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Resampling of SEM-EDS Element Maps to Assess the Length-Scale of Elemental Heterogeneity

Published online by Cambridge University Press:  26 July 2009

C Todd ,
W Heeschen ,
A Pyzik  and
C Han
C Todd
Affiliation:
Dow Chemical
W Heeschen
Affiliation:
Dow Chemical
A Pyzik
Affiliation:
Dow Chemical
C Han
Affiliation:
Dow Chemical

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 558 - 559
Copyright
Copyright © Microscopy Society of America 2009