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Scanning Confocal Electron Microscopy in a FEI Double Corrected Titan3 TEM/STEM

Published online by Cambridge University Press:  26 July 2009

NJ Zaluzec
Affiliation:
Argonne National Laboratory
M Weyland
Affiliation:
Monash University
J Etheridge
Affiliation:
Monash University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2009