, Spain—Poster # 147

3:30 PM 423Microstructure of Ferroelectric BaTiO ₃Thin Films on Ti Substrate; J He, JC Jiang, EI Meletis; University of Texas, Arlington; Z Yuan, J Liu, J Weaver, CL Chen; University of Texas, San Antonio; B Lin, V Giurgiutiu; University of South Carolina; RY Guo, A Bhalla; University of Texas, San Antonio—Poster # 148.

3:30 PM 424Beam-induced Changes of FePt Nanoparticles during STEM In-situ Annealing; J Wittig; Vanderbilt University; J Bentley, LF Allard; Oak Ridge National Laboratory; MS Wellons, C Lukehart; Vanderbilt University—Poster # 149

3:30 PM 425Low Energy Electron Holography of Charged Tip; B McMorran, D Wanegar, A Cronin; University of Arizona—Poster # 150

Microbeam Analysis of Terrestrial and Planetary Materials—A Symposium in Memory of Gene Jarosewich

Poster Session: Tuesday 3:30 PM, Room: Exhibit Hall

3:30 PM 426Chromium, Vanadium and Phosphorous Contents in Garnets from the Smithsonian Institution Reference Materials Collection: a Preliminary Examination by Microanalysis; MAV Logan, BC Hearn Jr.; Smithsonian Institution—Poster # 151

Failure Analysis: Real World Applications and Case Studies

Poster Session: Tuesday 3:30 PM, Room: Exhibit Hall

3:30 PM 427Evaluation of High Temperature Alloys in a Microturbine Recuperator Test Rig; J Howe, R Trejo, L Walker; Oak Ridge National Laboratory; E Lara-Curzio; Oak Ridge National Laboratory; K More; Oak Ridge National Laboratory—Poster # 152.

Imaging Cells and Tissues in 3D—Confocal Microscopy

Session Chairs: B Rajwa, Purdue University; JP Robinson, Purdue University

Platform Session: Wednesday 8:30 AM, Room: Picuris

8:30 AM 428 (Invited) High-Throughput Multiphoton Tissue Cytometry; PTC So; Massachusetts Institute of Technology

9:00 AM 429 (Invited) Controlled Light Exposure Microscopy (CLEM) for Prolonged Live-cell Imaging and Strongly Reduced Photobleaching; R Hoebe; University of Amsterdam, The Netherlands; W de Vos; Ghent University, The Netherlands; C van Oven, P Zoon, S Lambrechts; University of Amsterdam, The Netherlands; P van Oostveldt; Ghent University, The Netherlands; D Gadella, R van Noorden, E Manders; University of Amsterdam, The Netherlands

9:30 AM 430 (Invited) Laser Sources For Improved Optical Microscopy; G McConnell; University of Strathclyde, United Kingdom

10:00 AM Coffee Break

10:30 AM 431 (Invited) The FARSIGHT Project: Associative 4D/5D Image Analysis Methods for Quantifying Complex and Dynamic Biological Microenvironments; B Roysam; Rensselaer Polytechnic Institute; W Shain; Wadsworth Center; E Robey; University of California Berkeley; Y Chen, A Narayanaswamy, C-L Tsai, Y Al-Kofahi; Rensselaer Polytechnic Institute; C Bjornsson; Rensselaer Polytechnic Institute, Wadsworth Center; E Ladi, P Herzmark; University of California Berkeley

11:00 AM 432A Novel Software Algorithm for the Quantitative Assessment of Fluorescent Reporter Proteins in Multi-Cellular Tumor Spheroids; L Le Roux, D Maxwell, D Schellingerhout, A Volgin, J Gelovani; MD Anderson Cancer Center

11:15 AM 433BioImageXD—Free Microscopy Image Processing Software; PP Kankaanpää, KA Pahajoki; University of Turku, Finland; VS Marjomäki; University of Jyväskylä, Finland; DJ White; Max Planck Institute Dresden, Germany; J Heino; University of Turku, Finland

11:30 AM 434 (MSA Presidential Student) Robust Adaptive 3-D Segmentation of Vessel Laminae from Fluorescence Confocal Microscope Images & Parallel GPU Implementation; A Narayanaswamy, S Dwarakapuram, C Bjornsson, BM Cutler; Rensselaer Polytechnic Institute; W Shain; Wadsworth Center; B Roysam; Rensselaer Polytechnic Institute

Teaching Microscopy and Microanalysis: K–12 and Outreach

Session Chairs: E Schumacher, McCrone Associates; CE Lyman, Lehigh University

Platform Session: Wednesday 8:15 AM, Room: Galisteo

8:15 AM 435 (Invited) Odyssey of a Chemical Microscopist; JG Delly; College of Microscopy

8:45 AM 436Breaking Down Barriers: Using Microscopy to Demystify Science and Change Students' Perspective of Their World; CB Johnson, AG Smith, S Vitha, A Holzenburg; Texas A&M University

9:00 AM 437Remote-Access Scanning Electron Microscopy for K-12 Students: The Bugscope Project Nine Years On; C Wallace, C Conway, AM Ray, SJ Robinson; University of Illinois at Urbana-Champaign

9:15 AM 438AFM Learning Activities for a 7–11 Grade Nanotechnology Course; DN Leonard, PE Russell; Appalachian State University

9:30 AM 439Sherlock Holmes to CSI: Microscopy in the Forensic Geology Classroom; TJ Williams; University of Idaho

9:45 AM 440Teaching Aids for Optical Mineralogy in the Geosciences; DE Kile; US Geological Survey

10:00 AM Coffee Break

10:30 AM 441 (Invited) Training Electron Microscopy Technicians; MS Kostrna; Madison Area Technical College

11:00 AM 442 (Invited) Electron Microscope Education in the Community College; F Villalovoz, C Davis; San Joaquin Delta College

11:30 AM Roundtable Discussion.

40 Years of Energy Dispersive X-ray Spectrometry

Session Chairs: DE Newbury, National Institutes of Standards and Technology; R Gauvin, McGill University

Platform Session: Wednesday 8:00 AM, Room: Aztec

8:00 AM 443 (Invited) Celebrating 40 years of Energy Dispersive X-ray Spectrometry in Electron Probe Microanalysis (EPMA); K Keil; University of Hawaii; R Fitzgerald; La Jolla; KFJ Heinrich; Rockville

8:30 AM 444 (Invited) Impact of 40 Years of Technology Advances on EDS System Performance; JJ McCarthy; University of Wisconsin; JJ Friel; Temple University; P Camus, D Rohde; Thermo Fisher Scientific

9:00 AM 445 (Invited) 35 Years of EDS Software: The More Things Change, The More They Stay the Same; F Schamber; Aspex Corporation

9:30 AM 446 (Invited) SDDs—Silicon Detectors for EDS with a Performance at the Theoretical Limit; H Soltau, A Bechtele; PNSensor, Germany; O Jaratschin, A Liebl; PNDetector, Germany; A Niculae; PNSensor, Germany; A Simsek; PNDetector, Germany; R Eckhard, K Hermenau, P Lechner, G Lutz; PNSensor, Germany; G Schaller, F Schopper, L Strüder; Max-Planck Institute Halbleiterlabor, Germany

10:00 AM Coffee Break

10:30 AM 447 (Invited) Calibration of the Detection Efficiency of Energy Dispersive X-ray Spectrometers for Absolute Intensity Measurements and for Establishing a Basis for a More Rigorous Quantitation Procedure; M Procop; BAM, Germany; F Scholze; PTB, Germany

11:00 AM 448 (Invited) A New Solid-State Detector and Counting System for Wavelength Dispersive Spectrometers; D Lesher; Advanced MicroBeam Inc; Y Diawara, S Medved, R Durst; Bruker AXS Microanalysis

11:30 AM 449The Spatial Resolution of X-Ray Microanalysis with EDS in the Transmission Electron Microscope; R Gauvin; McGill University, Canada

11:45 AM 450Compositional Mapping by X-ray Spectrum Imaging at 1 MHz Output Count Rate with the Silicon Drift Detector; DE Newbury, JM Davis, D Bright, N Ritchie; National Institute of Standards and Technology; JR Michael, PG Kotula; Sandia National Laboratories

Advances in Structure/Function Determination by Cryo-electron Microscopy

Session Chairs: T Ruiz, University of Vermont; E Bullitt, Boston University

Platform Session: Wednesday 8:30 AM, Room: San Miguel

8:30 AM 451 (MAS Distinguished Scholar) 2dx—Automated 3D Structure Reconstruction from 2D Crystal Data; B Gipson, X Zeng, H Stahlberg; University of California Davis

8:45 AM 452Testing Parameters for Two-Dimensional Crystallization and Electron Crystallography on Two Eukaryotic Membrane Proteins; G Zhao; Georgia Institute of Technology; D Müller; Technical University Dresden, Germany; DW Stafford; University of North Carolina Chapel Hill; Y Kanaoka, KF Austen; Harvard Medical School; I Schmidt-Krey; Georgia Institute of Technology

9:00 AM 453 (Invited) Asymmetric Helical Reconstruction and Its Implementation in Ruby; M Kikkawa; Kyoto University, Japan

9:30 AM 454Three-Dimensional Reconstruction of the Muscle Thin Filament Single Particle Analysis of an Asymmetric Filament; D Paul, E Morris; Institute of Cancer Research, United Kingdom; R Kensler; University of Puerto Rico Medical School; J Squire; University of Bristol, United Kingdom

9:45 AM 455Cryo TEM: A New Perspective to the Biogeochemical Associations of Bacteria and Minerals; A Dohnalkova, M Marshall, J Fredrickson; Pacific Northwest National Laboratory

10:00 AM Coffee Break

10:30 AM 456 (Invited) Tomographic Subvolume Averaging and Subvolume Classification of SIV Envelope Spike Motifs; H Winkler, P Zhu, K Roux, K Taylor; Florida State University

11:00 AM 457On The Structure of Coronaviruses: Cryo-electron Tomography of Mouse Hepatitis Virus; M Bárcena; Leiden University, The Netherlands; BJ Bosch, W Baterlink; Utrecht University, The Netherlands; GT Oostergetel; University of Groningen, The Netherlands; A Verkleij, PJM Rottier; Utrecht University, The Netherlands; AJ Koster; Leiden University, The Netherlands

11:15 AM 458Cryo-Electron Tomography of Isolated Cytoskeletons of Giardia intestinalis; C Schwartz; University of Colorado Boulder; S Dawson; University of California Davis; A Hoenger; University of Colorado Boulder

11:30 AM 459 (Invited) Using Molecular Envelope Information Derived from SAXS and EM for Cystallographic Phasing; Q Hao, Q Liu, X Hong; Cornell University

Ciliopathies

Session Chair: JL Carson, University of North Carolina

Platform Session: Wednesday 8:30 AM, Room: Taos

8:30 AM 460 (Invited) Human Ciliopathies: An Overview of The First One Hundred Years; JL Carson; University of North Carolina, Chapel Hill

9:00 AM 461 (Invited) Structural Investigations of Human Cilia from Normal and Primary Ciliary Dyskinesia Patients; ET O'Toole; University of Colorado; ME Porter; University of Minnesota; LE Ostrowski; University of North Carolina, Chapel Hill

9:45 AM 462Structural Study of Multiple Microtubule Types by Cryo-electron Microscopy; H Sui, KH Downing; Lawrence Berkeley National Laboratory

10:00 AM Coffee Break

10:30 AM 463 (Invited) Cilia Have Multiple Roles in the Development of the Vertebrate Left-Right Axis; M Brueckner, J McGrath, S Makova; Yale University School of Medicine

11:15 AM 464 (Invited) Ciliary Dysfunction in Adult Mice Results in Slowly Progressing Cystic Kidney Disease and Disrupts Energy Homeostasis; JR Davenport, A Kale, N Sharma, BK Yoder; University of Alabama, Birmingham

Understanding the Synthesis and Properties of Nanostructures and Nanomaterials: Nanocharacterization of Oxides

Session Chairs: P Voyles, University of Wisconsin; A Grigoriev, University of Wisconsin

Platform Session: Wednesday 8:30 AM, Room: Ruidoso

8:30 AM 465 (Invited) Structure of Complex Oxides in High Electric Fields; A Grigoriev, R Sichel; University of Wisconsin, Madison; HN Lee; Oak Ridge National Laboratory; CB Eom; University of Wisconsin, Madison; B Adams, EM Dufresne, Z Cai; Argonne National Laboratory; PG Evans; University of Wisconsin, Madison

9:00 AM 466Determination of Zener-Polaron-Type Charge and Orbital Ordering in Pr _1−xCa _xMnO ₃Manganite; L Wu; Brookhaven National Laboratory; RF Klie; University of Illinois; C Jooss; University of Goettingen, Germany; Y Zhu; Brookhaven National Laboratory

