Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-23T13:39:22.528Z Has data issue: false hasContentIssue false
  • English
  • Français

The Role of Electron Microscopy in the Development of Monodisperse Cubic Iron Oxide Nanoparticles as Certified Reference Material for Size and Shape

Published online by Cambridge University Press:  22 July 2022

Paul Mrkwitschka ,
Sarah-Luise Abram ,
Andreas Thünemann ,
Bastian Rühle ,
Jörg Radnik ,
Harald Bresch ,
Ute Resch-Genger  and
Vasile-Dan Hodoroaba
Paul Mrkwitschka*
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
Sarah-Luise Abram*
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
Andreas Thünemann
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
Bastian Rühle
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
Jörg Radnik
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
Harald Bresch
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
Ute Resch-Genger
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
Vasile-Dan Hodoroaba
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Focus area Project “nanoPlatform”, Berlin, Germany
*
*Corresponding authors: [email protected] and [email protected]
*Corresponding authors: [email protected] and [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
On Demand - Science Of Metrology With Electrons
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 802 - 805
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Stefaniak, et al. , Nanotoxicology 7 :8 (2013), p. 1325. doi: 10.3109/17435390.2012.739664CrossRefGoogle Scholar
Commission Regulation (EU) 2018/1881 of 3 December 2018 amending Regulation (EC) No 1907/2006 of the European Parliament and of the Council on the Registration, Evaluation, Authorisation and Restriction of Chemicals (REACH) as regards Annexes I, III, VI, VII, VIII, IX, X, XI, and XII to address nanoforms of substances (Text with EEA relevance.)’ (2018) Official Journal L 308, 1-20. eur-lex.europa.eu/legal-content/EN/TXT/?uri=CELEX:32018R1881Google Scholar
National Institute of Standarts and Technology, www.nist.gov/. (accessed 2/15/2022) and Joint Research Centre, crm.jrc.ec.europa.eu. (accessed 2/15/2022)Google Scholar
Kestens, et al. , Anal Bioanal Chem 413 (2021), p. 141. doi: 10.1007/s00216-020-02984-zCrossRefGoogle Scholar
Park, et al. , Nature Mater 3 (2004), p. 891. doi: 10.1038/nmat1251CrossRefGoogle Scholar
Kovalenko, M et al. , J Amer Chem Soc 129 (20) (2007), p. 6352–6353CrossRefGoogle Scholar
ISO 17034 General requirements for the competence of reference material producers. (2016)Google Scholar
ISO Guide 35 Reference materials – Guidance for characterization and assessment of homogeneity and stability. (2017)Google Scholar
Ridler, TW and Calvard, S, IEEE Transactions on Systems, Man, and Cybernetics 8 (1978), p. 630. doi:10.1109/TSMC.1978.4310039Google Scholar
ISO 19749 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy. (2021)Google Scholar
Hodoroaba, et al. , Microsc. Microanal. 18 (2012), p. 1750. doi: 10.1017/S1431927612010604CrossRefGoogle Scholar
ISO 17867 Particle size analysis — Small angle X-ray scattering (SAXS). (2020)Google Scholar
Acknowledgement BAM focus area project nanoplatform (www.bam.de/Content/EN/Projects/nanoPlattform/nanoplattform.html) for funding the work. Sigrid Benemann is thanked for her contribution to SEM imaging.Google Scholar