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Scanning Hard X-Ray Microscopy Based on Be CRLs

Published online by Cambridge University Press:  10 August 2018

Andreas Schropp*
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany
Dennis Bruckner
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany Universitat Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany Ruhr Universitat Bochum, Universitatsstr. 150, D-44780 Bochum, Germany
Jessica Bulda
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany Universitat Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany
Gerald Falkenberg
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany
Jan Garrevoet
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany
Frank Seiboth
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA
Felix Wittwer
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany Universitat Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany
Frieder Koch
Affiliation:
Paul Scherrer Institut (PSI), 5232 Villigen, Switzerland
Christian David
Affiliation:
Paul Scherrer Institut (PSI), 5232 Villigen, Switzerland
Christian G. Schroer
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany Universitat Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany
*
*Corresponding author: [email protected]

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

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