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The Role of Secondary Electron Emission in the Charging of Thin-Film Phase Plates

Published online by Cambridge University Press:  25 July 2016

M. Dries ,
R. Janzen ,
T. Schulze ,
J. Schundelmeier ,
S. Hettler ,
U. Golla-Schindler ,
B. Jaud ,
U. Kaiser  and
D. Gerthsen
M. Dries
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany
R. Janzen
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany
T. Schulze
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany
J. Schundelmeier
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany
S. Hettler
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany
U. Golla-Schindler
Affiliation:
Electron Microscopy Group of Material Science, University of Ulm, Ulm, Germany
B. Jaud
Affiliation:
Electron Microscopy Group of Material Science, University of Ulm, Ulm, Germany
U. Kaiser
Affiliation:
Electron Microscopy Group of Material Science, University of Ulm, Ulm, Germany
D. Gerthsen
Affiliation:
Electron Microscopy Group of Material Science, University of Ulm, Ulm, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 64 - 65
Copyright
© Microscopy Society of America 2016 

References

[1] Danev, R. & Nagayama, K. Ultramicroscopy 88 (2001). p. 243.Google Scholar
[2] Danev, R. & Nagayama, K. J. Phys. Soc. Jpn 73 (2004). p. 2718.CrossRefGoogle Scholar
Malac, M., et al., Ultramicroscopy 118 (2012). p. 77.Google Scholar
[4] Danev, R., et al., PNAS 111 (2014). p. 15635.Google Scholar
[5] Chelluri, B. & Kirchheim, R. J. Non-Cryst. Solids 54 (1983). p. 107.CrossRefGoogle Scholar
[6] Morgan, M. Thin Solid Films 7 (1971). p. 313.Google Scholar
[7] Financial support by the Deutsche Forschungsgemeinschaft (DFG).Google Scholar