9:15 AM 467

Interdiffusion or Beam Spreading? Asymmetric Interface Profiles in LaVO ₃/SrTiO ₃Heterostructures; LF Kourkoutis; Cornell University; Y Hotta, T Higuchi; University of Tokyo, Japan; JM Sosa; Cornell University; HY Hwang; University of Tokyo, Japan; DA Muller; Cornell University

9:30 AM 468TEM Characterization of Microtwins in VOx Thin Films; J Li, BD Gauntt, EC Dickey; Pennsylvania State University

9:45 AM 469TEM Characterization of Nanometer-Scale Spinel/Rocksalt Phase Decomposition in Nickel Magnanite Thin Film; J Li, H Schulze, SSN Bharadwaja, EC Dickey, S Trolier-McKinstry; Pennsylvania State University

10:00 AM Coffee Break

10:30 AM 470The Life Cycle of Metal Oxide Sensors; DC Meier, B Raman, S Semancik; National Institute of Standards and Technology

10:45 AM 471Plan-view TEM Study on Interfacial Structure of (La,Ca)MnO ₃/MgO; JC Jiang, J He, EI Meletis; University of Texas, Arlington; Z Yuan, CL Chen; University of Texas, San Antonio

11:00 AM 472SrO Segregation on High-energy SrLaAlO ₄Surfaces; AE Becerra-Toledo, Y Wang, LD Marks; Northwestern University

11:15 AM 473Disordered Vanadium Oxide Thin Films for Use in Infrared Detection; BD Gauntt, J Li, J Kulik, EC Dickey; Pennsylvania State University

11:30 AM 474On Mapping Ferroelectric Fields by Medium-Resolution Electron Holography; MA Schofield, L Wu, Y Zhu; Brookhaven National Laboratory

11:45 AM 475Misfit Dislocations in Ferroelectric Thin Films; M Arredondo; University of New South Wales, Australia; M Chi; University of California, Davis; M Saunders; University of Western Australia; A Petraru; Institut für Festkörperforschung, Germany; N Valanoor; University of New South Wales, Australia; H Kohlstedt; Institut für Festkörperforschung, Germany; ND Browning; University of California, Davis

High Resolution and Analytical Characterization of Engineered Nanostructures

Session Chairs: B Foran, Aerospace Corporation; MJ Kim, University of Texas at Dallas

Platform Session: Wednesday 8:30 AM, Room: Brazos

8:30 AM 476 (Invited) Challenging Analysis for the Gate Stack and Strained Channel of the Advanced CMOS; G Lian, C Vartuli, J Chung; Texas Instruments Inc

9:00 AM 477Quantitative Strain Measurement in Sub-45 nm CMOS Transistors by Convergent Beam Electron Diffraction (CBED) at Low Temperature and Nano Beam Diffraction (NBD); L Clement; STMicroelectronics, France; D Delille; FEI Company, The Netherlands

9:15 AM 478Local Strain Measurement by Geometrical Phase Analysis in the Transmission Electron Microscope Applied to Strain-Engineered CMOS Devices; J Chung, G Lian, C Vartuli; Texas Instruments; S Rajagopalan, L Rabenberg; University of Texas

9:30 AM 479EFTEM- and STEM-EDXS Spectral Imaging of Hidden Si-based Semiconductor Device Defects; CT Schamp, BT Valdez; Cerium Labs

9:45 AM 480Strucuture of Low Loss EELS in Hf and Zr Metal, Dioxides and Silicates; R Shivaraman, AVG Chizmeshya, SK Dey, RW Carpenter; Arizona State University

10:00 AM Coffee Break

10:30 AM 481 (Invited) EBIC Targeting for Dual Beam FIB Based TEM Sample Preparation; N Presser, B Foran, Y Sin, M Mason, SC Moss; The Aerospace Corporation

11:00 AM 482 (MAS Distinguished Scholar) Tunneling Magnetoresistance and B Diffusion in CoFeB/MgO/CoFeB Magnetic Tunnel Junctions Characterized by STEM-EELS; JJ Cha, JC Read, RA Buhrman, DA Muller; Cornell University

11:15 AM 483Structural Analysis for Luminous Defects on GaN Epitaxial Layers; YC Park, MY Kim, and BK Kim; Samsung Electro-Mechanics Co, South KOREA

Ultrafast Electron Microscopy and Ultrafast Science

Session Chairs: M Taheri, Lawrence Livermore National Laboratory; N Browning, Lawrence Livermore National Laboratory; J Lewellen, Argonne National Laboratory

Platform Session: Wednesday 8:00 AM, Room: Dona Ana

8:00 AM 484 (Invited) Single-Shot Dynamic Transmission Electron Microscopy: Present and Future; B Reed, M Armstrong, ND Browning, G Campbell, W DeHope, J Kim, W King, T LaGrange, J Pesavento, B Pyke; Lawrence Livermore National Laboratory; S Raoux; IBM Almaden Research Center; R Shuttlesworth, B Stuart, M Taheri; Lawrence Livermore National Laboratory; T Topuria; IBM Almaden Research Center;

8:30 AM 485 (Invited) Lights, Action, Camera: Making Movies of Molecules (and Materials) with Femtosecond Electron Diffraction; BJ Siwick; McGill University, Canada

9:00 AM 486 (Invited) Transient Structural Studies of Nanoparticles Using Electron Diffraction; C-Y Ruan, Y Murooka, RK Raman, RA Murdick, RJ Worhatch; Michigan State University

9:30 AM 487 (Invited) Time-Resolved Electron Microscopy: Accomplishments, Challenges, and the Future Directions; V Lobastov; California Institute of Technology

10:00 AM Coffee Break

10:30 AM 488 (Invited) Dynamic Studies by Repetitively Pulsed and Pump-probe Microscopy; A Howie; University of Cambridge UK

11:00 AM 489 (Invited) Expanding In-situ Mechanical Testing into the Ultrafast Regime; EA Stach; Purdue University

11:30 AM 490 (Invited) Benefits of Aberration Correction for Ultra-Fast TEM Experiments; B Kabius; Argonne National Laboratory

Microbeam Analysis of Terrestrial and Planetary Materials—A Symposium in Memory of Gene Jarosewich

Session Chairs: EP Vicenzi, Smithsonian Institution; M Spilde, University of New Mexico

Platform Session: Wednesday 8:30 AM, Room: Cimarron

8:30 AM 491 (Invited) Challenges and Results of Real Comet Dust Analyses: The Stardust Mission; FJM Rietmeijer; University of New Mexico

9:00 AM 492X-ray Mapping Analysis of Lunar Meteorite Dhofar 961: Characterization and Origin of the Mafic Impact-Melt Component; BL Jolliff, RA Zeigler, PK Carpenter, RL Korotev; Washington University; EP Vicenzi; Smithsonian Institution; JM Davis; National Institute of Standards and Technology

9:15 AM 493 (Invited) Development of Lunar Regolith Simulant: From the Macro to the Micro; HA Lowers, DB Stoeser, SA Wilson, GP Meeker; U S Geological Survey

9:45 AM 494NanoSIMS and TEM Studies of SiC and Si ₃N ₄Supernova Condensates; RM Stroud; Naval Research Laboratory; LR Nittler, CM Alexander; Carnegie Institution of Washington; P Hoppe; Max Planck Institute for Chemistry

10:00 AM Coffee Break

10:30 AM 495 (Invited) Recent Advances in Analytical Methods Used to Study Meteorites; JI Goldstein; University of Massachusetts; JR Michael, PG Kotula; Sandia National Laboratories

11:00 AM 496Hyperspectral X-ray Analysis of Submicrometer-scale Heterogeneities in a Venerable Compositional Standard Provided by Nature: Kakanui Hornblende; EP Vicenzi, T Rose; Smithsonian Institution

11:15 AM 497Nanobeam Analysis of the Oxidation States of Transition Metals in Primitive Planetary Materials; TJ Zega; Naval Research Laboratory; AD Kilcoyne; Lawrence Berkeley National Laboratory; RM Stroud; Naval Research Laboratory

11:30 AM 498 (Invited) Mineral Recorders of Martian History: Reading the Record with Microbeam Trace Element Analyses.; CK Shearer, PV Burger, JJ Papike, J Karner; University of New Mexico

Nuclear and Reactive Materials

Session Chairs: I Davidson, AWE, United Kingdom; A Lockley, Atomic Energy of Canada Ltd.

Platform Session: Wednesday 8:00 AM, Room: Pecos

8:00 AM 499 (Invited) What's New With U: Recent Advances In Uranium Metallography; A Kelly, D Thoma, R Field, P Dunn, D Teter; Los Alamos National Laboratory

8:30 AM 500 (Invited) Ion Beam Surface Preparation of Uranium for EBSD; D Carpenter; Y-12 National Security Complex

9:00 AM 501 (Invited) Electron Backscatter Diffraction (EBSD) Characterization of Twinning Related Deformation and Fracture in alpha-Uranium; R McCabe, R Field, D Brown, D Alexander, C Cady; Los Alamos National Laboratory

9:30 AM 502 (Invited) Preparation of Metal Surfaces for Optical Metallography and EBSD using Ion Beam Polishing; R Bridges; Y-12 National Security Complex

10:00 AM Coffee Break

10:30 AM 503Understanding Stress Corrosion Cracking with Electron Tomography; S Lozano-Perez; University of Oxford, United Kingdom; L Cervera Gontard; Danish Technical University, Denmark

10:45 AM 504Microstructural Analysis of Pb-Induced Transgranular SCC of Alloy 690 in PbO + 10% NaOH Solution; MG Burke, RE Hermer; Bechtel Bettis, Inc; M Phaneuf; Fibics, Inc

11:00 AM 505Oxide Nanoparticle Dispersion in an ODS/Fe12Cr Model Alloy; V de Castro, ML Jenkins; University of Oxford, United Kingdom

11:15 AM 506High-Resolution Characterization of Oxygen Incorporation in Erbium Dihydride Thin Films; C Parish, C Snow, L Brewer; Sandia National Laboratories

11:30 AM 507Cathodoluminescence Microcharacterization of Electron Irradiation Induced Defects in Borosilicate Glasses; MA Stevens-Kalceff; University of New South Wales, Australia

Technologists' Forum Platform: Geology of the Southwest US Revealed Through M&M

Session Chair: V Woodward, Lubrizol Advanced Materials

Platform Session: Wednesday 9:00 AM, Room: Mesilla

9:00 AM 508 (Invited) Microprobing Minerals; P Hlava; Access to Gems & Minerals, Inc

9:30 AM 509 (Invited) New Mexico Underground: Extreme Geomicrobiology of Caves in the Southwest; MN Spilde; University of New Mexico; PJ Boston; New Mexico Institute of Mining and Technology; DE Northup; University of New Mexico; L Melim; Western Illinois University

10:00 AM Coffee Break

10:30 AM 510 (Invited) Gemstone Synthesis; P Hlava; Access to Gems & Minerals, Inc

Joint Tutorial: ImageJ: A Useful Tool for Image Processing and Analysis

Session Chairs: A Dohnalkova, Pacific Northwest National Laboratory; G Thompson, University of Alabama

Platform Session: Wednesday 9:00 AM, Room: La Cienega

9:00 AM 512 (Invited) An Introduction to ImageJ: A Useful Tool for Biological Image Processing and Analysis; JB Sheffield; Temple University

Physical Tutorial: Electron-Probe Microanalysis (EPMA): An Overview for Beginners and a Status Report for Experts

Session Chair: G Thompson, University of Alabama

Platform Session: Wednesday 10:30 AM, Room: La Cienega

10:30 AM 511 (Invited) Electron-Probe Microanalysis (EPMA): An Overview for Beginners and a Status Report for Experts; PK Carpenter; Washington University

Imaging Cells and Tissues in 3D—Confocal Microscopy

Session Chairs: JP Robinson, Purdue University; B Rajwa, Purdue University

Platform Session: Wednesday 1:30 PM, Room: Picuris

1:30 PM 513 (Invited) Confocal Microscopy Reveals Molecular Interactions Between DNA-binding Drugs and Chromatin in Live Cells; JW Dobrucki, K Wojcik; Jagiellonian University, Poland

2:00 PM 514 (Invited) Confocal Microscopy and Optical Contrast Agents for In Vivo Detection Of Cancer; MC Pierce, DJ Javier, N Nitin, RT Kester, T Tkaczyk; Rice University; A Gillenwater; M D Anderson Cancer Center; R Richards-Kortum; Rice University

2:30 PM 515 (Invited) Confocal Microscopy of Thick Tissue Sections: 3D Visualization of Rat Kidney Glomeruli; RM Zucker, J Rogers, R Ellis-Hutchings; USEPA

Advanced CARS Microscopy in Biology: Methods and Applications for Cellular and Tissue Imaging

Session Chairs: M Vogel, Harvard University; R Schalek, Harvard University

Platform Session: Wednesday 1:30 PM, Room: Taos

1:30 PM 516 (Invited) Driving CARS into Biomedical Field; J-X Cheng; Purdue University

