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The Scanning Electron Microscopy Educators Program - A Unique Educational Outreach Program at Wright-Patterson Air Force Base, Ohio.

Published online by Cambridge University Press:  02 July 2020

Luann Piazza ,
William R. Ragland ,
Katie E. G. Thorp  and
Marc C. Martin
Luann Piazza
Affiliation:
Air Force Research Laboratory (AFRL), Materials and Manufacturing Directorate; Wright-Patterson Air Force Base, OH45433. UES, Inc., 4401 Dayton-Xenia Road, Dayton, OH45432; AFRL / MLLN.
William R. Ragland
Affiliation:
Air Force Research Laboratory (AFRL), Materials and Manufacturing Directorate; Wright-Patterson Air Force Base, OH45433. The University of Dayton Research Institute, Dayton, OH45469; AFRL / MLBC.
Katie E. G. Thorp
Affiliation:
Air Force Research Laboratory (AFRL), Materials and Manufacturing Directorate; Wright-Patterson Air Force Base, OH45433. AFRL/MLBC
Marc C. Martin
Affiliation:
Air Force Research Laboratory (AFRL), Materials and Manufacturing Directorate; Wright-Patterson Air Force Base, OH45433. AFRL/MLPJ.
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Extract

Wright-Patterson Air Force Base (near Dayton, OH) continues to offer a unique educational outreach program, Scanning Electron Microscopy EDucatorS (SEMEDS; pronounced sem-eds). This ten year old motivational science program provides an opportunity for students and educators to visit the Materials and Manufacturing Directorate's research laboratories, where scanning electron microscopes (SEMs) are used by scientists and engineers working in diverse areas of materials research.

As a favorite motivational science program, SEMEDS serves surrounding communities by bringing students and educators on-site to Wright-Patterson Air Force Base's Air Force Research Laboratory (AFRL) to operate state-of-the-art SEMs in a real life research laboratory setting. The special features of this program include: exposure to a world-class facility, introductions to the elite researchers who work there, and an opportunity for students to operate the same equipment used by the facility researchers.

SEMEDS is an after school program intended for middle school and high school students.

Type
Teaching Microscopy in the New Millennium
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 1154 - 1155
Copyright
Copyright © Microscopy Society of America

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References

References:

1 LEO Electron Microscopy, Incorporated, previously known as Leica / Cambridge; One Zeiss Drive, Thornwood, NY 10594. Telephone, sales and general inquiries: ( 800 ) 356-1090. Web: www.leo-usa.com .Google Scholar
2 R.J. Lee Group, Incorporated / R.J. Lee Instruments Limited; 350 Hochberg Road, Monroeville PA 15146. Telephone: (412 ) 325-1776. Web: www.rjleeinst.com .Google Scholar