Scanning Confocal Electron Microscopy in a FEI Double Corrected Titan3 TEM/STEM

NJ Zaluzec; M Weyland; J Etheridge

doi:10.1017/S1431927609097840

Scanning Confocal Electron Microscopy in a FEI Double Corrected Titan3 TEM/STEM

Published online by Cambridge University Press: 26 July 2009

NJ Zaluzec ,

M Weyland and

J Etheridge

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NJ Zaluzec: Affiliation:
Argonne National Laboratory
M Weyland: Affiliation:
Monash University
J Etheridge: Affiliation:
Monash University

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type: Abstract
Information: Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 614 - 615

DOI: https://doi.org/10.1017/S1431927609097840 [Opens in a new window]

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Scanning Confocal Electron Microscopy in a FEI Double Corrected Titan3 TEM/STEM

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