2:00 PM 517 (Invited) Simple High Performance Multi-modal Coherent Anti-Stokes Raman Scattering (CARS) Microscopy Based on a Two-Photon Microscope; A Pegoraro, A Ridsdale, RK Lyn, JP Pezacki, A Stolow; Steacie Institute for Molecular Sciences, National Research Council, Canada

2:30 PM 518 (Invited) Combined χ(3) Microscopy of the Peripheral Nervous Tissue; CP Pfeffer; Harvard Medical School; M Vogel; Harvard University; BR Olsen; Harvard Medical School; F Ganikhanov; West Virginia University

Teaching Microscopy and Microanalysis: Manufacturer and Remote Training

Session Chairs: CE Lyman, Lehigh University; E Schumacher, McCrone Associates

Platform Session: Wednesday 1:30 PM, Room: Galisteo

1:30 PM 519 (Invited) Manufacturer Training of Electron Microscopists: X-ray Microanalysis; N Rowlands, A Drake; Oxford Instruments Inc

2:00 PM 520 (Invited) Remote Teaching for Electron Microscopy; TC Isabell; JEOL USA, Inc; T Kobayashi, Y Ohkura; JEOL Ltd, Japan; RM O'Donnell; O'Donnell Engineering

2:30 PM 521The Electron Microscopy Database: Example Data Sets for Teaching and Learning Quantitative TEM; PM Voyles; University of Wisconsin Madison

2:45 PM 522Remote Microscopy for Education and Outreach; S Seraphin, G Chandler; University of Arizona; M Sellers; Northern Arizona University; D Bentley, K Dorame; University of Arizona; S Hernandez; Pima Community College

3:00 PM 523Remote Microscopy for Training Groups of Student Users; JF Mansfield; University of Michigan

3:15 PM Roundtable Discussion

40 Years of Energy Dispersive X-ray Spectrometry

Session Chairs: R Gauvin, McGill University; DE Newbury, National Institutes of Standards and Technology

Platform Session: Wednesday 1:30 PM, Room: Aztec

1:30 PM 524Advances in the Technology of Silicon Drift Detectors (SDD) and Multiple Element SDD; R Terborg, M Rohde; Bruker AXS Microanalysis GmbH, Germany

1:45 PM 525Performance Comparison of SDDs with Si(Li)s for Performance Comparison of SDDs with Si(Li)s for SEM/EDS Analysis; NC Barbi; PulseTor, LLC; ET Dobi; SEMTech Solutions, Inc; SD DaVilla; 4pi Analysis, Inc; RM Mott; PulseTor, LLC

2:00 PM 526Analyzing and Expanding the Detector Efficiency of Silicon Drift Detectors; A Niculae, H Soltau, P Lechner, G Lutz, A Bechtele, R Eckhardt, K Hermenau; PNSensor GmbH, Germany; A Liebel, O Jaritschin, A Simsek; PNDetector GmbH, Germany; G Schaller, F Schopper, L Strüder; Max-Planck Institute Halbleiterlabor, Germany

2:15 PM 527Performance of a Commercial Silicon Drift Detector for X-ray Microanalysis; EA Kenik; Oak Ridge National Laboratory

2:30 PM 528Determination of the Efficiency of Energy Dispersive X-ray Spectrometers with an EDS-CRM Reference Specimen; H Demers, R Gauvin; McGill University, Canada

2:45 PM 529Results from Two Four-Channel Si-drift Detectors on an SEM: Conventional and Annular Geometries; PG Kotula, JR Michael; Sandia National Laboratories; M Rohde; Bruker AXS Microanalysis GmbH, Germany

3:00 PM 530 (Invited) DTSA-II: A New Tool for Simulating and Quantifying EDS Spectra—Application to Difficult Overlaps; N Ritchie, JM Davis, DE Newbury; National Institute of Standards and Technology

Advances in Structure/Function Determination by Cryo-electron Microscopy

Session Chairs: E Bullitt, Boston University; T Ruiz, University of Vermont

Platform Session: Wednesday 1:30 PM, Room: San Miguel

1:30 PM 531Intermolecular Contacts Required to Form Planar Lattices of Poliovirus RNA-dependent RNA Polymerase; AB Tellez; Stanford University School of Medicine; J Wang; Boston University School of Medicine; J Spagnolo, K Kirkegaard; Stanford University School of Medicine; E Bullitt; Boston University School of Medicine

1:45 PM 532Structure Analysis of Complex I and Functional Implications; T Clason, T Ruiz; University of Vermont; V Zickermann, U Brandt; Universität Frankfurt, Germany; G Peng, H Michel; Max-Planck-Institut für Biophysik, Germany; M Radermacher; University of Vermont

2:00 PM 533Structure of the Human 26S Proteasome Determined by Electron Microscopy: Subunit Rearrangement Opens the Gate into the Proteolytic Core.; P da Fonseca, E Morris; Institute of Cancer Research, United Kingdom

2:15 PM 534 (Invited) Global Interactive Docking and Hessian Filtering for Multi-Resolution Fitting of Biomolecular Assemblies; J Heyd, S Birmanns; University of Texas Houston

2:45 PM 535Domain Exploration in Lipid Mono- and Bilayer on Nano-resolution Scale Using Freeze-fracture Electron Microscopy; B Papahadjopoulos-Sternberg, J Ackrell; NanoAnalytical Laboratory

3:00 PM 536 (Invited) Novel Methods for Cryo-Fluorescence Microscopy Permitting Correlative Cryo-Electron Microscopy; J Valentijn, L van Driel; Leiden University, The Netherlands; A Agronskaia; Utrecht University, The Netherlands; K Knoops, R Koning, M Bárcena; Leiden University, The Netherlands; H Gerritsen; Utrecht University, The Netherlands; AJ Koster; Leiden University, The Netherlands

Understanding the Synthesis and Properties of Nanostructures and Nanomaterials: In-situ Synthesis and Characterization

Session Chairs: ZW Shan, Hysitron Inc; P Kruit, Delft University of Technology, Netherlands

Platform Session: Wednesday 1:30 PM, Room: Ruidoso

1:30 PM 537 (Invited) Synthesis of Nanostructures using Electron Beam Induced Deposition; P Kruit, W van Dorp, K Hagen; Delft University of Technology, Netherlands; PA Crozier; Arizona State University

2:00 PM 538Fabrication and Application of Nanopores using TEM, STEM and Ion Beams; DC Bell; Harvard University

2:15 PM 539In situ Microscopy: A Tool to Understand Mechanisms; J Basu; University of Connecticut; R Divakar; Indira Gandhi Centre for Atomic Research, India; JP Winterstein; University of Connecticut; N Ravishankar; Indian Institute of Science, India; CB Carter; University of Connecticut

2:30 PM 540Nanopatterning and Grain Growth in Fluorides; G Moebus, J Tsai; University of Sheffield, United Kingdom

2:45 PM 541 (Invited) Exploring the Mechanical Properties of Nanostructures and Nanomaterials inside a TEM; ZW Shan; Hysitron Inc; A Minor; Lawrence Berkeley Laboratory; SA Syed Asif, OL Warren; Hysitron Inc

3:15 PM 542Self Healing Nanoparticles: In-situ High-Resolution TEM Indentation of Nanoparticles; CE Carlton, PJ Ferreira; University of Texas, Austin

High Resolution and Analytical Characterization of Engineered Nanostructures

Session Chair: RW Carpenter, Arizona State University

Platform Session: Wednesday 1:30 PM, Room: Brazos

1:30 PM 543 (Invited) In-Situ Probing the Electrical, Mechanical, and Thermal Properties of Individual Carbon Nanotubes and Nanowires by using a TEM-SPM Platform; J-Y Huang; Sandia National Laboratories

2:00 PM 544In-Situ Characterization of 2D Potential Distributions in Biased Si n+-p Junctions Using Off-Axis Electron Holography; MG Han, T Hirayama; The Japan Fine Ceramics Center, Japan; DJ Smith, MR McCartney; Arizona State University

2:15 PM 545p-n Junction Observation in a Single Transistor Device by In-situ TEM Electrical Measurement; SY Park, D Cha; University of Texas, Dallas; O Lourie; Nanofactory Instruments AB; MJ Kim; University of Texas, Dallas

2:30 PM 546Study of Epitaxial Germanium Quantum Dots in Silicon by Off-axis Electron Holography; L Li, MR McCartney, DJ Smith, S Ketharanathan, J Drucker; Arizona State University

2:45 PM 547Electrostatic Potential Mapping across AlGaAs/AlAs/GaAs Heterostructure; S Chung, DJ Smith, MR McCartney; Arizona State University

3:00 PM 548Microstructural and Radial Distribution Function Analysis of Hydrogenated Silicon, Germanium, and Silicon-Germanium Alloy Thin Films; DB Saint John, NJ Podraza, BD Gauntt, J Li, EC Dickey; The Pennsylvania State University

3:15 PM 549Quantitative Chemical Mapping of Engineered Interfaces in Quaternary III-V Semiconductor Heterostructures Using Phase Retrieval High Resolution Transmission Electron Microscopy; K Mahalingam, H Haugan, G Brown, K Eyink; Air Force Research Laboratory

Ultrafast Electron Microscopy and Ultrafast Science

Session Chairs: M Taheri, Drexel University N Browning, Lawrence Livermore National Laboratory; J Lewellen, Argonne National Laboratory

Platform Session: Wednesday 1:30 PM, Room: Dona Ana

1:30 PM 550 (Invited) Optimization of Ultrafast Photo-electron Sources for DTEM; WA Schroeder; University of Illinois at Chicago

2:00 PM 551 (Invited) Extreme Beams for Single-shot Ultrafast Electron Diffraction; J Luiten, T Van Oudheusden; Eindhoven University of Technology, Netherlands; B Siwick; McGill University, Canada; E De Jong; FEI Company, Netherlands; W Op 't Root, B Van der Geer; Eindhoven University of Technology, Netherlands

2:30 PM 552 (Invited) Review of Single Shot Electron Diffraction Experiments with Sub ps Resolution Using an RF Gun Electron Source; J Schmerge; Stanford Linear Accelerator Center

2:45 PM 553 (Invited) Optimizing the RF Photoinjector for Ultra-fast Electron Diffraction; JB Rosenzweig; University of California, Los Angeles

3:00 PM 554 (Invited) A Quantum-degenerate Electron Source; M Zolotorev; Lawrence Berkeley National Laboratory; E Commins; University of California Berkeley; F Sannibale; Lawrence Berkeley National Laboratory

Microbeam Analysis of Terrestrial and Planetary Materials—A Symposium in Memory of Gene Jarosewich

Session Chairs: GP Meeker, U.S. Geological Survey; M Spilde, University of New Mexico

Platform Session: Wednesday 1:30 PM, Room: Cimarron

1:30 PM 555 (Invited) Systematics of Cathodoluminescence and Trace Element Compositional Zoning in Natural Quartz from Volcanic Rocks: Ti mapping in Quartz; WP Leeman; National Science Foundation; EP Vicenzi; Smithsonian Institution; CM MacRae, NC Wilson, A Torpy; CSIRO, Australia; C-TA Lee; Rice University

2:00 PM 556Smithsonian Microbeam Standards: Not Just Our Father's Microprobe Standards; TR Rose; Smithsonian Institution

2:15 PM 557EPMA Standards: The Good, the Bad, and the Ugly; PK Carpenter; Washington University

2:30 PM 558 (Invited) Quantitative Mineralogy of Fine-grained Sedimentary Rocks: A Preliminary Look at QEMSCAN®; RI Grauch, DD Ebrel; US Geological Survey; AR Butcher, PWSK Botha; Intellection Pty Ltd, Australia

3:00 PM 559 (Invited) Laser Ablation ICP-MS in Geochemistry and Biogeochemistry: A Progress Report; WI Ridley, AE Koenig, MJ Pribil; US Geological Survey

It's a Family Affair!

Session Chairs: E Humphrey, Vancouver General Hospital; Canada; C Schooley, Project MICRO; MG Burke, Bechtel Bettis, Inc.

