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Recording and Using 4D-STEM Datasets in Materials Science

Published online by Cambridge University Press:  27 August 2014

Colin Ophus ,
Peter Ercius ,
Michael Sarahan ,
Cory Czarnik  and
Jim Ciston
Colin Ophus
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, USA
Peter Ercius
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, USA
Michael Sarahan
Affiliation:
Gatan Inc., Pleasanton, USA
Cory Czarnik
Affiliation:
Gatan Inc., Pleasanton, USA
Jim Ciston
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 62 - 63
Copyright
Copyright © Microscopy Society of America 2014 

References

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[8] The authors acknowledge the financial support of the Office of Science, Office of Basic Energy Sciences of the US Department of Energy under contract number De-AC02-05CH11231.Google Scholar