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Reimagining the Data-Driven Microscopy Paradigm

Published online by Cambridge University Press:  30 July 2021

Steven Spurgeon
Steven Spurgeon*
Affiliation:
Pacific Northwest National Laboratory, United States

Abstract

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Type
Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 54 - 55
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Spurgeon, S. R., Ophus, C., Jones, L., Petford-Long, A., Kalinin, S. V, Olszta, M. J., Dunin-Borkowski, R. E., Salmon, N., Hattar, K., Yang, W. D., Sharma, R., Du, Y., Chiaramonti, A., Zheng, H., Buck, E. C., Kovarik, L., Penn, R. L., Li, D., Zhang, X., Murayama, M., and Taheri, M. L. (2020). Towards data-driven next-generation transmission electron microscopy. Nature Materials. https://doi.org/10.1038/s41563-020-00833-zGoogle Scholar