Platform Session: Wednesday 1:30 PM, Room: Santa Ana

1:30 PM It's a Family Affair: CSI Albuquerque

Nuclear and Reactive Materials

Session Chairs: A Lockley, Atomic Energy of Canada Ltd.; I Davidson, AWE, United Kingdom

Platform Session: Wednesday 1:30 PM, Room: Pecos

1:30 PM 560 (Invited) Microanalysis of Plutonium; M Matthews; AWE, United Kingdom

2:00 PM 561 (Invited) Surface Preparation of Uranium and Uranium Alloys for Electron Microscopy; T Cartwright; AWE, United Kingdom

2:30 PM 562Growth of Inclusions in Uranium-Niobium Alloy; M Brierley; AWE, United Kingdom

Technologists' Forum Special Topic Session: EM Preparation Revisited—Dealing with the Nanoworld

Session Chair: Valerie Woodward, Lubrizol Advanced Materials

Platform Session: Wednesday 1:30 PM, Room: Mesilla

1:30 PM 563 (Invited) Nanotech Drives Imaging Toward Faster, Sleeker, More Economic; B Foster; The Microscopy & Imaging Place, Inc

2:00 PM 564 (Invited) Advances in TEM Sample Preparation Using a Focused Ion Beam; B Van Leer, LA Giannuzzi; FEI Company

2:30 PM 565 (Invited) Sample Preparation Considerations for Electron Microscopy Characterization of Nano-Materials; SD Walck; South Bay Technology, Inc

Joint Tutorial: Stereological Characterization of the Geometry of Three Dimensional Microstructures

Session Chairs: G Thompson, University of Alabama; A Dohnalkova, Pacific Northwest National Laboratory

Platform Session: Wednesday 2:00 PM, Room: La Cienega

2:00 PM 566 (Invited) Stereological Characterization of the Geometry of Three Dimensional Microstructures; RT DeHoff; University of Florida

Imaging Cells and Tissues in 3D—Confocal Microscopy

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 567 (MSA Presidential Student) A Fluorescence Technique for Identifying Distribution of Endophytic Fungi in Perennial Grass; K Kane, GP Cheplick, WJ L'Amoreaux; CUNY College of Staten Island—Poster # 153

3:30 PM 568Optimizing Imaging of 3D Multicellular Tumor Spheroids with Fluorescent Reporter Proteins using Confocal Microscopy; L Le Roux, D Schellingerhout, A Volgin, D Maxwell; MD Anderson Cancer Center; K Ishihara; Olympus America; J Gelovani; MD Anderson Cancer Center—Poster # 154

Hyperspectral Imaging, Cathodoluminescence, and Soft X-ray Analysis

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 569Enhancing the Field of View for Cathodoluminescence Spectrum Imaging in the Scanning Electron Microscope; D Stowe; Gatan, United Kingdom; P Thomas; Gatan; S Galloway; Gatan, United Kingdom—Poster # 155

3:30 PM 570Enhanced Mapping of C Ka with a Grazing-incidence X-ray Optic; G Brown, D O'Hara; Parallax Research, Inc—Poster # 156.

TEM Accessory Instrumentation and Automation

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 571Automated 3D Reconstruction of Serial Electron Microscopy Image Sequences Using Object Recognition; Y Lu, S Shaham; Rockefeller University—Poster # 157

3:30 PM 572Development of Double-Probe Piezo-Driving Holder for TEM; K Yamazaki, I Ishikawa, S Deguchi, Y Kondo; JEOL Japan; Y Murakami, D Shindo; Tohoku University, Japan—Poster # 158

3:30 PM 573Development of Stage-Scanning Type Confocal STEM; A Hashimoto, M Takeguchi; National Institute for Materials Science, Japan; M Shimojo; Saitama Institute of Technology, Japan; K Mitsuishi, K Furuya; National Institute for Materials Science, Japan—Poster # 159

3:30 PM 574Use of a Commercial RF Plasma Cleaner in Eliminating Adventitious Carbon Contamination in an XPS System; E Strein, D Allred; Brigham Young University—Poster # 160

3:30 PM 575Reduction of Electron Beam Induced Specimen Contaminations by Chemical Cleaning of a TEM Column Using Oxygen Plasma; S Horiuchi; AIST, Japan; T Hanada, M Ebisawa; Consult Zeroloss Imaging, Japan—Poster # 161

3:30 PM 576Soft-X-ray Emission Spectroscopy Study of Transition Intensities from the Valence Band to 3D Core-Hole of Lanthanide Oxides; M Terauchi, Y Yoneda; Tohoku University, Japan—Poster # 162

Teaching Microscopy and Microanalysis

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 577Electronic Training Resource for Higher Education; K Schierbeek, SE Hill, OP Mills; Michigan Technological University—Poster # 163

3:30 PM 578Coloring Pictures for Electron Microscopists, or Elements of Digital Image Manipulation for Students; VM Dusevich, JD Eick; University of Missouri Kansas City—Poster # 164

3:30 PM 579SEM Remote Control with a 3D Option; F Mighela; Telemicroscopy Laboratory, Italy; C Perra; University of Cagliari, Italy; R Pintus; 3D Model Laboratory, Italy; S Podda; Telemicroscopy Laboratory, Italy; M Vanzi; University of Cagliari, Italy—Poster # 165

3:30 PM 580Do-It-Yourself Web-Based Diagnosis for the Scanning Electron Microscope; NHM Caldwell, MT Bui, J Naran, DM Holburn, BC Breton; University of Cambridge, United Kingdom—Poster # 166

3:30 PM 581Opportunities and Challenges Growing a User Base in a Multi-User Facility; LA Dempere; University of Florida—Poster # 167

Advances in Electron Tomography for the Physical and Biological Sciences

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 582Identifying Individual Scaffolding Molecules in the Postsynaptic Density; X Chen, C Winters, R Azzam, V Crocker; National Institutes of Health; X Li; Columbia University; J Galbraith, RD Leapman, TS Reese; National Institutes of Health—Poster # 168

3:30 PM 583Localizing Kinetochores in Condensin Deficient DT40 Cells Using Same Cell Correlative Confocal Light Microscopy/Electron Tomography; Y Dong; Wadsworth Center; P Vagnarelli; University of Edinburgh, Scottland; X Meng; Wadsworth Center; S Ribeiro, WC Earnshaw; University of Edinburgh, Scottland; BF McEwen; Wadsworth Center—Poster # 169

3:30 PM 584New Frontiers in Cryo-electron Tomography with Zernike Phase Contrast Imaging for Transmission Electron Microscopy; B Armbruster; JEOL; J Brink; JEOL; H Furukawa; JEOL, Japan; TC Isabell, M Kawasaki, M Kersker; JEOL—Poster # 170

3:30 PM 585Electron Tomography for Analysis of Catalysts; R Cieslinski; Dow Chemical Company; C Kuebel; Fraunhofer Institute for Manufacturing Technology and Applied Materials Research, Germany; S Rozeveld, R Bowman; Dow Chemical Company—Poster # 171.

40 Years of Energy Dispersive X-ray Spectrometry

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 586Sum Peaks in Energy-Dispersive X-ray Spectroscopy; A Eades; Lehigh University—Poster # 172

3:30 PM 587Characterizing EDS Coincidence Detection At High Rates For Low Energies; RB Mott; PulseTor LLC—Poster # 173

3:30 PM 588Rutile Rock: Ti-L, O-K Peak Deconvolution in the Presence of Fe-K; P Camus, D Rohde, B Leite; Thermo Scientific—Poster # 174

21st Century Scanning Microscopy—Electrons and He Ions

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 589Microscopic Characterization of Agave Tequilana Weber var. Azul Fibers from Agroindustrial Waste in Activated Carbon Production; L Ballinas, L Manjarrez; Autonomous University of Chihuahua, Mexico; V Fierro, A Celzard; Universite Henri Poincare, France; A Goncalves, G Moraes-Rocha; Sao Paulo University, Brazil; G Gonzalez-Sanchez; Advanced Materials Research Center, Mexico—Poster # 175

3:30 PM 590Study of Microscopic Structure of Cellulose and Lignin Based Membranes; L Ballinas, L Manjarrez, MA Hermosillo, R Valdez; Autonomous University of Chihuahua, Mexico; A Goncalves, G Moraes-Rocha; Sao Paulo University, Brazil; G Gonzalez-Sanchez; Advanced Materials Research Center, Mexico—Poster # 176

3:30 PM 591Beam Skirting Effects on Energy Deposition Profile in VP-SEM; BD Myers, Z Pan, VP Dravid; Northwestern University—Poster # 177

3:30 PM 592Automated Image Acquisition at High Spatial Resolutions in a Field Emission Gun Scanning Electron Microscope; J Blackson, CS Todd; The Dow Chemical Company; G Bar; Dow Olefinverbund GmbH, Germany; D Reuschle; The Dow Chemical Company; M Janus; FEI Company, Netherlands; M Darus, A Nickles; FEI Company—Poster # 178

3:30 PM 593A Comparison of Backscatter Electron, R-filter, and Scanning Transmission Imaging of Sectioned Resin Embedded Biological Materials in Field Emission Scanning Electron Microscope; N Erdman, CH Nielsen; JEOL USA; CA Ackerley; Hospital for Sick Children, Toronto, Canada—Poster # 179

3:30 PM 594Design and Development of an Ultra High Vacuum Variable Pressure Scanning Electron Microscope for Dynamical Studies of Nanostructures; M Klein; VisiTec Microtechnik GmbH, Germany; S Kodambaka; University of California Los Angeles; P Marienhoff; VisiTec Microtechnik GmbH, Germany—Poster # 180

3:30 PM 595Surface Interactions and Phase Transformations During the Synthesis of Ni Nanoparticles on a Mica Support; S Chenna, PA Crozier; Arizona State University—Poster # 181

3:30 PM 596Advances in Low and Ultra-Low Energy, High-Resolution SEM; L Roussel, DJ Stokes; FEI Company, The Netherlands; RJ Young; FEI Company, USA; I Gestmann; FEI Company, The Netherlands—Poster # 182

3:30 PM 597A Study of Low or Ultra-Low Voltage SEM Imaging for Mesoporous Materials; S Takeuchi, A Miyaki, H Ito, T Sawahata, M Nakagawa; Hitachi High-Technologies Corporation, Japan; S Kataoka, Y Inagi, A Endo; National Institute of Advanced Industrial Science and Technology, Japan—Poster # 183

3:30 PM 598Production and Measurement of Sputtered Iridium; P Savage, JF Mansfield; University of Michigan—Poster # 184

3:30 PM 599Recent Applications Development with the Helium Ion Microscope; L Scipioni; Carl Zeiss SMT, Inc—Poster # 185

3:30 PM 600Strain and its Contrast Mechanisms in Crystalline Materials Imaged with FE-SEM; H Jaksch; Carl Zeiss SMT Inc—Poster # 186.

New Analytical Techniques in Microbeam Analysis

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 601Combined EPMA and SHRIMP Analyses of Xenotime to Interpret the Geochronological Record; HA Lowers, JN Aleinikoff, FK Mazdab; U S Geological Survey—Poster # 187

3:30 PM 602Comparing the Effects of Different Gas Mixtures and Vacuum Chamber Geometries on the Evactron® Cleaning Process; CG Morgan, R Vane; XEI Scientific, Inc—Poster # 188

3:30 PM 603Quantitative X-ray Analysis in the Variable Pressure SEM: The Effect of Gas Composition, Pressure, and Detector Geometry; SJ Bean, VM Kugler; Carl Zeiss SMT Ltd, United Kingdom—Poster # 189

3:30 PM 604Al-Ir Compounds and the Problem of Light Element-Heavy Element Matrix Corrections in EPMA: Application of PENEPMA Monte Carlo Modeling; J Fournelle, C Zhang, YA Chang; University of Wisconsin Madison—Poster # 190

3:30 PM 605The Intensity Changes of Ultra-soft X-ray Spectra of Several Light Element Oxides; S Fukushima, T Ogiwara, T Kimura; National Institute for Materials Science, Japan; K Tsukamoto, T Tazawa; JEOL Ltd Japan; S Tanuma; National Institute for Materials Science, Japan—Poster # 191

3:30 PM 606Infrared Microprobe Analysis of Minerals Using Internal Reflection Spectroscopy; JA Reffner; Smiths Detection; BA Weinger; John Jay College of Criminal Justice; PE Leary; Smiths Detection—Poster # 192

Advances in Structure/Function Determination by Cryo-electron Microscopy

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 607Yeast Phosphofructokinase: Correlating Kinetic Behavior and Structural Conformations; S Benjamin, M Bárcena; University of Vermont; A Edelmann, J Bär, G Kopperschläger; Universität Leipzig, Germany; M Radermacher, T Ruiz; University of Vermont—Poster # 193

3:30 PM 608The Role of Dynamin Domains in Membrane Constriction; P Ray, S Fang, JA Mears, JE Hinshaw; National Institutes of Health—Poster # 194

3:30 PM 609Serial Acquisition of Dual Axis EM Tomographic Data; S Zheng, M Braunfeld, J Sedat, D Agard; University of California San Francisco—Poster # 195

3:30 PM 610Image Information Transfer Through a Post-Column Energy Filter with Detection by a Lens-Coupled Transmission-Scintillator CCD Camera; U Luecken, PC Tiemeijer; FEI, The Netherlands; M Barfels, P Mooney, B Bailey; Gatan; D Agard; University of California San Francisco—Poster # 196

3:30 PM 611Titan Krios: Automated 3D Imaging at Ambient and Cryogenic Conditions; M Storms, R Wagner, U Luecken, W Hax, M Harris; FEI, The Netherlands—Poster # 197

3:30 PM 612Pushing Back the Frontiers of CRYO in 120 kV TEMs; SA Hiller, C Dietl, V Seybold, M Thaler, G Benner; Carl Zeiss SMT, Germany—Poster # 198

Microscopy Techniques for Ceramics and Composites

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 613Liquid-Phase Bonding of Yttria Stabilized Zirconia to Iron-Nickel Alloy 52 for Application in Solid Oxide Fuel Cells; K Hendricks, R Hyers; University of Massachusetts, Amherst; G Hendricks; University of Massachusetts Medical School, Worcester—Poster # 199

3:30 PM 614Effect of Cathode Microstructure on the Cathode Polarization in the Sintered, Strontium-Doped Lanthanum Manganite/Yttria Stabilized Zirconia Solid, Oxide Fuel Cells; A Chen, J Smith, RT DeHoff, E Wachsman, J Bourne, K Jones; University of Florida—Poster # 200

Structural Basis of Disease

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 615Endoplasmic Reticulum Proteins BiP and PDI are Localized to Lamellar Bodies of Alveolar Type 2 Epithelial Cells; C-L Na, R Ridsdale, TE Weaver; Cincinnati Children's Hospital Medical Center—Poster # 201

3:30 PM 616Microscopic Study of Human Alveolar Macrophages; TA Ba-Omar, B Al-Riyami; Sultan Qaboos University, Oman—Poster # 202.

