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Role of Electron Illumination on the Image Resolution and Sensitivity of Catalysts Immersed in Gas Environments

Published online by Cambridge University Press:  01 August 2018

S. P. Jespersen ,
M. Ek ,
J. R. Jinschek ,
B. Hendriksen ,
L. Mele ,
P. Dona ,
C. D. Damsgaard  and
S. Helveg
S. P. Jespersen
Affiliation:
Haldor Topsoe A/S, Lyngby, Denmark Department of Physics and Center for Electron Microscopy, Technical University of Denmark, Lyngby, Denmark
M. Ek
Affiliation:
Haldor Topsoe A/S, Lyngby, Denmark Centre for Analysis and Synthesis, Lund University, Lund, Sweden
J. R. Jinschek
Affiliation:
Department of Material Science and Engineering, Ohio State University, USA
B. Hendriksen
Affiliation:
Thermo Fisher Scientific, Eindhoven, The Netherlands
L. Mele
Affiliation:
Thermo Fisher Scientific, Eindhoven, The Netherlands
P. Dona
Affiliation:
Thermo Fisher Scientific, Eindhoven, The Netherlands
C. D. Damsgaard
Affiliation:
Department of Physics and Center for Electron Microscopy, Technical University of Denmark, Lyngby, Denmark
S. Helveg
Affiliation:
Haldor Topsoe A/S, Lyngby, Denmark

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1982 - 1983
Copyright
© Microscopy Society of America 2018 

References

[1] Helveg, S. J. Catal. 328 2015) p. 102.Google Scholar
[2] Jinschek, J. R. Helveg, S. Micron 43 2012) p. 1156.Google Scholar
[3] Helveg, S., et al, Micron 68 2014) p. 176.Google Scholar
[4] Ek, M., et al, Advanced Structural and Chemical Imaging 2 2017) p. 4.Google Scholar
[5] Creemer, J. F., et al, Ultramicroscopy 108 2008) p 993.Google Scholar
[6] Vendelbo, S.B., et al, Nature Materials 13 2014) p. 884.Google Scholar