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Scanning Helium Ion Microscopy-Induced Secondary Electron Yields of Composite Materials

Published online by Cambridge University Press:  23 September 2015

Vighter Iberi ,
Uk Huh ,
Yueying Wu ,
Philip D. Rack ,
Adam J. Rondinone  and
David C. Joy
Vighter Iberi
Affiliation:
Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA
Uk Huh
Affiliation:
Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA
Yueying Wu
Affiliation:
Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA
Philip D. Rack
Affiliation:
Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA
Adam J. Rondinone
Affiliation:
Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
David C. Joy
Affiliation:
Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1691 - 1692
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Joy, D. C. in "Helium Ion Microscopy, Principles and Applications", Springer, (New York) p. 27.Google Scholar
[2] Scanning Helium ion experiments were conducted at the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, which is a DOE Office of Science User Facility. Gold and silver composite materials were prepared at the Department of Materials Science and Engineering, University of Tennessee Knoxville..Google Scholar