3:30 PM 617Lung Endothelial Cells Express ALCAM on Released Exosomes/Microparticles; J King, E Syklawer, H Chen, J Resmondo, F McDonald, T Stevens, L Shevde; University of South Alabama; S Ofori-Acquah; Emory University; T Moore, N Bauer; University of South Alabama—Poster # 203

3:30 PM 618Rheumatic Heart Disease Revisited II Acute Parietal Endocarditis Another Piece in the Unsolved Puzzle; S Siew; Michigan State University—Poster # 204

3:30 PM 619Thrombocytopathy and Leukocytopathy in X-linked Myopathy with Excessive Autophagy (XMEA); CA Ackerley, N Ramachandran, I Munteanu; Hospital for Sick Children; H Kalimo; University and University Hospital of Helsinki; BA Minassian; Hospital for Sick Children—Poster # 205

3:30 PM 620Ultrastructural Alterations in Arabidopsis thaliana dj1c Null Mutant Cotyledons; H Chen, J Frey, T Nazarenus, C Elowsky, J Stone; University of Nebraska-Lincoln—Poster # 206

3:30 PM 621Microscopic Analysis of Lead Accumulation in Tobacco (Nicotiana tabacum var. turkish) Roots; R Al-Khatib; New Mexico State University; J Zhao; University of South Carolina; DA Blom; University of South Carolina; K Ghoshroy; University of South Carolina Sumter; R Creamer; New Mexico State University,; S Ghoshroy; University of South Carolina—Poster # 207

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 622Long-Term Administration of Ciprofloxacin as the Cause of Ultrastructural Changes in the Liver and Disturbance of Its Functional Balance; W Matysiak, B Jodlowska-Jedrych, E Kifer-Wysocka, J Romanowska-Sarlej, K Czerny; Medical University of Lublin—Poster # 208

Understanding the Synthesis and Properties of Nanostructures and Nanomaterials

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 623Microstructure Characterization of FePt/Ti/Si Thin Films; Y Zhang; Massachusetts Institute of Technology; J Wan, GC Hadjipanayis; University of Delaware—Poster # 209

3:30 PM 624Crystal Structure of TiO ₂Nano-particles; S Pokrant; Carl Zeiss SMT Inc, Germany; S Irsen; Forschungszentrum Caesar, Germany—Poster # 210

3:30 PM 625Effect of Nitrogen Incorporated Methods on Optical Properties of InAs/GaAs Quantum Dots; H Chiung-Chih, H Ray-Quen, W Yue-Han, C Jenn-Fang; National Chiao-Tung University, Taiwan, R O C; C Tung-Wei, C Chen-Hao; Industrial Technology Research Institute, Taiwan, R O C; C Mao-Nan; National Chiao-Tung University, Taiwan, R O C—Poster # 211

3:30 PM 626Modeling of Periodic Ordered Nanostructures:Shape-evolution and Shape-Control During Precipitation of Inorganic Precursors and Urea; S Bakardjieva, V Stengl, J Subrt; Academy of Science Czech Republic, Czech Republic—Poster # 212

3:30 PM 627 (MSA Presidential Student) Electron Microscopy Analysis of CdS Coated Diatom Cell Walls; T Gutu, J Jiao; Portland State University; C Jeffryes, C-H Chang, GL Rorrer; Oregon State University—Poster # 213

3:30 PM 628ELNES of Al-Al ₄C ₃Nanoparticles Produced By Mechanical Milling; A Santos, S Maldonado; Universidad Autónoma de Zacatecas, Mexico; R Martinez, F Espinosa, H Flores, V Gallegos; Centro de Investigación en Materiales Avanzados, Mexico—Poster # 214

3:30 PM 629Selective Dealloying with Supercritical Carbon Dioxide; K Dorame, R Morrish, A Muscat; University of Arizona—Poster # 215

3:30 PM 630Pt Nanoparticles by EELS and Ab-initio Calculations; Y Gochi-Ponce, V Gallegos-Orozco; Advanced Materials Research Center, Mexico; A Santos-Beltran; Universidad Autónoma de Zacatecas, Mexico; R Martinez-Sanchez, F Espinosa-Magaña; Advanced Materials Research Center, Mexico—Poster # 216.

3:30 PM 631Microstructural Characterization of Aluminum-Silver Nanoparticles Composites Produced by Mechanical Milling; D Mendoza, I Estrada, W Antunez, R Martinez; Centro de Investigación en Materiales Avanzados, Mexico—Poster # 217

3:30 PM 632Phase Separation and Crystallization of Magnetic Nanoparticles in a Borosilicate Glass; MA Laurenzi III, IL Pegg; Catholic University of America—Poster # 218

3:30 PM 633XAS and Grazing Angle XRD of the CoTi ₂Thin Films Grown by DC Co-Sputtering Technique; I Yocupicio-Villegas, H Esparza Ponce, JA Duarte Moller; Cenro de Investigacion en Materiales, Mexico—Poster # 219

3:30 PM 634Complementary Microscopy Techniques for Characterizing Nanostructures; J Basu; University of Connecticut; R Divakar; Indira Gandhi Centre for Atomic Research, India; N Ravishankar; Indian Institute of Science, India; CB Carter; University of Connecticut—Poster # 220

3:30 PM 635Coupling LEAP and HRSTEM to Study the Nanoscale Structure and Chemistry of Interfaces; R Srinivasan, A Genç; Ohio State University; R Banerjee, J Hwang; University of North Texas; J Tiley; Air Force Research Laboratory; GB Viswanathan, HL Fraser; Ohio State University—Poster # 221

High Resolution and Analytical Characterization of Engineered Nanostructures

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 636Characterization of Al In GaN/GaN Heterointerface by HAADF-STEM and Electron Holography; M Takeguchi, H Okuno, Y Irokawa, Y Sakuma, K Furuya; National Institute for Materials Science, Japan—Poster # 222

3:30 PM 637Preparation and Characterization of Titanate Nanotubes; M Klementova; Academy of Sciences of the Czech Republic; Z Kvaca; Molecular Cybernetics, Czech Republic; P Bezdicka, E Vecernikova; Academy of Sciences of the Czech Republic; M Mohyla; Molecular Cybernetics, Czech Republic—Poster # 223

3:30 PM 638Nucleation and Growth of Magnetic Nanoparticles in a Na-Ca-B-Fe Amorphous Precursor by Electron Beam Irradiation; MA Laurenzi III; The Catholic University of America; W-A Chiou; University of Maryland; IL Pegg; The Catholic University of America—Poster # 224

3:30 PM 639Tomography of High-k Dielectrics on Fin-FET Sidewalls; B Foran, N Ives; The Aerospace Corporation; P Lysaght; SEMATECH—Poster # 225

3:30 PM 640Physical and Electrical Characterization of the Interface Between Atomic-Layer-Deposited Al ₂O ₃on GaAs Substrates for CMOS Applications; DI Garcia-Gutierrez, V Kaushik; ATDF; D Shahrjerdi, S Banerjee; University of Texas, Austin—Poster # 226

3:30 PM 641 (MSA Presidential Student) Exploring the Morphological Diversity of Amyloidís Cross-β Structure; WS Childers, Y Liang, R Ni, AK Mehta, JV Taylor, DG Lynn; Emory University—Poster # 227

3:30 PM 642Stress Relaxation by Cation Ordering in Epitaxial Lead Zirconate Titanate Films; L Zhang; University of Connecticut; A Vasiliev; Institute of Crystallography Russian Academy of Sciences; IB Misirlioglu; Massachusetts Institute of Technology; SP Alpay, M Aindow; University of Connecticut; R Ramesh; University of California Berkeley—Poster # 228

3:30 PM 643Interface Structure of a V ₂O ₃Layer Grown on Cu ₃Au (001) by Cs Corrected Transmission Electron Microscopy; H Calderon; ESFM-IPN, Mexico; H Niehus; Humboldt Universität zu Berlin, Germany; B Freitag, D Wall; FEI Company, The Netherlands; F Stavale, CA Achete; Incetro, Xerem, Brazil—Poster # 229

3:30 PM 644Performance Advantages of a Modern Ultra-High Mass Resolution LEAP; P Clifton, T Gribb, S Gerstl, RM Ulfig, DJ Larson; Imago Scientific Instruments—Poster # 230

3:30 PM 645Analysis of Silicon Nanowires by Laser Atom Probe Tomography Prepared by a Protected Lift-Out Processing Technique; T Prosa, R Alvis; Imago Scientific Instruments; L Tsakalakos, V Smentkowski; General Electric Global Research—Poster # 231

3:30 PM 646Microstructural Investigation of Pd/Pt/Au and Pd/Ru/Au Ohmic Contacts to InAlSb/InAs Heterostructures for High Electron Mobility Transistors; Q Zhang, R Dormaier, S Mohney; The Pennsylvania State University—Poster # 232

3:30 PM 647Nanofabrication by 3D E-beam Cutting; T Gnanavel, Z Saghi, Y Peng, G Moebus; University of Sheffield, United Kingdom—Poster # 233.

3:30 PM 648Characterization with TEM of AlN/GaN Heterostructures for Implant Activation Annealing; T Zheleva, C Hager, K Jones, M Derenge; Army Research Laboratory—Poster # 234

Ultrafast Electron Microscopy and Ultrafast Science

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 649Development of Time Resolved Reflection High-Energy Electron Diffraction System to Study Ultrafast Phases Transition at Surfaces; H Park, TD Pounds, JM Zuo; University of Illinois—Poster # 235

3:30 PM 650 (MSA Presidential Student) Particle Swarm Optimization of Iterative Phase Retrieval Algorithms for Ultrafast Coherent Diffractive Imaging; D Masiel, B Gipson, DG Morgan; University of California Davis; JCH Spence; Arizona State University; ND Browning; University of California Davis—Poster # 236

Image Analysis and Quantitative Microscopy

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 651Extracting Rich, Quantitative Information from Images Using Open-Source Software; A Carpenter, T Jones; Broad Institute of Harvard and MIT—Poster # 237

3:30 PM 652Determination of True Particle Size Distribution in High Impact Polystyrene (HIPS); W Heckmann; BASF SE, Germany—Poster # 238

3:30 PM 653Improvements in Automated Photometric Stereo 3D SEM; R Pintus, S Podda; Sardegna Ricerche, Italy; M Vanzi; University of Cagliari, Italy—Poster # 239

3:30 PM 654Non-Contact 3D Surface Metrology of Large Grain High Purity Niobium by SLCM and FESEM; Z Sung, P Lee, D Larbalestier; Florida State University—Poster # 240

Nuclear and Reactive Materials

Poster Session: Wednesday 3:30 PM, Room: Exhibit Hall

3:30 PM 655Transmission Electron Microscopy Study of Uranium Thorium Zirconium Hydride Fuels; K Terrani; University of California, Berkeley—Poster # 241

3:30 PM 656Effects of Annealing and Ion Implantation on the Nano-Structure of the ODS Eurofer 97 Steel; C Williams, A Cerezo, EA Marquis; University of Oxford, United Kingdom—Poster # 242.

