Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-12-05T02:35:06.230Z Has data issue: false hasContentIssue false
  • English
  • Français

A RF Broadband Biasing Holder for Ultrafast Stroboscopic Electron Microscopy

Published online by Cambridge University Press:  01 August 2018

Karl B. Schliep ,
Michael B. Katz  and
June W. Lau
Karl B. Schliep
Affiliation:
The National Institute of Standards and Technology, Material Measurement Laboratory, Gaithersburg, USA
Michael B. Katz
Affiliation:
The National Institute of Standards and Technology, Material Measurement Laboratory, Gaithersburg, USA
June W. Lau
Affiliation:
The National Institute of Standards and Technology, Material Measurement Laboratory, Gaithersburg, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1852 - 1853
Copyright
© Microscopy Society of America 2018 

References

[1] Adhikari, A., et al, ACS Appl. Mater. Interfaces 9 2017) p. 3.Google Scholar
[2] Shorokhov, D. Zewail, A. H. J. Chem. Phys. 144 2016) p. 080901.Google Scholar
[3] Qiu, J., et al, Ultramicroscopy 161 2016) p. 130.Google Scholar
[4] This research was performed while the author held an NRC Research Associateship award at the National Institute of Standards and Technology in Gaithersburg, MD.Google Scholar