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Scanning Electron Microscopy Studies of Vacuum Evaporated CdCl2 Doped Cadmium Sulphide Films

Published online by Cambridge University Press:  02 July 2020

Ram Kishore ,
Venkatram Korapati ,
W.D. Brown  and
H.A. Naseem
Ram Kishore
Affiliation:
Electrical Engineering Department /High Density Electronic Center 3217 Bell Engineering Center University of Arkansas Fayetteville, Arkansas- , 72701
Venkatram Korapati
Affiliation:
Electrical Engineering Department /High Density Electronic Center 3217 Bell Engineering Center University of Arkansas Fayetteville, Arkansas- , 72701
W.D. Brown
Affiliation:
Electrical Engineering Department /High Density Electronic Center 3217 Bell Engineering Center University of Arkansas Fayetteville, Arkansas- , 72701
H.A. Naseem
Affiliation:
Electrical Engineering Department /High Density Electronic Center 3217 Bell Engineering Center University of Arkansas Fayetteville, Arkansas- , 72701
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CdTe/CdS thin film solar cells are being investigated extensively these days by many workers as an option for low cost photovoltaic applications . In order to achieve high efficiency solar cell it is important that the CdS film should have minimum possible structural defects and reasonably large grain size. The CdS films for CdTe/ CdS solar cell structure are mostly grown on glass substrates by chemical bath deposition (CBD). Although adherent, transparent and conformal films with index of refraction close to single crystal CdS can be grown by CBD, impurity inclusions and micropinholes are a problem there in. Very little work has been carried out to grow CdS films by thermal evaporation in vacuum. In the present work we have grown pure and CdCl2 doped CdS films on glass substrates by thermal evaporation and carried out microstructural investigations of these films using scanning electron microscopy.

Corning 7059 glass of 25.4 x 25.4 x 1.2 mm size were used as substrates for the deposition of CdS as well as CdCl2 doped CdS films.

Type
Films and Coatings
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 454 - 455
Copyright
Copyright © Microscopy Society of America

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References

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