Hyperspectral Imaging, Cathodoluminescence, and Soft X-ray Analysis

Session Chairs: P Mainwaring, Gatan Inc; C MacRae, CSIRO

Platform Session: Thursday 8:30 AM, Room: Aztec

8:30 AM 657 (Invited) Correlating Composition and Luminescence Variations in III-Nitride Semiconductor Alloys; PR Edwards, K Bejtka, IM Watson; University of Strathclyde, United Kingdom; S Fernández-Garrido, E Calleja; Universidad Politécnica de Madrid, Spain; RW Martin, KP O'Donnell; University of Strathclyde, United Kingdom

9:00 AM 658 (Invited) Analysis of Combined Multi-signal Hyperspectral Datasets Using a Clustering Algorithm and Visualisation Tools; N Wilson, C MacRae, A Torpy; CSIRO, Australia

9:30 AM 659 (Invited) Methodology for the Quantification of Hyperspectral Cathodoluminescence; C MacRae, N Wilson, A Torpy; CSIRO, Australia

10:00 AM Coffee Break

10:15 AM 660 (Invited) Hyperspectral Imaging in TEM: New Ways of Information Extraction and Display; B Schaffer, C Gspan, W Grogger, G Kothleitner, F Hofer; Graz University of Technology, Austria

10:45 AM 661Spectral Imaging with an Annular Si-drift Detector and Annular X-ray Detector Simulated by Stage and Scan Rotation in the SEM; PG Kotula; Sandia National Laboratories

11:00 AM 662X-ray Spectrum Imaging of Sintering Additives in Thick-Film (Pb,La)(Zr,Ti)O ₃; C Parish, B McKenzie, M Winter, B Tuttle; Sandia National Laboratories

11:15 AM 663Hyperspectral Analysis in Soft X-ray Spectromicroscopy; C Jacobsen, H Fleckenstein; Stony Brook University

11:30 AM 664 (Invited) Statistical and Systematic Errors in EFTEM Spectral Imaging; IM Anderson, A Herzing; National Institute of Standards and Technology

TEM Accessory Instrumentation and Automation

Session Chairs: A Ziegler, Max Planck Insitute for Biochemistry, Germany; M Marko, Wadsworth Center

Platform Session: Thursday 8:15 AM, Room: Picuris

8:15 AM 665 (Invited) Development of a High Accuracy, Large Range and Backlash Free Single-Tilt/Rotation (Alpha-Gamma) Holder for Precise Alignment of TEM Samples; N Salmon, D Vetter; Hummingbird Scientific; EA Stach; Purdue University

8:45 AM 666Specially Designed Sample Holder and In-situ TEM for Gas-Solid Interaction Studies at an Atomic Resolution; XF Zhang; Hitachi High Technologies America

9:00 AM 667A New Paradigm for Ultra-High-Resolution Imaging at Elevated Temperatures; LF Allard; Oak Ridge National Laboratory; WC Bigelow; University of Michigan; D Nackashi, J Damiano, SE Mick; Protochips Inc

9:15 AM 668 (Invited) Four-Dimensional STEM-EELS Tomography of Nano-structured Materials; K Jarausch; Hitachi High Technologies America; DN Leonard; Appalachian State University; RD Twesten, P Thomas; Gatan

9:45 AM 669Electronic Structure Studies of Carbon Materials by High-Energy-Resolution Carbon K-Emission Spectroscopy Measurements; M Terauchi; Tohoku University, Japan; H Nishihara, T Kyotani; Tohoku University, Japan

10:00 AM Coffee Break

10:30 AM 670 (Invited) Automated Large Scale Tilt Pair Data Collection for TEM; C Yoshioka, N Voss, J Pulokas, D Fellmann, A Cheng, B Carragher, C Potter; Scripps Research Institute

11:00 AM 671 (Invited) Aspects of Using a Boersch Type Phase Shifting Device for Contrast Enhancement in Macromolecular Electron Microscopy; D Typke, RM Glaeser, KH Downing; Lawrence Berkeley National Laboratory; PC Tiemeijer; FEI, The Netherlands; R Cambie, J Jin; Lawrence Berkeley National Laboratory

11:30 AM 672Progress on the Development of a Cc/Cs Corrector for TEAM; M Haider, P Hartel, U Loebau; CEOS GmbH, Germany; R Hoeschen; Max-Planck Institute for Metals Research, Germany; H Müller, S Uhlemann, F Kahl, F Zach; CEOS GmbH, Germany

11:45 AM 673Auto-Adjustment of Aberration Correction and Experimental Evaluation of R005 Microscope; S Hidetaka, H Fumio, K Toshikazu, T Takeshi, K Yukishito, T Takayuki, O Yoshifumi, T Yasumasa, Y Naoki, T Kunio; CREST

Teaching Microscopy and Microanalysis: University and Short Courses

Session Chairs: E Schumacher, McCrone Associates; CE Lyman, Lehigh University

Platform Session: Thursday 8:15 AM, Room: Galisteo

8:15 AM 674 (Invited) Instruction and Training at the University of Georgia EM Lab; JP Shields; University of Georgia

8:45 AM 675 (Invited) Teaching Advanced Transmission Electron Microscopy; PA Crozier, RW Carpenter, DJ Smith, K Weiss; Arizona State University

9:15 AM 676Methodologies for Teaching Undergraduate Level Electron Microscopy; BL McIntyre; University of Rochester

9:30 AM 677 (Invited) A Personal Perspective on Teaching Microscopy: Lessons Learned from the Classroom and Laboratory; PM Cooke; MICA and College of Microscopy

10:00 AM Coffee Break

10:30 AM 678 (Invited) Microscopy Short Courses for Industrial, Governmental, and Academic Users; CE Lyman; Lehigh University

11:00 AM 679Design and Implementation of a Practical, Hands-On TEM Short Course; AW Nicholls; University of Illinois at Chicago; EF Schumacher; McCrone Associates

11:15 AM 680Training Objectives and Challenges of Maintaining Competency and Relevancy of Microscopy Staff in an Academic Core Facility; R Schalek; Harvard University

11:30 AM Roundtable Discussion

Advances in Electron Tomography for the Physical and Biological Sciences

Session Chairs: I Arslan, Sandia National Laboratories Livermore; M Marko, Wadsworth Center

Platform Session: Thursday 8:15 AM, Room: San Miguel

8:15 AM 681 (Invited) 3-D Cross-Correlation of Atom Probe and STEM Tomography; B Gorman, D Diercks, D Jaeger; University of North Texas

8:45 AM 682Correlating Electron Tomography and Atom Probe Tomography; I Arslan; Sandia National Laboratories; EA Marquis; University of Oxford, United Kingdom; M Homer, M Hekmaty, N Bartelt; Sandia National Laboratories

9:00 AM 683(S)TEM Dual Axis Tomography; A Voigt, Y Alevtyna, F de Haas, W Voorhout, R Schoenmakers; FEI, The Netherlands

9:15 AM 684 (Invited) Three-Dimensional Imaging and Analysis by Optical Sectioning in the Aberration-Corrected Scanning Transmission and Scanning Confocal Electron Microscopes; PD Nellist, EC Cosgriff, G Behan, AI Kirkland; University of Oxford, United Kingdom; AJ D'Alfonso, SD Findlay, LJ Allen; University of Melbourne, Australia

9:45 AM 685Three-Dimensional Reconstruction of Au Nanoparticles Using Five Projections from an Aberration-Corrected STEM; L Jiang; University of Liverpool, United Kingdom; P Wang, A Bleloch; SuperSTEM Laboratory, United Kingdom; P Goodhew; University of Liverpool, United Kingdom

10:00 AM Coffee Break

10:30 AM 686 (Invited) Discrete Tomography: Exploiting Various Forms of Discreteness in Electron Tomography; KJ Batenburg, S Bals, J Sijbers, G Van Tendeloo; University of Antwerp, Belgium

11:00 AM 687Electron Tomography Using Compositional-Sensitive Diffraction Contrast for 3D Characterization of Self-Assembled Semiconductor Quantum Dots; R Beanland, JC Hernandez; University of Cambridge, United Kingdom; AM Sanchez; Universidad de Cadiz, Spain; PA Midgley; University of Cambridge, United Kingdom

11:15 AM 688 (MSA Presidential Student) Reconstruction of 3D Magnetic Induction Using Lorentz TEM; C Phatak, M DeGraef; Carnegie Mellon University; A Petford-Long, M Tanase, A Imre; Argonne National Laboratory

11:30 AM 689Tomographic Imaging Ultra-Thick Specimens with Nanometer Resolution; E Soutry, B Freitag, D Wall, D Tang; FEI, The Netherlands; K Lu, J Loos; Eindhoven University of Technology, The Netherlands

11:45 AM 690Data Interpretation in Real Time: Using Commodity Graphics Cards to Accelerate Tomography; CR Booth, S Markovic, R Harmon, J Wilbrink; Gatan

21st Century Scanning Microscopy—Electrons and He Ions

Session Chairs: DC Joy, University of Tennessee; R Gauvin, McGill University, Canada

Platform Session: Thursday 8:00 AM, Room: Dona Ana

8:00 AM Introduction

8:15 AM 691 (Invited) Application of the Helium Ion Microscope for the Imaging and Analysis of Nanomaterials; DC Bell; Harvard University; LA Stern, L Farkas, JA Notte; Carl Zeiss SMT Inc

8:45 AM 692 (Invited) Scanning Electron and Ion Microscope-based Size and Shape Metrology at the Nanometer Scale; AE Vladar, P Cizmar, MT Postek; National Institute of Standards and Technology

9:15 AM 693He Ion Induced Secondary Electron and Backscattered Electron Images Compared Side-by-side With Electron Beam Induced Secondary Electron, Backscattered, and Transmission Electron Images; S Wight, DC Meier, MT Postek, AE Vladar, J Small, DE Newbury; National Institute of Standards and Technology

9:30 AM 694 (Invited) Relative Contrast in Ion and Electron Induced Secondary Electron Images; LA Giannuzzi; FEI Company; M Utlaut; University of Portland; M Scheinfein; FEI Company

10:00 AM Coffee Break

10:30 AM 695 (Invited) Variation of Rutherford Backscattered Ion and Ion-induced Secondary Electron Yield with Atomic Number in the “Orion” Scanning Helium Ion Microscope; BJ Griffin; The University of Western Australia, Australia; DC Joy; Oak Ridge National Laboratory

11:00 AM 696A Study of Helium Ion Induced Secondary Electron Emission; R Ramachandra; University of Tennessee; BJ Griffin; University of Western Australia, Australia; DC Joy; University of Tennessee

11:15 AM 697 (Invited) Electron Channeling and Ion Channeling Contrast Imaging of Dislocations in Nitride Thin Films; C Trager-Cowan; University of Strathclyde, United Kingdom; F Sweeney; University of Sheffield, United Kingdom; PR Edwards, FL Dynowski; University of Strathclyde, United Kingdom; AJ Wilkinson; University of Oxford, United Kingdom; A Winkelmann; Max-Planck-Institut für Mikrostrukturphysik, Germany; AP Day; Aunt Daisy Scientific Ltd, United Kingdom; T Wang, PJ Parbrook; EPSRC National Centre for III-V Technologies, United Kingdom; IM Watson; University of Strathclyde, United Kingdom; DC Joy; University of Tennessee

11:45 AM Discussion: Where Are We Now with He Ion Microscopy?

New Analytical Techniques in Microbeam Analysis

Session Chairs: HA Lowers, U.S. Geological Survey; JJ Donovan, University of Oregon

Platform Session: Thursday 8:00 AM, Room: Cimarron

8:00 AM 698 (Invited) Celebrating EDS Technology—30 Years of Turning Photons into Minerals; AR Butcher, P Gottlieb; Intellection Pty Ltd, Australia

8:30 AM 699SLICE, A Database Approach to EDS; DC Ward, J Colby; xk, Inc

8:45 AM 700The Reduction of Pileup Effects in Spectra Collected with Silicon Drift Detectors; T Elam, R Anderhalt, A Sandborg, J Nicolosi, D Redfern; EDAX Inc

9:00 AM 701Anomalous X-ray Emission from Insulator Materials Associated with Low Energy Ion Irradiation; K Furuya, M Song, M Takeguchi; National Institute for Materials Science, Japan

9:15 AM 702SiO ₂Adlayers on Si with a Low Energy Enhancing X-ray Optic; E Lochner, G Brown, D OHara; Parallax Research, Inc

9:30 AM 703A New Approach for Analysis of Thin Films on the Nano-Scale; PJ Statham, C Penman; Oxford Instruments Analytical Limited, United Kingdom

9:45 AM 704Single Particle Analysis Using Microbeam X-rays; AG Attaelmanan; University of Sharjah, United Arab Emirates

10:00 AM Coffee Break

10:30 AM 705 (Invited) Advances in Quantitative Elemental Analyses by Laser Ablation ICP-MS; AE Koenig; US Geological Survey

11:00 AM 706Improved Analytical Resolution and Sensitivity in EPMA—Some Initial Results from the Ultrachron Development Project; MJ Jercinovic, ML Williams; University of Massachusetts; DR Snoeyenbos; Cameca Instruments, Inc

11:15 AM 707Numerical Calculation of Secondary Fluorescence Effects Near Phase Boundaries in EPMA; JA Escuder, X Llovet, F Salvat; University of Barcelona, Spain

