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Roles of self-assembly and beam damage in gas-assisted electron and ion beam induced processing

Published online by Cambridge University Press:  23 September 2015

Milos Toth
Milos Toth*
Affiliation:
School of Physics and Advanced Materials, University of Technology, Sydney, 15 Broadway, Ultimo, New South Wales 2007, Australia

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2155 - 2156
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Botman, A., Bahm, A., Randolph, S., Straw, M. & Toth, M. Spontaneous Growth of Gallium-Filled Mi-crocapillaries on Ion-Bombarded GaN. Phys. Rev. Lett. 111, 135503 (2013).CrossRefGoogle ScholarPubMed
[2] Martin, A. A., Randolph, S., Botman, A., Toth, M. & Aharonovich., I.. Direct-write milling of diamond by a focused oxygen ion beam. Sci. Rep. inpress.Google Scholar
[3] Martin, A. A., Toth, M. & Aharonovich, I. Subtractive 3D Printing of Optically Active Diamond Structures. Sci. Rep. 4, 5022 (2014).CrossRefGoogle ScholarPubMed
[4] Shanley, T., Martin, A. A., Aharonovich, I. & Toth, M., Localized chemical switching of the charge state of nitrogen-vacancy luminescence centers in diamond. Appl. Phys. Lett. 105, 063103 (2014).CrossRefGoogle Scholar