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RISE Microscopy: Correlative Raman and SEM Imaging

Published online by Cambridge University Press:  23 September 2015

Ute Schmidt ,
Olaf Hollricher ,
Wei Liu  and
Edward L Principe
Ute Schmidt
Affiliation:
WITec GmbH, Ulm, Germany
Olaf Hollricher
Affiliation:
WITec GmbH, Ulm, Germany
Wei Liu
Affiliation:
WITec Instruments, Knoxville, TN, USA
Edward L Principe
Affiliation:
Tescan USA, Warrendale, PA, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 17 - 18
Copyright
Copyright © Microscopy Society of America 2015