11:30 AM 708Water by EPMA—New Developments; JJ Donovan; University of Oregon; EP Vicenzi; Smithsonian Institution

11:45 AM 709Constructing Ternary Phase Diagrams Directly from EPMA Compositional Maps; DR Snoeyenbos; Cameca Instruments Inc; DA Wark; General Electric Company; J-C Zhao; Ohio State University

Microscopy Techniques for Ceramics and Composites

Session Chairs: E Corral, Sandia National Laboratories; B Gauntt, Pennsylvania State University

Platform Session: Thursday 9:00 AM, Room: La Cienega

9:00 AM 710 (Invited) Three Dimensional (3D) Visualization of Damage in Metal-Ceramic Nanolayers by Focused Ion Beam (FIB) Serial Sectioning; N Chawla; Arizona State University

9:30 AM 711Quantitative STEM Tomography for Size-controlled Metallic Nanodots on Sintered Titania Photocatalysts; K Yoshida, L Miao, T Hirayama, S Tanemura; Japan Fine Ceramics Center, Japan; T Torimoto, N Tanaka; Nagoya University, Japan

9:45 AM 712EDX Analysis of Grain Boundary Segregation in 1 at% Nd Doped Polycrystalline YAG; X Li, A Stevenson, G Messing, EC Dickey; Pennsylvania State University

10:00 AM Coffee Break

10:30 AM 713 (Invited) Microstructural and Interface Analysis of Ceramic Eutectic Composites; EC Dickey, C Philips, AV Polotai; Pennsylvania State University

11:00 AM 714 (Invited) Hyperspectral Electron Backscattered Diffraction: Applications to Ceramic Materials; L Brewer; Sandia National Laboratories

11:30 AM 715Electron Microprobe Analysis of Glass-to-Metal Seals For Use in Solid-Oxide Fuel Cells; S Widgeon, E Corral, R Loehman; Sandia National Laboratories

11:45 AM 716 (MAS Distinguished Scholar) Microbeam Analysis of Plasma Effects in Synthetic Mica-Like Compound; M Eddy, A Deditius, Q Wei, W Li, R Ewing, L Wang; University of Michigan

Structural Basis of Disease

Session Chair: D Giovannucci, University of Toledo

Platform Session: Thursday 8:30 AM, Room: Taos

8:30 AM 717 (Invited) Visualizing Dynamic Immune Cell Interaction and Function with Two-photon Microscopy; C Tong, D Barkauskas, J Nthale, E Bays, C Su, H-LR Liou, A Huang; Case Western Reserve University School of Medicine

9:00 AM 718 (Invited) Intravital Confocal Imaging of Dynamic Behaviors of Langerhans Cells in the Skin; A Takashima, R Mohr; University of Toledo

9:30 AM 719 (Invited) Transfer of HIV Infections by Dendritic Cells is Mediated through a Specialized, Surface Accessible Intracellular Compartment; HJ Yu, M Reuter, D McDonald; Case Western Reserve University School of Medicine

10:00 AM Coffee Break

10:30 AM 720Spatial and Temporal Interactions of TLR4 Pathway Membrane Components Revealed by Total Internal Reflection Fluorescence (TIRF) Microscopy; A Carroll-Portillo, RM Noek, B Carson, R Rebeil, JA Timlin; Sandia National Laboratories

11:00 AM 721Connexin-43 Facilitates Metastatic Tumor Cell Adhesion to Lung Vasculature; MK ElZarrad, AB Al-Mehdi; University of South Alabama

11:30 AM 722Imaging Cardiac Sympathetic Neurons: A Correlative Study Using Fluorescence and TEM; K Jackson, C Miller, V Gattone, M Rubart; Indiana University School of Medicine

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences

Session Chairs: G Torraca, Amgen Inc LM DiMemmo, Bristol-Myers Squibb

Platform Session: Thursday 8:30 AM, Room: Mesilla

8:30 AM 723 (Invited) In-situ Analysis for Identification of Extraneous Matter in Formulated Drug Product by Raman Spectroscopy; Y Meléndez; Amgen Inc

9:00 AM 724 (Invited) Pharmaceutical Research Applications of Transmission Electron Microscopy of Mammalian Cells in Culture; JR Megill; Bristol-Myers Squibb

9:30 AM 725 (Invited) Microscopy and Characterization of Triglyceride Polymorphs; RA Carlton, GR Williams, RL Mueller; GlaxoSmithKline

10:00 AM Coffee Break

10:30 AM 726Seeing Multifunctional Nano- and Micro-particles Suitable for Imaging & Therapy Using Freeze-fracture Electron Microscopy; B Papahadjopoulos-Sternberg, J Ackrell; NanoAnalytical Laboratory

11:00 AM 727 (Invited) Contributions of SEM in Pharmaceutical QbD for Formulation Development and Manufacture Process Control; JQ Liang, A Lin, W Dulin, M Tesconi, MS Ku; Wyeth Research

11:30 AM 728 (Invited) Raman Microscopic Applications in Biopharmaceuticals: Unique In Situ Identification of Particulates in Drug Products; X Cao, Z-Q Wen, A Vance, G Torraca, G Li, W Jing, P Masatani, C Yee; Amgen Inc

Understanding the Synthesis and Properties of Nanostructures and Nanomaterials

Session Chairs: L-M Peng, Peking University, China; S Hofmann, University of Cambridge, United Kingdom

Platform Session: Thursday 8:30 AM, Room: Ruidoso

8:30 AM 729Analytical Electron Microscopy of InN thin films Prepared by Pulsed Laser Deposition; G Drazic; Jozef Stefan Institute, Slovenia; E Sarantopoulou, Z Kollia, A-C Cefalas; National Hellenic Research Foundation, Greece; S Kobe; Jozef Stefan Institute, Slovenia

8:45 AM 730Microstructural Characterization of InN/GaN Multiple Quantum Wells; L Zhou; Arizona State University; E Dimakis, TD Moustakas; Boston University; DJ Smith; Arizona State University

9:00 AM 731Structural Analysis of Threading Dislocations in AlN Thin Films; Y Tokumoto, N Shibata, T Mizoguchi, T Yamamoto, Y Ikuhara; University of Tokyo, Japan

9:15 AM 732Synthesis and Microstructure of ZnO films deposited on (0001) and r-cut alpha-Al2O3 using MOCVD; CM Wang, LV Saraf, TL Hubler; Pacific Northwest National laboratory; Y Qiang; University of Idaho

9:30 AM 733Study of Pd/ZnO Nanocatalysts for Hydrogen Production; J Liu, J Wang; University of Missouri, St Louis; LF Allard; Oak Ridge National Laboratory

9:45 AM 734 (MSA Presidential Student) Tin Catalyzed Growth of ZnO Nanostructures; J Wang, S Liu, J Liu; University of Missouri, St Louis

10:00 AM Coffee Break

10:30 AM 735TEM/QED Study of FePt Ultrathin Films and Co/CoO Core-Shell Particles; XZ Li, T George, XH Wei, DJ Sellmyer; University of Nebraska, Lincoln

10:45 AM 736Novel 2212-based Fe-rich Strontium Ferrites: Layered and Collapsed Structures; S Malo, C Lepoittevin, O Perez, D Grebille, M Hervieu; Laboratoire CRISMAT, France

11:00 AM 737Microscopy of Clathrate Compounds: Determining the Structure and Hydrogen Encapsulation Properties Through Aberration-Corrected HAADF-STEM; Q Ramasse; Lawrence Berkeley National Laboratory; NL Okamoto, DG Morgan, D Neiner, CL Condron, J Wang, P Yu, ND Browning, S Kauzlarich; University of California, Davis

11:30 AM 738Preparation of Nanoplatelets Using Vacuum Roll Coating; VZ Poenitzsch, CA Engel, KE Coulter; Southwest Research Institute

11:45 AM 739Phase Formation as a Function of Substrate Temperature in Thin Layers of BiTe Grown by CSVT; F Cruz-Gandarilla, O Vigil-Galan; ESFM-IPN, Mexico; J Stubbs; Johns Hopkins University; S Peripolli, CA Achete; Univ Fed Rio de Janeiro, Brazil; H Calderon; ESFM-IPN, Mexico

High Resolution and Analytical Characterization of Engineered Nanostructures

Session Chairs: B Foran, Aerospace Corporation; Guodo Lian, Texas Instruments

Platform Session: Thursday 8:30 AM, Room: Brazos

8:30 AM 740 (Invited) CNT-FET Schottky Barrier Devices Fabricated by E-beam Lithography; D Perello; University of Pittsburgh; MJ Kim; University of Texas at Dallas; SY Jeong, BR Kang, DJ Bae, YH Lee; Sungkyunkwan University; M Yun; University of Pittsburgh

9:00 AM 741Probing Asymmetric Interfaces of LaMnO ₃/SrMnO ₃Superlattices with Aberration-Corrected Scanning Transmission Electron Microscopy; A Shah; University of Illinois at Urbana-Champaign; S May; Argonne National Laboratory; J Wen, X Zhai, J Eckstein; University of Illinois at Urbana-Champaign; A Bhattacharya; Argonne National Laboratory; J-M Zuo; University of Illinois at Urbana-Champaign

9:15 AM 742TEM Characterization of Nanoindentation in Nanoscale Metallic Multilayers; D Bhattacharyya, N Mara, P Dickerson, R Hoagland, A Misra; Los Alamos National Laboratory

9:30 AM 743TEM Correlation between the Structural and Optical Properties Of Rotationally Twinned InP Nanowires; DC Bell, J Bao, F Capasso; Harvard University; J Wagner, T Martensson, J Tragardh, L Samuelson; Lund University

9:45 AM 744Characterization of CNTs-Al Dispersions Using FE-TEM and FE-SEM; D Poirier, R Gauvin, RAL Drew; McGill University

10:00 AM Coffee Break

10:30 AM 745Thermal Stability of Hf-Based Gate Dielectric Stacks with Rare-Earth Oxide Capping Layers; JM LeBeau; University of California Santa Barbara; J Jur, D Lichtenwalner, A Kingon; North Carolina State University; D Klenov; FEI Company; S Stemmer; University of California Santa Barbara

10:45 AM 746Electron Energy Loss Spectroscopy Measurements of Amorphization of Polymorphs of TiO ₂Induced by Ion Irradiation; NJ Zaluzec; Argonne National Laboratory; KL Smith, GR Lumpkin, MG Blackford; Australian Nuclear Science and Technology Organisation

11:00 AM 747A TEM Study of Alkaline-Earth Metal Hexaboride Nanowires; S Li; Northwestern University; S Amin, T Xu; University of North Carolina Charlotte; VP Dravid; Northwestern University

11:15 AM 7484D STEM/EELS Characterization of Au Nanodots in a ZnO Thin Film; DN Leonard; Appalachian State University; K Jarausch; Hitachi High Technologies America, Inc; RD Twesten; Gatan Inc

Image Analysis and Quantitative Microscopy

Session Chairs: RA Panaro, Y-12 National Security Complex; DF Susan, Sandia National Laboratories

Platform Session: Thursday 8:00 AM, Room: Pecos

8:00 AM 749 (Invited) Characterization of Flake Graphite Forms in Gray Iron through Image Analysis; G Lucas, T Weber, L Barnard; Buehler, Ltd

8:30 AM 750The Use of Color in Quantitative Image Analysis; DF Susan, AC Kilgo; Sandia National Laboratories

8:45 AM 751Image Analysis in a Visual Programming Environment; L Liang; DuPont

9:00 AM 752Accuracy of Optical Dimensional Metrology at the Nano-scale; J Potzick; National Institute of Standards and Technology

9:15 AM 753Speed Limitations and Trade-offs for SEM/EDS Particle Analysis; S Scheller; Bruker AXS Microanalysis

9:30 AM 7543D Metrology of Nanoparticles by Tomogram Processing; X Xu, Z Saghi, G Moebus; University of Sheffield, United Kingdom

9:45 AM 755 (MSA PTSA Award) Quantifying the Layer Dispersion Degree in Polymer Layered Silicate Nanocomposites by Quantitative Transmission Electron Microscopy; ZP Luo, RL Littleton, H Kim; Texas A&M University; JH Koo; University of Texas, Austin

10:00 AM Coffee Break

10:30 AM 756 (Invited) Quantitative Analysis of Fracture Surfaces Using Image Analysis; T Murphy; Hoeganaes Corporation

11:00 AM 757BioImageXD Software in Batch Analysis of Integrin Interactions; KA Pahajoki, PP Kankaanpää, J Heino; University of Turku, Finland

11:15 AM 758Correlation of Double Diffraction Pattern and Coincident Site Lattice; M Shamsuzzoha, R Rahman; University of Alabama

11:30 AM 759Spectral Image Aberration Correction Using Image Transformations; RM Noek, HDT Jones, GA Poulter, JA Timlin; Sandia National Laboratories

