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A Reverse Engineering Approach for Imaging Spinal Cord Architecture - Large Area High-Resolution SEM Imaging

Published online by Cambridge University Press:  23 September 2015

C. A. Brantner ,
M. Rasche ,
K. E. Burcham ,
J. Klingfus ,
J. E. Sanabia ,
C. E. Korman  and
A. Popratiloff
C. A. Brantner
Affiliation:
GW Center for Nanofabrication and Imaging, The George Washington University, Washington, D.C., USA
M. Rasche
Affiliation:
Raith GmbH, Dortmund, Germany
K. E. Burcham
Affiliation:
International Applications Center, Raith America, Inc., Troy, NY, USA
J. Klingfus
Affiliation:
International Applications Center, Raith America, Inc., Troy, NY, USA
J. E. Sanabia
Affiliation:
International Applications Center, Raith America, Inc., Troy, NY, USA
C. E. Korman
Affiliation:
GW Center for Nanofabrication and Imaging, The George Washington University, Washington, D.C., USA Department of Electrical and Computer Engineering, The George Washington University, Washington, D.C., USA
A. Popratiloff
Affiliation:
GW Center for Nanofabrication and Imaging, The George Washington University, Washington, D.C., USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 921 - 922
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Klingfus, J, Burcham, KE, Rasche, M, Borchert, T & Damnik, N, ISTFA Conference Proceedings (2011). p 373–376.Google Scholar
[2] Deerinck, T, Bushong, E, Thor, A & Ellisman, M (2010). NCMIR methods for 3D EM: A new protocol for preparation of biological specimens for serial block face scanning electron microscopy. Microscopy, 6–8.Google Scholar