Hostname: page-component-78c5997874-g7gxr Total loading time: 0 Render date: 2024-11-20T01:39:48.670Z Has data issue: false hasContentIssue false
  • English
  • Français

Role of Planar Defects in Compound Semiconductor Crystals: From Growth of Nanomasts & Nanosails to Processing Light Emission in DualBeam FIB/SEM

Published online by Cambridge University Press:  05 August 2007

WJ MoberlyChan ,
J Tringe ,
I Shalish  and
V Narayanamurti
WJ MoberlyChan
Affiliation:
Lawrence Livermore National Laboratory
J Tringe
Affiliation:
Lawrence Livermore National Laboratory
I Shalish
Affiliation:
Harvard University
V Narayanamurti
Affiliation:
Harvard University
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 722 - 723
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)