11:45 AM 760Development of Bayesian Segmentation Techniques for Automated Segmentation of Titanium Alloy Images; J Simmons, B Bartha; Air Force Research Laboratory; M De Graef; Carnegie Mellon University; M Comer; Purdue University

Hyperspectral Imaging, Cathodoluminescence, and Soft X-ray Analysis

Session Chair: PG Kotula, Sandia National Laboratories

Platform Session: Thursday 1:30 PM, Room: Aztec

1:30 PM 761 (Invited) Multivariate Analysis of XPS Data for Enhanced Chemical Information; JE Fulghum, K Artyushkova; University of New Mexico

2:00 PM 762X-ray Absorption Spectroscopy and Spectrum-Imaging in the SEM; JA Hunt, BC Gundrum; Gatan

2:15 PM 763Acquisition of Combined Real/Reciprocal Space Multi-Dimensional Datasets; RD Twesten, P Thomas; Gatan

2:30 PM 764Hardware and Software for Nano-Area Diffractive Imaging in S/TEM; VV Volkov, J Wall, Y Zhu; Brookhaven National Laboratory

2:45 PM 765Fast Hyperspectral Raman Imaging with Confocal Raman Microscopy at Optimized Spatial Resolution; M Kalbac; Academy of Sciences Czech Republic; E Lee; HORIBA Jobin Yvon; A Zoubir; HORIBA Jobin Yvon France; A Whitley; HORIBA Jobin Yvon

TEM Accessory Instrumentation and Automation

Session Chairs: A Ziegler, Max Planck Insitute for Biochemistry, Germany; M Marko, Wadsworth Center

Platform Session: Thursday 1:30 PM, Room: Picuris

1:30 PM 766 (Invited) Design and Characterization of 64 MegaPixel Fiber Optic Coupled CMOS Detector for Transmission Electron Microscopy; H Tietz; TVIPS GmbH, Germany

2:00 PM 767 (Invited) Spectroscopic Imaging Detectors for Electrons and X-rays; L Strüder; Max-Planck Institut für Extraterrestrische Physik, Germany; R Hartmann; PNSensor, Germany; H Soltau; PNSensor, Germany; A Ziegler; Max-Planck Institut für Biochemie, Gemany

2:30 PM 768A Pixel Array Detector for Scanning Transmission Electron Microscopy; P Ercius, T Caswell, MT Tate, A Ercan, S Gruner, DA Muller; Cornell University

2:45 PM 769Development of Fast CCD Cameras for In-situ Electron Microscopy; L Tsung, B Mollon, Y Jia, P Mooney, C Mao, M Pan; Gatan

3:00 PM 770 (Invited) Electron Gun Design for Pulsed TEM Operation; A Ziegler; Max-Planck Institute for Biochemistry, Germany

Problem Solving with Light Microscopy

Session Chairs: DR Rothe, Dow Chemical Company; WA Heeschen, Dow Chemical Company

Platform Session: Thursday 1:30 PM, Room: Cimarron

1:30 PM 771 (Invited) The Importance of Polarized Light Microscopy in the Analytical Setting; S Sparenga; McCrone Research Institute

2:00 PM 772Microscopy Outside the Box; WA Heeschen; The Dow Chemical Company

2:15 PM 773 (Invited) Using Light Microscopy in the Analysis of Textile Materials; M Sullivan; Milliken Research Corporation

2:45 PM 774 (Invited) Solving Archaeological Mysteries with the Light Microscope; M King, K Brinsko; McCrone Research Institute; A Bowen; Stoney Forensic, Inc; S Sparenga; McCrone Research Institute

3:15 PM 775Dynamic Experiments in Light Microscopy; DR Rothe, R Samson, E Czerwinski; The Dow Chemical Company

Advances in Electron Tomography for the Physical and Biological Sciences

Session Chairs: A Hoenger, University of Colorado; M Marko, Wadsworth Center

Platform Session: Thursday 1:30 PM, Room: San Miguel

1:30 PM 776 (Invited) Supermontaging: Reconstructing Large Cellular Volumes by Stitching Together Laterally Adjacent Tomograms; D Mastronarde; University of Colorado; P van der Heide, G Morgan, B Marsh; University of Queensland, Australia

2:00 PM 777Correlative Cryo-Light and Cryo-Electron Microscopy of Vitreous Sections; C Schwartz, M Ladinsky, A Hoenger; University of Colorado, Boulder

2:15 PM 778 (Invited) Image Processing of Vitreous Sections; D Castano, A Al-Amoudi, A Frangakis; European Molecular Biology Laboratory, Germany

2:45 PM 779 (Invited) Cryo-Electron Tomography of Coated Vesicles and Modeling the Polyhedral Clathrin Network; JB Heymann, DC Winkler, Y-I Yim, E Eisenberg, LE Greene, AC Steven; National Institutes of Health

3:15 PM 780Bright-Field STEM Tomography of Thick Stained Plastic Sections; A Sousa, M Hohmann-Marriott, G Zhang, RD Leapman; National Institutes of Health

21st Century Scanning Microscopy—Electrons and He Ions

Session Chairs: R Gauvin, McGill University, Canada; DC Joy, University of Tennessee

Platform Session: Thursday 1:30 PM, Room: Dona Ana

1:30 PM 781 (Invited) Backscattered Electron Imaging in the Scanning Electron Microscope: the Use of Either: (a) High Incident Energy or (b) an Array Detector; LM Gignac, OC Wells, C-K Hu, J Bruley, CE Murray; IBM T J Watson Research Center; A Frye; IBM Systems & Technology Group

2:00 PM 782 (Invited) Electron Beam Induced Processing: Experimentation, Simulation, and Applications; JD Fowlkes; Oak Ridge National Laboratory; DA Smith; The University of Tennessee, Knoxville; PD Rack; Oak Ridge National Laboratory

2:30 PM 783 (Invited) Imaging in the SEM with X-Rays?; R Gauvin; McGill University, Canada

3:00 PM 784In Situ Imaging of Hydrated Specimens at Room Temperature in ESEM; J Chen, WAJ Neijssen; FEI Company, China; DJ Stokes; FEI Company, The Netherlands; M Uncovsky; FEI Company, The Czech Republic

3:15 PM 785Determination of the Estimated Resolution of SEM Images; C Probst, H Demers, R Gauvin; McGill University, Canada

Microscopy Techniques for Ceramics and Composites

Session Chairs: L Gammon, The Boeing Company; E Corral, Sandia National Laboratories

Platform Session: Thursday 1:30 PM, Room: La Cienega

1:30 PM 786 (Invited) High Resolution STEM, EELS, and STEM Tomography of Ceramic Materials; I Arslan; Sandia National Laboratories

2:00 PM 787Analytical Electron Microscopy of K _0.5Na _0.5NbO ₃Single Crystal Prepared by Solid State Crystal Growth; A Bencan; Jožef Stefan Institute, Slovenia; G Matjaž; Institute of Metals and Technology, Slovenia; T Elena, F John, K Marija; Jožef Stefan Institute, Slovenia

2:15 PM 788Micro- and Nano-Patterning of Solution-Derived Functional Electronic Ceramics; GL Brennecka, C Parish, DA Scrymgeour, B Tuttle, L Brewer; Sandia National Laboratories; JG Ekerdt; University of Texas, Austin

2:30 PM 789Quantitative STEM-EDS Spectrum Imaging of Phase Transformations in (Pb,La)(Zr,Ti)O ₃; C Parish, GL Brennecka, B Tuttle, L Brewer; Sandia National Laboratories

2:45 PM 790 (Invited) Toughening of Fiber Reinforced Composite Materials; B Hayes; Applied Poleramic Inc; L Gammon; The Boeing Company

3:15 PM 791New Trends in Morphology Studies of Polymers: A 3D View; R Kamalakaran; GE India Technology Center, India; O Guise; SABIC Innovative Plastics

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences

Session Chairs: LM DiMemmo, Bristol-Myers Squibb; G Torraca, Amgen Inc

Platform Session: Thursday 1:30 PM, Room: Mesilla

1:30 PM 792Negative Stain Transmission Electron Microscopy Quality Assessment of Viruses and Recombinant Virus-Like Particles; CD Humphrey; Center for Disease Control

2:00 PM 793Pore Formation by Antimicrobial Peptide, Magainin 2, in Phospholipd Vesicles Detected and Visualized by Cryo-Electron Microscopy; M Han; Baylor College of Medicine; Y Mei; Rice University; H Khant, SJ Ludtke; Baylor College of Medicine

2:30 PM 794Differentiation Between Foreign Particulate Matter and Silicone Oil Induced Protein Aggregation in Drug Solutions by Automated Raman Spectroscopy; M Lankers, J Munhall, O Valet; Rap ID Particle Systems GmbH, Germany

2:45 PM 795Automatic Acquisition of Large Amounts of 3D Data at the Ultrastructural Level, Using SBFSEM; C Genoud, S Galloway, S Pfeiffer, B Kraus; GATAN Inc

3:00 PM Pharma FIB Business Meeting

Understanding the Synthesis and Properties of Nanostructures and Nanomaterials: Nanoparticles

Session Chairs: P Voyles, University of Wisconsin; R Sharma, Arizona State University

Platform Session: Thursday 1:30 PM, Room: Ruidoso

1:30 PM 796Synthesis and Characterization of Gold Nanostars, Nanowires and Nanoboxes; RC Tiruvalam, PL Clasen, MP Harmer, CJ Kiely; Lehigh University

1:45 PM 797Investigation of Beam Damage Mechanism of Ball-milled MgH ₂Powder; M Danaie, M Malac, D Mitlin; University of Alberta, Canada

2:00 PM 798Combined Structural and Chemical Investigations of Ceria Nanoparticles in the TEM; JP Winterstein, J Basu; University of Connecticut; A Herzing, IM Anderson; National Institute of Standards and Technology; CB Carter; University of Connecticut

2:15 PM 799Ex Situ and In Situ Synthesis and Characterization of Nickel Nanoparticles on High Surface Area SilicaSupport; R Banerjee, PA Crozier; Arizona State University

2:30 PM 8003D Characterization and Metrology of Nanostructures by Electron Tomography; JC Hernandez, AB Hungria; University of Cambridge, United Kingdom; JA Perez-Omil; Universidad de Cadiz, Spain; MS Moreno; Centro Atomico Bariloche, Argentina; EA Coronado; Universidad Nacional de Cordoba, Argentina; G Cempura, A Kruk; AGH University of Science and Technology, Poland; PA Midgley; University of Cambridge, United Kingdom

2:45 PM 801Release and Agglomeration Behavior of Nanoscale Iron Core from Carbon-encapsulated Iron Nanoparticles by In-situ TEM Observation; Z Liu, JC Yang; University of Pittsburgh

3:00 PM 802Synthesis, Rietveld Refinement and High Resolution Transmission Electron Microscopy of Yb doped Silicate Oxyapatite for Ultrafast Laser Systems; Y Shen, Z Dong, A Tok, D Tang; Nanyang Technological University, Singapore; L Wang; University of Michigan

High Resolution and Analytical Characterization of Engineered Nanostructures

Session Chair: J Chung, Texas Instruments

Platform Session: Thursday 1:30 PM, Room: Brazos

1:30 PM 803 (Invited) Characterization of Nanodevices by using In-Situ TEM-STM; J Kim, D Cha, SY Park, MJ Kim; University of Texas Dallas

2:00 PM 804Quantitative Characterisation of Surfaces and Defects on PtRu Nanoparticles Using Combined Exit Wave Restoration and Aberration-Corrected TEM; LY Chang, C Maunders; McMaster University, Canada; EA Baranova, C Bock; National Research Council, Canada; GA Botton; McMaster University, Canada

2:15 PM 805 (MSA Presidential Student) Direct Structural Investigation of Bi _3.25La _0.75Ti ₃O ₁₂Thin Films on SrRuO ₃/(111) SrTiO ₃; L Gunawan; McMaster University, Canada; O Gautreau, C Harnagea, A Pignolet; INRS Énergie, Materiaux et Télécommunications, Canada; GA Botton; McMaster University, Canada

2:30 PM 806Atomic-Level Gas-Solid Interaction during In Situ Redox Processes in Ceria; R Wang, PA Crozier, R Sharma, J Adams; Arizona State University

2:45 PM 807Deep RIE and Cryo-Etching of Nanostructures in Silicon and Polymers; G DeRose, M Shearn, MD Henry, Y Chen, A Scherer; California Institute of Technology

3:00 PM 808Nanobead Formation and Nanopatterning in Glasses; G Moebus, J Tsai, X Xu, P Bingham, G Yang; University of Sheffield, United Kingdom

3:15 PM 809Atomic-resolution Studies of Ca ₃Co ₄O ₉using In-situ Scanning Transmission Electron Microscopy; G Yang, Y Zhao; University of Illinois at Chicago; K Sader, A Bleloch; SuperSTEM, Daresbury Laboratory, United Kingdom; RF Klie; University of Illinois at Chicago