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Sample Thickness Determination By Scanning Transmission Electron Microscopy At Low Electron Energies

Published online by Cambridge University Press:  27 August 2014

T. Volkenandt ,
E. Müller  and
D. Gerthsen
T. Volkenandt
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Engesserstr. 7, 76131 Karlsruhe, Germany
E. Müller
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Engesserstr. 7, 76131 Karlsruhe, Germany
D. Gerthsen
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Engesserstr. 7, 76131 Karlsruhe, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 142 - 143
Copyright
Copyright © Microscopy Society of America 2014 

References

References:

[1] Morandi, V, Merli, P, J. Appl. Phys. 101 (2007) p. 114917.Google Scholar
[2] Krzyzanek, V, Reichelt, R, Conference Proceedings of the 14th European Microscopy Congress (2008), 1-5 September 2008, Aachen.Google Scholar
[3] Volkenandt, T, Müller, E, Gerthsen, D, Microsc. Microanal., in press.Google Scholar
[4] Ritchie, N, Surf. Interf. Anal. 37 (2005), p. 1006.Google Scholar
[5] Acknowledgement: This work has been supported by the Deutsche Forschungsgemeinschaft (DFG).Google Scholar